IP Library Granted Patent US 12,190,983
Granted Patent B2
US 12,190,983 · App. 17/898,841 · Granted Jan 7, 2025

Voltage generation circuit

Inventor: Takaya Yasuda (Kawasaki Kanagawa, JP)
Assignee: Kioxia Corporation
G11C5/147G05F3/262
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Quick Facts
Patent No.
US 12,190,983
App. No.
17/898,841
Granted
Jan 7, 2025
Kind
B2
Abstract

A voltage generation circuit generates a first current having a first temperature-dependent characteristic in which a current value thereof changes with a predetermined change in temperature, and a second current having a second temperature-dependent characteristic different from the first temperature-dependent characteristic. The voltage generation circuit includes a first variable resistor and a second variable resistor connected in series. The second current flows through the first variable resistor, and a third current having a current value that is based on a difference between a current value of the first current and a current value of the second current, flows through the second variable resistor.

Claims (70)

1. A voltage generation circuit that generates a first current having a first temperature-dependent characteristic in which a current value thereof changes with a predetermined change in temperature, and a second current having a second temperature-dependent characteristic different from the first temperature-dependent characteristic, the voltage generation circuit comprising:

a first power supply line to which a first power supply voltage is supplied;

a second power supply line to which a second power supply voltage lower than the first power supply voltage is supplied;

an output terminal;

a first variable resistor through which the second current flows, and a second variable resistor through which a third current flows;

a first current path from the first power supply line to a first node between the first variable resistor and the second variable resistor;

a second current path from a second node between the second variable resistor and the first power supply line to the second power supply line; and

a third current path from the first node to the second power supply line, wherein;

the first variable resistor and the second variable resistor are connected in series between the first power supply line and the second power supply line and between the output terminal and the second power supply line;

the second temperature-dependent characteristic is a characteristic in which a current value of the second current does not change with the predetermined change in temperature;

the third current has a current value that is based on a difference between a current value of the first current and a current value of the second current; and

when the first current is supplied to the second node,

a current flowing through the first current path has a current value that is n times the current value of the second current, where n is a positive number excluding 1, and

the second current flows through the second current path, and the first current flows through the third current path.

2. A voltage generation circuit that generates a first current having a first temperature-dependent characteristic in which a current value thereof changes with a predetermined change in temperature, and a second current having a second temperature-dependent characteristic different from the first temperature-dependent characteristic, the voltage generation circuit comprising:

a first power supply line to which a first power supply voltage is supplied;

a second power supply line to which a second power supply voltage lower than the first power supply voltage is supplied;

an output terminal;

a first variable resistor through which the second current flows, and a second variable resistor through which a third current flows;

a first current path from the first power supply line to a first node between the first variable resistor and the second variable resistor; and

a second current path from a second node between the second variable resistor and the first power supply line to the second power supply line, wherein:

the first variable resistor and the second variable resistor are connected in series between the first power supply line and the second power supply line and between the output terminal and the second power supply line;

the second temperature-dependent characteristic is a characteristic in which a current value of the second current does not change with the predetermined change in temperature;

the third current has a current value that is based on a difference between a current value of the first current and a current value of the second current; and

when a current supplied to the first node through the first current path is the first current, the first current also flows through the second current path.

3. The voltage generation circuit according to claim 1 , wherein

the voltage generation circuit further generates a fourth current having a third temperature-dependent characteristic in which a current value thereof changes in reverse to the first temperature-dependent characteristic with the predetermined change in temperature, and

when the fourth current is supplied to the second node,

the current flowing through the first current path has a current value that is n times the current value of the second current, and

the second current flows through the second current path, and the third fourth current flows through the third current path.

4. The voltage generation circuit according to claim 2 , wherein

the voltage generation circuit further generates a fourth current having a third temperature-dependent characteristic in which a current value thereof changes in reverse to the first temperature-dependent characteristic with the predetermined change in temperature, and

when the current supplied to the first node through the first current path is the fourth current, the fourth current flows through the second current path.

5. The voltage generation circuit according to claim 1 , wherein

the first temperature-dependent characteristic is a characteristic in which a current value increases with an increase in temperature, and

when the current supplied to the second node is the second current,

the first current flows through the first current path,

the first current flows through the second current path, and

the third current path is cut off.

6. The voltage generation circuit according to claim 1 , wherein

the first temperature-dependent characteristic is a characteristic in which a current value decreases with an increase in temperature, and

when a current supplied to the second node is the second current,

the first current flows through the first current path,

the first current flows through the second current path, and

the third current path is cut off.

7. A semiconductor memory device according to comprising:

a memory cell array; and

a voltage generation circuit configured to generate voltages necessary to carry out operations on one or more memory cells of the memory cell array, and to generate a first current having a first temperature-dependent characteristic in which a current value thereof changes with a predetermined change in temperature, a second current having a second temperature-dependent characteristic different from the first temperature-dependent characteristic, and a third current having a third temperature-dependent characteristic in which a current value thereof changes in reverse to the first temperature-dependent characteristic with the predetermined change in temperature, wherein the voltage generation circuit includes:

a first power supply line to which a first power supply voltage is supplied;

a second power supply line to which a second power supply voltage lower than the first power supply voltage is supplied;

a first variable resistor and a second variable resistor connected in series;

a first current path from the first power supply line to a first node between the first variable resistor and the second variable resistor;

a second current path from a second node between the second variable resistor and the first power supply line to the second power supply line; and

a third current path from the first node to the second power supply line, wherein:

the second temperature-dependent characteristic is a characteristic in which a current value of the second current does not change with the predetermined change in temperature;

the second current flows through the first variable resistor, and a fourth current having a current value that is based on a difference between a current value of the first current and a current value of the second current, flows through the second variable resistor;

when the first current is supplied to the second node, a current flowing through the first current path has a current value that is n times the current value of the second current, where n is a positive number excluding 1, and the second current flows through the second current path, and the first current flows through the third current path; and

when the third current is supplied to the second node, the current flowing through the first current path has a current value that is n times the current value of the second current, and the second current flows through the second current path, and the third current flows through the third current path.

8. A semiconductor memory device comprising:

a memory cell array; and

a voltage generation circuit configured to generate voltages necessary to carry out operations on one or more memory cells of the memory cell array, and to generate a first current having a first temperature-dependent characteristic in which a current value thereof changes with a predetermined change in temperature, a second current having a second temperature-dependent characteristic different from the first temperature-dependent characteristic, and a third current having a third temperature-dependent characteristic in which a current value thereof changes in reverse to the first temperature-dependent characteristic with the predetermined change in temperature, wherein the voltage generation circuit includes:

a first power supply line to which a first power supply voltage is supplied;

a second power supply line to which a second power supply voltage lower than the first power supply voltage is supplied;

a first variable resistor and a second variable resistor connected in series;

a first current path from the first power supply line to a first node between the first variable resistor and the second variable resistor; and

a second current path from a second node between the second variable resistor and the first power supply line to the second power supply line, wherein:

the second temperature-dependent characteristic is a characteristic in which a current value of the second current does not change with the predetermined change in temperature;

the second current flows through the first variable resistor, and a fourth current having a current value that is based on a difference between a current value of the first current and a current value of the second current, flows through the second variable resistor;

when a current supplied to the first node through the first current path is the first current, the first current also flows through the second current path, and

when the current supplied to the first node through the first current path is the third current, the third current also flows through the second current path.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2022
From: YASUDA, TAKAYA
To: KIOXIA CORPORATION
Reel/Frame 062203/0055 →
Continuity (1)
Related Publication 20230186955A1 · Jun 15, 2023
References Cited (6)
US 6452437B1 · Takeuchi · 2002 [cited by examiner]
US 9671812B2 · Madan · 2017 [cited by examiner]
US 10061340B1 · Rao et al. · 2018 [cited by applicant]
US 20040207380A1 · Ariki · 2004 [cited by applicant]
JP 2004318235A · 2004 [cited by applicant]
JP 4479309B2 · 2010 [cited by applicant]