System and method for disk drive fly height measurement
A system for determining a fly height includes a first head of a disk drive, a second head of the disk drive, a capacitive sensor circuit coupled to the first head and the second head, and a logic device coupled to the capacitive sensor circuit. The capacitive sensor circuit is configured to measure a first capacitance between the first head and the first disk, remove noise from the first capacitance using a second capacitance between the second head and the second disk, and based thereon determine a corrected first capacitance. The logic device is configured to determine the fly height between the first head and the first disk using the corrected first capacitance.
1. A system for determining a fly height, comprising:
a first head of a disk drive, the first head being adjacent to a first disk;
a capacitive fly height sensor circuit coupled to the first head, wherein the capacitive fly height sensor circuit is configured to measure a first capacitance between the first head and the first disk;
a reference sensor circuit, wherein the reference sensor circuit is configured to experience a same thermal drift as the capacitive fly height sensor circuit; and
a logic circuit, the logic circuit being coupled to the capacitive fly height sensor circuit and the reference sensor circuit, wherein the logic circuit is configured to:
remove noise to correct a measurement of the capacitive fly height sensor circuit using a measurement of the reference sensor circuit; and
determine the fly height between the first head and the first disk using the corrected measurement of the capacitive fly height sensor circuit.
2. The system of claim 1 , further comprising a second head of the disk drive, wherein the reference sensor circuit is coupled to the second head along a first conduction path.
3. The system of claim 2 , further comprising a first switch along the first conduction path, wherein the reference sensor circuit is coupled to the second head through the first switch.
4. The system of claim 2 , further comprising a third head of the disk drive, wherein the reference sensor circuit is coupled to the third head along a second conduction path.
5. The system of claim 4 , further comprising a second switch along the second conduction path, wherein the reference sensor circuit is coupled to the second head through the second switch.
6. The system of claim 1 , wherein the reference sensor circuit comprises a quality booster circuit.
7. The system of claim 6 , wherein the logic circuit is further configured to run a built-in self-test of a frequency response of the quality booster circuit.
8. The system of claim 7 , wherein the quality booster circuit comprises a low-pass filter.
9. A system for determining a fly height, comprising:
a first head of a disk drive, the first head being adjacent to a first disk;
a capacitive fly height sensor circuit coupled to the first head, wherein the capacitive fly height sensor circuit is configured to measure a first capacitance between the first head and the first disk;
a second head of the disk drive, the second head being adjacent to a second disk;
a reference sensor circuit coupled to the second head through a first switch; and
a logic circuit, the logic circuit being coupled to the capacitive fly height sensor circuit and the reference sensor circuit, wherein the logic circuit is configured to:
remove noise to correct a measurement of the capacitive fly height sensor circuit using a measurement of the reference sensor circuit when the first switch is open; and
determine the fly height between the first head and the first disk using the corrected measurement of the capacitive fly height sensor circuit.
10. The system of claim 9 , wherein the capacitive fly height sensor circuit and the reference sensor circuit are identical circuits.
11. The system of claim 9 , further comprising a third head of the disk drive, the capacitive fly height sensor circuit being coupled to the third head, wherein the capacitive fly height sensor circuit is further configured to measure a second capacitance between the third head and the first disk.
12. The system of claim 9 , wherein measuring the first capacitance between the first head and the first disk comprises charging and discharging a capacitor with a current source, the capacitor being formed by the first head and the first disk.
13. The system of claim 9 , wherein the reference sensor circuit comprises a low-pass filter.
14. The system of claim 13 , further comprising a digital logic circuit configured to perform a built-in self-test (BIST) of the low-pass filter.
15. The system of claim 14 , wherein the digital logic circuit is the logic circuit.
16. The system of claim 14 , wherein the reference sensor circuit further comprises a variable current source driven by the digital logic circuit, the variable current source being coupled to the low-pass filter through a first node.
17. The system of claim 16 , wherein the reference sensor circuit further comprises a current source coupled between the first node and a ground node.
18. The system of claim 16 , wherein the reference sensor circuit further comprises a DC bias amplifier coupled to the first node across a resistor.
19. A system for determining a fly height, comprising:
a first head of a disk drive, the first head being adjacent to a first disk;
a capacitive fly height sensor circuit coupled to the first head, wherein the capacitive fly height sensor circuit is configured to measure a first capacitance between the first head and the first disk, the capacitive fly height sensor circuit comprising a comparator and a quality boosting element, the quality boosting element being coupled to a first input of the comparator;
a reference sensor circuit, wherein the reference sensor circuit is configured to experience a same thermal drift as the capacitive fly height sensor circuit; and
a digital logic circuit, the digital logic circuit being coupled to the capacitive fly height sensor circuit and the reference sensor circuit, an output of the comparator being coupled to the digital logic circuit, wherein the digital logic circuit is configured to:
remove noise to correct a measurement of the capacitive fly height sensor circuit using a measurement of the reference sensor circuit;
determine the fly height between the first head and the first disk using the corrected measurement of the capacitive fly height sensor circuit;
drive a variable current source with a test signal from the digital logic circuit, the variable current source providing the test signal to the quality boosting element; and
while changing a threshold of the comparator, evaluate a shape of a frequency response of the quality boosting element.
20. The system of claim 19 , wherein the quality boosting element is a low-pass filter.