Contact probe, probe holder and probe unit
A probe unit includes: a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction; a second contact probe connected to an external ground; and a probe holder configured to hold the first and second contact probes, the probe holder including a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes, a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and a through-hole provided around the first hollow portion, wherein the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.
1. A probe unit comprising:
a plurality of first contact probes each coming into contact with an electrode to be contacted on one end side in a longitudinal direction;
a second contact probe connected to an external ground; and
a probe holder configured to hold the first and second contact probes, the probe holder including
a first hollow portion configured to allow the first contact probes to be inserted therethrough and hold the first contact probes,
a second hollow portion configured to allow the second contact probe to be inserted therethrough and hold the second contact probe, and
a through-hole provided around the first hollow portion, wherein
the probe holder includes a conductive portion that constitutes the through-hole and electrically connects the through-hole and the second contact probe.
2. The probe unit according to claim 1 , wherein the conductive portion is provided in the through-hole and on a surface forming an opening end of the through-hole.
3. The probe unit according to claim 1 , wherein the through-hole has a stepped hole shape having a partially different diameter.
4. The probe unit according to claim 1 , wherein the through-hole has a stepped hole shape in which central axis positions are different from each other.
5. The probe unit according to claim 1 , wherein the probe holder is formed of one member.
6. The probe unit according to claim 1 , wherein the probe holder is formed by laminating a plurality of members in a penetrating direction of the first hollow portion.
7. The probe unit according to claim 6 , wherein
the through-hole is formed by penetration holes formed in the plurality of members, respectively, and
has a stepped hole shape in which diameters of the penetration holes are partially different in at least one member.
8. The probe unit according to claim 6 , wherein
the through-hole is formed by penetration holes formed in the plurality of members, respectively, and
has a stepped hole shape in which central axis positions of the penetration holes are different from each other in at least one member.
9. The probe unit according to claim 6 , wherein
in the plurality of members, penetration holes constituting the through-hole are formed, respectively, and
in the through-hole, penetration holes formed in members adjacent to each other in a laminating direction of the members at least partially overlap with each other when viewed from a penetrating direction of the penetration holes.
10. The probe unit according to claim 1 , wherein
in the through-hole, an opening has an elongated hole shape when viewed from a penetrating direction.