IP Library › Granted Patent US 12,174,051
Granted Patent B2
US 12,174,051 · App. 17/656,464 · Granted Dec 24, 2024

Electrode embedded ceramic structure

Inventors: Takao Ohnishi (Niwa-Gun, JP); Daishi Tanabe (Kasugai, JP); Akifumi Morishita (Komaki, JP)
Assignee: NGK INSULATORS, LTD.
G01F23/268C04B37/025G01F23/266
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Quick Facts
Patent No.
US 12,174,051
App. No.
17/656,464
Granted
Dec 24, 2024
Kind
B2
Abstract

An electrode embedded ceramic structure includes: a first ceramic layer; an electrode layer formed on the first ceramic layer; and a second ceramic layer covering the first ceramic layer and the electrode layer, the second ceramic layer being thinner than the first ceramic layer. In a cross section of the first ceramic layer, the electrode layer, and the second ceramic layer along a laminating direction in this electrode embedded ceramic structure, T1 and T2 satisfy Equation (T2−T1)/T2≤0.15, where T1 denotes a least thickness in the second ceramic layer, and T2 denotes an average thickness of the second ceramic layer.

Claims (62)

1. A sensor having an exposed detection surface, comprising:

a first ceramic layer;

an electrode layer formed on a surface of the first ceramic layer; and

a second ceramic layer having a surface as the exposed detection surface, covering the first ceramic layer and the electrode layer, the second ceramic layer being thinner than the first ceramic layer and having a thickness from 1 μm to 10 μm as a single layer between the detection surface and the electrode layer, the electrode layer being disposed directly between the first ceramic layer and the second ceramic layer,

wherein in a cross section of the first ceramic layer, the electrode layer, and the second ceramic layer along a laminating direction, T1 and T2 satisfy Equation (1) below, where T1 denotes a least thickness in the second ceramic layer on the electrode on the first ceramic layer, and T2 denotes an average thickness of the second ceramic layer on the electrode on the first ceramic layer:

(

T

⁢

⁢

2

-

T

⁢

⁢

1

)

/

T

⁢

⁢

2

⁢

≤

0

⁢

.15

.

(

1

)

2. The sensor according to claim 1 ,

wherein a percentage of voids in the second ceramic layer is less than or equal to 0.05%.

3. The sensor according to claim 1 ,

wherein in the cross section, L1, L2, and L3 satisfy Equation (2) below, where L1 denotes a length of the electrode layer on the first ceramic layer, L2 denotes a length of the electrode layer on the second ceramic layer, and L3 denotes a length of the electrode layer in a direction orthogonal to the laminating direction:

(

L

⁢

⁢

1

+

L2

)

/

L

⁢

⁢

3

≥

2.2

.

(

2

)

4. The sensor according to claim 3 ,

wherein the length L1 is larger than the length L2.

5. The sensor according to claim 1 ,

wherein the electrode layer contains ceramic particles, and

a percentage of the ceramic particles in the electrode layer is higher than or equal to 4%.

6. The sensor according to claim 1 ,

wherein the sensor is a capacitive sensor.

7. The sensor according to claim 1 ,

wherein sensor is a surface potential sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 25, 2022
From: OHNISHI, TAKAO; TANABE, DAISHI; MORISHITA, AKIFUMI
To: NGK INSULATORS, LTD.
Reel/Frame 059399/0896 →
Priority Claims (1)
JP 2019-183510 · Oct 4, 2019 · national
Continuity (2)
Continuation PCTJP2020036887 · Sep 29, 2020
Related Publication 20220214205A1 · Jul 7, 2022