IP Library › Granted Patent US 12,171,092
Granted Patent B2
US 12,171,092 · App. 18/506,122 · Granted Dec 17, 2024

Layout of static random access memory periphery circuit

Inventors: Yangsyu Lin (New Taipei, TW); Chi-Lung Lee (New Taipei, TW); Chien Chi Tien (Hsinchu, TW); Chiting Cheng (Taiching, TW)
Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
H10B10/18G11C11/412G11C11/419H01L23/5226H01L23/528H01L27/0207H01L27/0924H01L27/0928H10B10/12
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Quick Facts
Patent No.
US 12,171,092
App. No.
18/506,122
Granted
Dec 17, 2024
Kind
B2
Abstract

A static random access memory (SRAM) periphery circuit includes a first n-type transistor and a second n-type transistor that are disposed in a first well region of first conductivity type, the first well region occupies a first distance in a row direction equal to a bitcell-pitch of an SRAM array. The SRAM periphery circuit includes a first p-type transistor and a second p-type transistor that are disposed in a second well region of second conductivity type. The second well region occupies a second distance in the row direction equal to the bitcell-pitch of the SRAM array. The second well region is disposed adjacent to the first well region in the row direction.

Claims (63)

1. A circuit layout comprising:

a first layout circuit comprising:

a first n-type transistor and a second n-type transistor disposed in a first p-type doped region; and

a first p-type transistor and a second p-type transistor disposed in a first n-type doped region,

wherein the first n-type doped region is disposed immediately adjacent to the first p-type doped region in a first direction;

a second layout circuit diagonally located with respect to the first layout circuit, the second layout circuit comprising:

third and fourth p-type transistors disposed in a second n-type doped region,

wherein the second n-type doped region is diagonally arranged with the first n-type doped region; and

third and fourth n-type transistors disposed in a second p-type doped region,

wherein the second p-type doped region is immediately adjacent to the second n-type doped region,

wherein the second n-type doped region is diagonal to the first n-type doped region, and

wherein there is no transitional space between the second n-type doped region and the first n-type doped region.

2. The circuit layout of claim 1 , wherein the first and second n-type transistors and the first and second p-type transistors comprise a first NOR circuit.

3. The circuit layout of claim 1 , further comprising:

a fifth n-type transistor and a sixth n-type transistor disposed in the first p-type doped region; and

a fifth p-type transistor and a sixth p-type transistor disposed in the first n-type doped region,

wherein the fifth and sixth n-type transistors and the fifth and sixth p-type transistors comprise a second NOR circuit.

4. The circuit layout of claim 1 , further comprising a third layout circuit disposed in a third p-type doped region and a third n-type doped region, wherein the third p-type doped region is adjacent to the first p-type doped region along the second direction, and the third n-type doped region is adjacent to the first n-type doped region along the second direction.

5. The circuit layout of claim 4 , wherein there is no transitional space between the third p-type doped region and the first p-type doped region along the second direction, and no transitional space between the third n-type doped region and the first n-type doped region along the second direction.

6. The circuit layout of claim 4 , further comprising a first bit line and a first complementary bit line extending along the second direction disposed in a conductive layer over the first p-type doped region and the third p-type doped region.

7. The circuit layout of claim 6 , further comprising a second bit line and a second complementary bit line extending along the second direction disposed in the conductive layer over the first n-type doped region and the third n-type doped region.

8. The circuit layout of claim 4 , further comprising a fourth layout circuit disposed in a fourth p-type doped region and a fourth n-type doped region, wherein the fourth n-type doped region is adjacent to the first n-type doped region along the first direction, and the fourth p-type doped region is adjacent to the fourth n-type doped region along the first direction.

9. The circuit layout of claim 8 , wherein there is no transitional space between the first n-type doped region and the fourth n-type doped region along the first direction.

10. A circuit layout comprising:

a first layout circuit comprising:

a first n-type transistor and a second n-type transistor disposed in a first p-type doped region; and

a first p-type transistor and a second p-type transistor disposed in a first n-type doped region of a second conductivity type,

wherein the first n-type doped region is disposed immediately adjacent to the first p-type doped region along a first direction;

a second layout circuit located immediately adjacent and diagonally with respect to the first layout circuit, the second layout circuit comprising:

third and fourth p-type transistors disposed in a second n-type doped region, the second n-type doped region is diagonally arranged with the first n-type doped region;

third and fourth n-type transistors disposed in a second p-type doped region,

wherein the second p-type doped region is immediately adjacent to the second n-type doped region;

a first bit line and a second bit line complementary to the first bit line, both extending in a second direction perpendicular to the first direction and coupled to one or more transistors along the second direction; and

a third bit line and a fourth bit line complementary to the third bit line, both extending in the second direction and coupled to one or more transistors along the second direction.

11. The circuit layout of claim 10 , wherein the first and second n-type transistors and the first and second p-type transistors comprise a NOR circuit.

12. The circuit layout of claim 10 , wherein the first, second, third, and fourth n-type transistors have 3 fins and one gate.

13. The circuit layout of claim 10 , wherein the first, second, third, and fourth p-type transistor have 4 fins and one gate.

14. The circuit layout of claim 10 , further comprising a third layout circuit comprising:

a fifth n-type transistor and a sixth n-type transistor disposed in a third p-type doped region; and

a fifth p-type transistor and a sixth p-type transistor disposed in a third n-type doped region,

wherein the third p-type doped region is located immediately adjacent the third n-type doped region along the first direction, and

the third p-type doped region is located immediately adjacent the first p-type doped region along the second direction.

15. The circuit layout of claim 10 , further comprising a fourth layout circuit comprising:

a seventh n-type transistor and an eighth n-type transistor disposed in a fourth p-type doped region; and

a seventh p-type transistor and an eighth p-type transistor disposed in a fourth n-type doped region,

wherein the fourth n-type doped region is located immediately adjacent the first n-type doped region along the first direction, and

the fourth p-type doped region is located immediately adjacent the second p-type doped region along the second direction.

16. A circuit layout comprising:

a first layout circuit comprising:

first and second n-type transistors disposed in a first p-type doped region; and

first and second p-type transistors disposed in a first n-type doped region,

wherein the first n-type doped region is disposed immediately adjacent to the first p-type doped region along a first direction;

a second layout circuit comprising:

third and fourth n-type transistors disposed in a second p-type doped region; and

third and fourth p-type transistors disposed in a second n-type doped region,

wherein the second n-type doped region is disposed immediately adjacent to the second p-type doped region along the first direction,

the first p-type doped region and the second p-type doped region are arranged along a second direction perpendicular to the first direction,

the first n-type doped region and the second n-type doped region are arranged along the second direction, and

a transitional space exists between the first p-type doped region and the second p-type doped region and the first n-type doped region and the second n-type doped region.

17. The circuit layout of claim 16 , wherein the first and second n-type transistors and the first and second p-type transistors comprise a NOR circuit.

18. The circuit layout of claim 16 , wherein the third and fourth n-type transistors and the third and fourth p-type transistors comprise a NOR circuit.

19. The circuit layout of claim 16 , wherein the first, second, third, and fourth n-type transistors have 3 fins and one gate.

20. The circuit layout of claim 16 , wherein the first, second, third, and fourth p-type transistor have 4 fins and one gate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2023
From: LIN, YANGSYU; TIEN, CHIEN-CHI; CHENG, CHITING; LEE, CHI-LUNG
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 065517/0602 →
Continuity (6)
Continuation 17751426 · May 23, 2022
Continuation 17080617 · Oct 26, 2020
Continuation 16502790 · Jul 3, 2019
Provisional Application 62715529 · Aug 7, 2018
Provisional Application 62698702 · Jul 16, 2018
Related Publication 20240074136A1 · Feb 29, 2024