Stacked structure including two-dimensional material and method of fabricating the stacked structure
A stacked structure may include a first material layer, a two-dimensional material layer on the first material layer, and a second material layer on the two-dimensional material layer. The two-dimensional material layer may include a plurality of holes that each expose a portion of the first material layer. The second material layer may be coupled to the first material layer through the plurality of holes.
1. A stacked structure, the stacked structure comprising:
a first material layer;
a two-dimensional material layer directly on the first material layer, the two-dimensional material layer including a plurality of holes each exposing a portion of the first material layer; and
a second material layer directly on the two-dimensional material layer, the second material layer being coupled to the first material layer through the plurality of holes,
wherein the two-dimensional material layer comprises at least one of graphene, black phosphorus, amorphous boron nitride, two-dimensional hexagonal boron nitride (h-BN), phosphorene, or transition metal dichalcogenide, and
wherein the two-dimensional material layer is between the first material layer and the second material layer.
2. The stacked structure of claim 1 , wherein a coverage of the two-dimensional material layer on a top surface of the first material layer is about 0.6 to about 0.99.
3. The stacked structure of claim 1 , wherein an adhesion energy between the first material layer and the second material layer is about 1 J/m 2 to about 30 J/m 2 .
4. The stacked structure of claim 1 , wherein the two-dimensional material layer comprises at least one of the black phosphorus, the amorphous boron nitride, the two-dimensional hexagonal boron nitride (h-BN), the phosphorene, or the transition metal dichalcogenide.
5. The stacked structure of claim 4 , wherein
the two-dimensional material layer comprises the transition metal dichalcogenide,
the transition metal dichalcogenide comprises one metal element and one chalcogen element,
the metal element includes at least one of molybdenum (Mo), tungsten (W), niobium (Nb), vanadium (V), tantalum (Ta), titanium (Ti), zirconium (Zr), hafnium (Hf), technetium (Tc), rhenium (Re), copper (Cu), gallium (Ga), indium (In), tin (Sn), germanium (Ge), and lead (Pb), and
the chalcogen element includes at least one of sulfur(S), selenium (Se), and tellurium (Te).
6. The stacked structure of claim 1 , wherein the first material layer comprises at least one of a first metal material, a first semiconductor material, a first insulating material.
7. The stacked structure of claim 6 , wherein
the first material layer includes the first metal material, and
the first metal material comprises at least one of copper (Cu), molybdenum (Mo), nickel (Ni), aluminum (Al), tungsten (W), ruthenium (Ru), cobalt (Co), manganese (Mn), titanium (Ti), tantalum (Ta), gold (Au), hafnium (Hf), zirconium (Zr), zinc (Zn), yttrium (Y), chromium (Cr), gadolinium (Gd), brass, bronze, stainless steel, and germanium (Ge).
8. The stacked structure of claim 6 , wherein the second material layer comprises at least one of a second metal material, a second semiconductor material, or a second insulating material.
9. The stacked structure of claim 8 , wherein
the first material layer comprises the first semiconductor material,
in the first material layer, the first semiconductor material comprises a material including at least two elements combined with each other, and
the at least two elements combined with each other includes at least two of Si, Ge, C, Zn, Cd, Al, Ga, In, B, C, N, P, S, Se, As, Sb, and Te.
10. The stacked structure of claim 9 , wherein
the second material layer comprises the second insulating material,
the second insulating material comprises at least one of an oxide, a nitride, and a carbide, and
the at least one of an oxides, a nitride, and a carbide in the insulating material includes at least one of silicon (Si), nickel (Ni), aluminum (Al), tungsten (W), ruthenium (Ru), cobalt (Co), manganese (Mn), titanium (Ti), tantalum (Ta), gold (Au), hafnium (Hf), zirconium (Zr), zinc (Zn), yttrium (Y), chromium (Cr), copper (Cu), molybdenum (Mo), and gadolinium (Gd), and derivatives thereof.
11. The stacked structure of claim 1 , wherein
the second material layer directly contacts the first material layer through the plurality of holes.
12. The stacked structure of claim 1 , wherein
a material of the first material layer is different than a material of the second material layer, and
one of the first material layer and the second material layer includes at least one of SiC, BP, BAs, AlN, AIP, AlAs, AlSb, GaN, GaP, GaAs, GaSb, InN, InP, InAs, InSb, CdSe, CdS, CdTe, ZnO, ZnSe, ZnTe, PbSe, PbS, PbTe, SnS, SnS 2 , SnTe, AlInSb, GaAsN, GaAsSb, InAsSb, InGaSb, SiGe, SiSn, AlGalnP, AlInAs, InGaN, AlGaN, InGaP, HgZnTe, GaAsP, AlGaP, and InGaAs, or a combination thereof.
13. A method of fabricating a stacked structure, the method comprising:
forming a two-dimensional material layer directly on a first material layer, the two-dimensional material layer comprising a plurality of holes each exposing a portion of the first material layer; and
forming a second material layer directly on the two-dimensional material layer such that the second material layer is coupled to the first material layer through the plurality of holes,
wherein the two-dimensional material layer comprises at least one of graphene, black phosphorus, amorphous boron nitride, two-dimensional hexagonal boron nitride (h-BN), phosphorene, or transition metal dichalcogenide, and
wherein the two-dimensional material layer is between the first material layer and the second material layer.
14. The method of claim 13 , wherein the forming the two-dimensional material layer comprises forming the two-dimensional material layer using at least one of a chemical vapor deposition (CVD) method or an atomic layer deposition (ALD) method.
15. The method of claim 13 , wherein the forming the two-dimensional material layer comprises forming the two-dimensional material layer such that a coverage of the two-dimensional material layer on a top surface of the first material layer is about 0.6 to about 0.99.
16. The method of claim 15 , wherein the first material layer comprises a metal material.
17. The method of claim 16 , wherein the metal material comprises at least one of copper (Cu), molybdenum (Mo), nickel (Ni), aluminum (Al), tungsten (W), ruthenium (Ru), cobalt (Co), manganese (Mn), titanium (Ti), tantalum (Ta), gold (Au), hafnium (Hf), zirconium (Zr), zinc (Zn), yttrium (Y), chromium (Cr), gadolinium (Gd), brass, bronze, stainless steel, and germanium (Ge).
18. The method of claim 16 , wherein the second material layer comprises a semiconductor material.
19. The method of claim 18 , wherein
the semiconductor material comprises a material including at least two elements combined with each other, and
the at least two elements combined with each other include at least of Si, Ge, C, Zn, Cd, Al, Ga, In, B, C, N, P, S, Se, As, Sb, and Te.
20. The method of claim 16 , wherein the second material layer comprises an insulating material.
21. The stacked structure of claim 1 , wherein a lower surface of the two-dimensional material layer is coplanar with a lower surface of the second material layer.