Detecting a change in a vibratory meter based on two baseline meter verifications

1. A meter electronics ( 20 ) for detecting a change in a vibratory meter ( 5 ) based on two or more baseline meter verifications, the meter electronics ( 20 ) comprising:

an interface ( 201 ) configured to receive sensor signals ( 100 ) from a meter assembly ( 10 ) and provide information based on the sensor signals ( 100 ); and

a processing system ( 202 ) communicatively coupled to the interface ( 201 ), said processing system ( 202 ) being configured to use the information to:

determine a first baseline meter verification value at a first set of process conditions;

determine a second baseline meter verification value at a second set of process conditions; and

determine a determined baseline meter verification value based on the first baseline meter verification value and the second baseline meter verification value;

wherein the second baseline meter verification value is determined at a process site.

2. The meter electronics ( 20 ) of claim 1 , wherein the processing system ( 202 ) being configured to determine the first baseline meter verification value and the second baseline meter verification value comprises the processing system ( 202 ) being configured to determine one of a first baseline stiffness value and a second baseline stiffness value, and a first baseline mass value and a second baseline mass value.

3. The meter electronics ( 20 ) of claim 1 , wherein the processing system ( 202 ) being configured to determine the determined baseline meter verification value based on the first baseline meter verification value and the second baseline meter verification value comprises the processing system ( 202 ) being configured to interpolate the determined baseline meter verification value from the first baseline meter verification value and the second baseline meter verification value.

4. The meter electronics ( 20 ) of claim 3 , wherein the processing system ( 202 ) is configured to interpolate the determined baseline meter verification value relative to a common parameter of the first set of process conditions and the second set of process conditions.

5. The meter electronics ( 20 ) of claim 3 , wherein the processing system ( 202 ) being configured to interpolate the determined baseline meter verification value comprises the processing system ( 202 ) being configured to linearly interpolate the determined baseline meter verification value.

6. The meter electronics ( 20 ) of claim 1 , wherein the processing system ( 202 ) is further configured to determine a condition of a conduit ( 130 , 130 ′) in the vibratory meter ( 5 ), wherein the condition of the conduit ( 130 , 130 ′) comprises at least one of an erosion, a corrosion, a damage, and a coating of the conduit ( 130 , 130 ′).

7. The meter electronics ( 20 ) of claim 1 , wherein the processing system ( 202 ) is further configured to obtain a central tendency value and a dispersion value and determine a probability based on the central tendency value and the dispersion value to detect if the central tendency value is different than the determined baseline meter verification value.

8. The meter electronics ( 20 ) of claim 7 , wherein the processing system ( 202 ) being configured to determine a probability based on the central tendency value and the dispersion value comprises the processing system ( 202 ) being configured to calculate a t-value and calculate the probability using the t-value.

9. A method of detecting a change in a vibratory meter based on two or more baseline meter verifications, the method comprising:

receiving with an interface sensor signals from a meter assembly and providing information based on the sensor signals;

determining a first baseline meter verification value at a first set of process conditions;

determining a second baseline meter verification value at a second set of process conditions; and

determining a determined baseline meter verification value based on the first baseline meter verification value and the second baseline meter verification value;

wherein a second baseline meter verification value is determined at a process site.

10. The method of claim 9 , wherein determining the first baseline meter verification value and the second baseline meter verification value comprises determining one of a first baseline stiffness value and a second baseline stiffness value, and a first baseline mass value and a second baseline mass value.

11. The method of claim 9 , wherein determining the baseline meter verification value based on the first baseline meter verification value and the second baseline meter verification value comprises interpolating the determined baseline meter verification value from the first baseline meter verification value and the second baseline meter verification value.

12. The method of claim 9 , wherein interpolating the determined baseline meter verification value comprises the processing system being configured to linearly interpolate the determined baseline meter verification value.

13. The method of claim 9 , further comprising determining a condition of a conduit of the vibratory meter based on the determined baseline meter verification value, the condition comprising at least one of an erosion, a corrosion, a damage, and a coating of the conduit of the vibratory meter.

14. The method of claim 9 , further comprising obtaining a central tendency value and a dispersion value and determining a probability based on the central tendency value and the dispersion value to detect if the central tendency value is different than the determined baseline meter verification value.

15. The method of claim 14 , wherein determining a probability based on the central tendency value and the dispersion value comprises the processing system being configured to calculate a t-value and calculate the probability using the t-value.