IP Library › Granted Patent US 12,196,683
Granted Patent B2
US 12,196,683 · App. 16/707,415 · Granted Jan 14, 2025

Method for notifying sample analyzer status and sample analysis system

Inventors: Koki Nakano (Kobe, JP); Syunsuke Yao (Kobe, JP); Shouhei Kajino (Kobe, JP); Takahiro Saino (Kobe, JP); Tomohiro Kuroiwa (Kobe, JP)
Assignee: SYSMEX CORPORATION
G01N21/78G01N35/00584G01N2021/7769G01N2035/00306G01N2035/00891G01N2201/12
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Quick Facts
Patent No.
US 12,196,683
App. No.
16/707,415
Granted
Jan 14, 2025
Kind
B2
Abstract

The present invention is to present a status notification method for the sample analyzer. The method includes a detection step for detecting the status of the sample analyzer for analyzing the sample, and an irradiating step for irradiating light upward in accordance with the detection step.

Claims (37)

1. A sample analysis system comprising:

a sample analyzer configured to analyze a sample;

a notification device comprising a housing having an upper surface and an irradiating unit mounted to the sample analyzer; and

a control unit configured to control irradiation of light from the irradiating unit;

the irradiating unit comprises a light source and is configured to irradiate a signal light from the irradiating unit in a vertical direction toward a ceiling in a room in which the sample analysis system is located, wherein the ceiling is above the sample analyzer such that the signal light may be seen on the ceiling by a user;

wherein the upper surface of the housing of the notification device has an irradiation window for allowing the signal light to pass through the irradiation window to the ceiling;

wherein the notification device includes a lens arranged within the irradiating unit, the lens configured so as to direct the irradiated light in the vertical direction toward the ceiling to condense the irradiated light from the irradiating unit so as to become parallel;

wherein the notification device includes a light emitting unit configured to emit light laterally; and

wherein the control unit is configured to control the light emitting unit to emit the light laterally in response to a status of the sample analyzer.

2. The sample analysis system according to claim 1 , wherein

the housing further comprises a color filter configured to change a color of the light irradiated through the irradiation window in an exchangeable manner.

3. The sample analysis system according to claim 1 , wherein

the control unit is configured to control the irradiating unit to stop the irradiation of light in response to a change of the status of the sample analyzer.

4. The sample analysis system according to claim 1 , wherein

the control unit is configured to control the irradiating unit to irradiate the light upward in response to determining that the sample analyzer is in a predetermined status.

5. The sample analysis system according to claim 4 , wherein

the sample analyzer further comprises a reagent storage and a sensor configured to detect a residual amount of a reagent in the reagent storage used for analyzing the sample; and

the predetermined status includes status where the residual amount of the reagent detected by the sensor is equal to or less than a predetermined amount.

6. The sample analysis system according to claim 1 , wherein

the control unit is configured to control the irradiating unit to stop the irradiation of light and control the light emitting unit to emit the light in response to predetermining different status of the sample analyzer.

7. The sample analysis system according to claim 1 , wherein

the control unit is configured to control the light emitting unit to change a color of light in response to predetermining the status of the sample analyzer.

8. The sample analysis system according to claim 1 , further comprising:

an information processing device configured to generate a control signal in response to the status of the sample analyzer;

wherein the control unit is configured to receive the control signal generated by the information processing device, and control the irradiating unit and the light emitting unit in response to the received control signal.

9. The sample analysis system according to claim 1 , wherein

the control unit is configured to change a combination of a color of the light irradiated by the irradiating unit and a color of the light emitted by the light emitting unit in response to the status of the sample analyzer.

10. The sample analysis system according to claim 1 , wherein

the notification device is configured to be installed separately from the sample analyzer.

11. The sample analysis system according to claim 1 , wherein

the irradiating unit comprises a cylindrical reflector in which an optical system is disposed and the cylindrical reflector is configured to guide the light from the optical system to the irradiation window.

12. The sample analysis system according to claim 1 , wherein the irradiating unit includes a cylindrical reflector that is configured to guide the light from the irradiating unit upwardly.

13. The sample analysis system according to claim 1 , further comprising:

a memory configured to store an error list including a plurality of types of errors and a plurality of types of light emission patterns associated with each other, the light emission pattern being combination of a vertical light emission from the irradiating unit and a lateral light emission from the light emitting unit, and wherein

the controller is configured to control the irradiating unit and the light emitting unit according to one of the light emission patterns associated with one of the errors in response to detecting the one of the errors.

14. The sample analysis system according to claim 13 , wherein

the vertical light emission in the error list is selectable between light irradiation and non-irradiation.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2020
From: NAKANO, KOKI; YAO, SYUNSUKE; KAJINO, SHOUHEI; SAINO, TAKAHIRO; KUROIWA, TOMOHIRO
To: SYSMEX CORPORATION
Reel/Frame 051519/0140 →
Priority Claims (1)
JP 2018-231227 · Dec 10, 2018 · national
Continuity (1)
Related Publication 20200182797A1 · Jun 11, 2020
References Cited (21)
US 4374623A · Simon · 1983 [cited by examiner]
US 20130141246A1 · Thiel · 2013 [cited by examiner]
US 20130201019A1 · Yamaguchi · 2013 [cited by examiner]
US 20170191941A1 · Hosotani et al. · 2017 [cited by applicant]
CN 101315389A · 2008 [cited by applicant]
CN 101667153A · 2010 [cited by applicant]
CN 106304845A · 2017 [cited by applicant]
CN 106817818A · 2017 [cited by applicant]
CN 108737800A · 2018 [cited by applicant]
JP H570501U · 1993 [cited by applicant]
JP 2006170868A · 2006 [cited by applicant]
JP 200870115A · 2008 [cited by applicant]
JP 201115313A · 2011 [cited by applicant]
JP 2011209219A · 2011 [cited by applicant]
JP 201273203A · 2012 [cited by applicant]
JP 2016061747A · 2016 [cited by applicant]
WO 2016157516A1 · 2016 [cited by applicant]
“UniCel DxH Series Workcell Coulter Cellular Analysis System Customer Training Modules”, Beckman Coulter Technical Training, UniCel DxH Series Workcell, Ver 1.4, Jan. 2017, pp. 1-318. [cited by applicant]
Office Action (Notice of Reasons for Refusal) issued on May 10, 2022, by the Japanese Patent Office in corresponding Japanese Patent Application No. 2018-231227, and an English translation of the Office Action. (6 pages… [cited by applicant]
Office Action (The First Office Action) issued Oct. 20, 2023, by the National Intellectual Property Administration, P. R. China in corresponding Chinese Patent Application No. 201911261951.3 and an English translation o… [cited by applicant]
Office Action (The Second Office Action) issued on Mar. 28, 2024, by the National Intellectual Property Administration, PRC in corresponding Chinese Patent Application No. 201911261951.3, and an English Translation of t… [cited by applicant]
Cited By (1)
US 1,104,804