Surface inspection system and method for differentiating particulate contamination from defects on a surface of a specimen
A system for differentiating particulate contamination from defects on a surface of a specimen includes an illumination source configured to illuminate the specimen with a light at a predetermined angle relative to the surface of the specimen, an image recording device configured to capture the light reflected from the surface of the specimen in a sensor image, and an evaluation unit configured to receive deflectometry or phase-shifted deflectometry (PSD) image data and dust channel image data from the image recording device, correlate the PSD image data and dust channel image data, and separately output first result information and second result information, the first result information including defect identification information and defect location information and the second result information including contamination identification information and contamination location information.
1. An inspection system for differentiating particulate contamination from defects on a surface of a specimen, the system comprising:
an illumination source configured to illuminate the specimen with a light at a predetermined angle relative to the surface of the specimen;
an image recording device configured to capture the light reflected from the surface of the specimen in a sensor image to generate phase-shifted deflectometry (PSD) image data and dust channel image data;
a controller in communication with the illumination source and the image recording device and configured to:
receive the PSD image data and the dust channel image data from the image recording device,
correlate the PSD image data and the dust channel image data, and
separately output first result information and second result information, the first result information including defect identification information and defect location information and the second result information including contamination identification information and contamination location information,
wherein at least one of:
(1) the PSD image data includes a plurality of deflectometry images, and the dust channel image data includes a dust image,
the controller is further configured to:
control the image recording device to capture the plurality of deflectometry images in a sequence and to capture the dust image at a predetermined point in time during the sequence,
(2) the PSD image data includes the plurality of deflectometry images, and the dust channel image data includes a plurality of dust images,
the controller is further configured to:
control the image recording device to capture the plurality of deflectometry images in the sequence and to capture one of the plurality of dust images between any of the plurality of deflectometry images, or
(3) the image recording device includes a plurality of cameras,
the plurality of cameras is configured as at least one of area scan cameras and line scan cameras,
when the plurality of cameras is configured as the area scan cameras, the specimen is held in a static position when the light reflected from the surface of the specimen is captured, and
when the plurality of cameras is configured as the line scan cameras, the specimen is moved with a stage or a robot.
2. The inspection system of claim 1 , wherein the controller is configured to at least one of:
control the image recording device to capture the deflectometry images before capturing the dust image, and
control the image recording device to capture the deflectometry images subsequent to capturing the dust image.
3. The inspection system of claim 1 , wherein:
the illumination source includes a plurality of light sources, and
to generate the dust channel image data, one or more light sources of the illumination source is/are configured to illuminate the specimen at at least one glancing angle which produces glancing angle illuminations to the surface of the specimen to induce particles to glow.
4. The inspection system of claim 3 , wherein the plurality of light sources is an array of light sources and the one or more light sources are selected from the array of light sources.
5. A method for differentiating particulate contamination from defects on a surface of a specimen, the method comprising:
illuminating the specimen with a light of an illumination source at a predetermined angle relative to the surface of the specimen;
capturing the light reflected from the surface of the specimen in a sensor image to generate PSD image data and dust channel image data by an image recording device;
receiving the PSD image data and dust channel image data from the image recording device,
correlating the PSD image data and dust channel image data, and
separately or together outputting first result information and second result information, the first result information including defect identification information and defect location information and the second result information including contamination identification information and contamination location information,
wherein at least one of:
(1) the PSD image data includes a plurality of deflectometry images, and the dust channel image data includes a dust image,
the method further comprises controlling the image recording device to capture the plurality of deflectometry images in a sequence and to capture the dust image at a predetermined point in time during the sequence, or
(2) the image recording device includes a plurality of cameras,
the plurality of cameras is configured as at least one of area scan cameras and line scan cameras,
when the plurality of cameras is configured as the area scan cameras, the specimen is held in a static position when the light reflected from the surface of the specimen is captured, and
when the plurality of cameras is configured as the line scan cameras, the specimen is moved with a stage or a robot.
6. The method of claim 5 , further comprising:
controlling the image recording device to capture the deflectometry images before capturing the dust image, and
controlling the image recording device to capture the deflectometry images subsequent to capturing the dust image.
7. The method of claim 5 , wherein:
the PSD image data includes the plurality of deflectometry images, and the dust channel image data includes a plurality of dust images, and
the method further comprises controlling the image recording device to capture the plurality of deflectometry images in a sequence and to capture one of the plurality of dust images between any of the plurality of deflectometry images.
8. The method of claim 5 , wherein:
the illumination source includes a plurality of light sources, and
to generate the dust channel image data, one or more light sources of the illumination source is/are configured to illuminate the specimen at at least one glancing angle which produces glancing angle illuminations to the surface of the specimen to induce particles to glow.
9. The method of claim 8 , wherein the plurality of light sources is an array of light sources and the one or more light sources are selected from the array of light sources.
10. A non-transitory computer readable storage medium encoded with a program code stored thereon that when executed by a processor, causes the processor to:
illuminate a specimen with an illumination source with a light at a predetermined angle relative to a surface of the specimen;
capture the light reflected from the surface of the specimen in a sensor image to generate PSD image data and dust channel image data by an image recording device;
receive the PSD image data and dust channel image data from the image recording device,
correlate the PSD image data and dust channel image data, and
separately or together output first result information and second result information, the first result information including defect identification information and defect location information and the second result information including contamination identification information and contamination location information,
wherein at least one of:
(1) the PSD image data includes a plurality of deflectometry images, and the dust channel image data includes a dust image,
the program code further causes the processor to control the image recording device to capture the plurality of deflectometry images in a sequence and to capture the dust image at a predetermined point in time during the sequence,
(2) the program code further causes the processor to:
control the image recording device to capture the plurality of deflectometry images before capturing the dust image, and
control the image recording device to capture the plurality of deflectometry images subsequent to capturing the dust image,
(3) the PSD image data includes the plurality of deflectometry images, and the dust channel image data includes a plurality of dust images, and
the program code further causes the processor to control the image recording device to capture the plurality of deflectometry images in the sequence and to capture one of the plurality of dust images between any of the plurality of deflectometry images, or
(4) the PSD image data includes the plurality of deflectometry images, and the dust channel image data includes the plurality of dust images, and
the program code further causes the processor to control the image recording device to capture the plurality of deflectometry images in the sequence and to capture one of the plurality of dust images between any of the plurality of deflectometry images.
11. The non-transitory computer readable storage medium of claim 10 , wherein:
the illumination source includes a plurality of light sources,
to generate the dust channel image data, one or more light sources of the illumination source is/are configured to illuminate the specimen at at least one glancing angle which produces glancing angle illuminations to the surface of the specimen to induce particles to glow, and
the plurality of light sources is an array of light sources and the one or more light sources are selected from the array of light sources.