IP Library › Granted Patent US 12,190,517
Granted Patent B2
US 12,190,517 · App. 17/768,404 · Granted Jan 7, 2025

Imaging analysis device and imaging data analysis method

Inventor: Shinichi Yamaguchi (Kyoto, JP)
Assignee: SHIMADZU CORPORATION
G06T7/0014G06T2207/10048G06T2207/10056G06T2207/10064G06T2207/30024
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Quick Facts
Patent No.
US 12,190,517
App. No.
17/768,404
Granted
Jan 7, 2025
Kind
B2
Abstract

An imaging analysis device according to the present invention includes: an analysis execution unit ( 1 ) configured to perform analysis by a predetermined analysis method for each of a plurality of measurement points set in a measurement area on a sample and collect imaging data; a reference image acquiring unit ( 2 ) configured to acquire a reference image for the measurement area; a regression analysis executer ( 36 ) configured to, with respect to the imaging data and the reference image obtained for the same sample, perform predetermined regression analysis calculation with the imaging data as an explanatory variable and data constituting the reference image as a target variable and acquire a regression model; and a predicted image creator ( 37 ) configured to apply, to the regression model, imaging data obtained by the analysis execution unit using a sample different from the sample used in the regression analysis executer, and create a predicted image based on a pseudo regression analysis result.

Claims (18)

1. An imaging analysis device comprising:

a computer; and

software configured to cause the computer to:

perform analysis by a predetermined analysis method for each of a plurality of measurement points set in a measurement area on a sample and collect imaging data;

acquire a reference image for the measurement area;

with respect to the imaging data and the reference image obtained for the same sample, perform predetermined regression analysis calculation with the imaging data as an explanatory variable and data constituting the reference image as a target variable and acquire a regression model; and

apply, to the regression model, the collected imaging data using a second sample different from the sample, and create a predicted image based on a pseudo regression analysis result.

2. The imaging analysis device according to claim 1 , wherein the analysis method is mass spectrometry, and the imaging data is mass spectral data in a predetermined mass-to-charge ratio range obtained for each of the measurement points.

3. The imaging analysis device according to claim 1 , wherein the analysis method is Raman spectroscopy or infrared spectroscopy, and the imaging data is spectral data in a predetermined wavelength range or wavenumber range obtained for each of the measurement points.

4. The imaging analysis device according to claim 1 , wherein the regression analysis is a partial least squares regression analysis.

5. An imaging data analysis method comprising:

an analysis execution step for performing analysis by a predetermined analysis method for each of a plurality of measurement points set in a measurement area on a sample and collecting imaging data;

a reference image acquisition step for acquiring a reference image for the measurement area;

a regression analysis execution step for, with respect to the imaging data and the reference image obtained for the same sample, performing predetermined regression analysis calculation with the imaging data as an explanatory variable and data constituting the reference image as a target variable and acquiring a regression model; and

a predicted image creation step for applying, to the regression model, imaging data obtained by the analysis execution step using a second sample different from the sample used at a time of execution of the regression analysis in the regression analysis execution step, and creating a predicted image based on a pseudo regression analysis result.

6. The imaging data analysis method according to claim 5 , wherein the analysis method is mass spectrometry, and the imaging data is mass spectral data in a predetermined mass-to-charge ratio range obtained for each of the measurement points.

7. The imaging data analysis method according to claim 5 , wherein the analysis method is Raman spectroscopy or infrared spectroscopy, and the imaging data is spectral data in a predetermined wavelength range or wavenumber range obtained for each of the measurement points.

8. The imaging data analysis method according to claim 5 , wherein the regression analysis is a partial least squares regression analysis.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2022
From: YAMAGUCHI, SHINICHI
To: SHIMADZU CORPORATION
Reel/Frame 059606/0846 →
Continuity (1)
Related Publication 20240153086A1 · May 9, 2024
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