IP Library Granted Patent US 12,203,835
Granted Patent B2
US 12,203,835 · App. 17/601,617 · Granted Jan 21, 2025

Fine ratio measuring method and apparatus

Inventors: Toshiki Tsuboi (Tokyo, JP); Naoshi Yamahira (Tokyo, JP)
Assignee: JFE STEEL CORPORATION
G01N15/0205C21B5/00C21B5/006C21B5/007C21B7/24C21B2300/04F27B1/28F27D2019/0003F27D2021/026G01N2015/0061G01N15/02G01N15/075G01N2021/1765G01N33/00G01N33/24
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,203,835
App. No.
17/601,617
Filed
Oct 5, 2021
Granted
Jan 21, 2025
Kind
B2
Art Unit
2863
USPC
702/158
Abstract

A fine ratio measuring method and apparatus. The fine ratio measuring method includes a step S1 of measuring a distance between a distance measuring device and lumps of material, a step S2 of calculating a feature quantity from distance data obtained in the step S1, and a step S3 of converting the feature quantity calculated in step S2 to a fine ratio. The feature quantity calculated in step S2 represents distance variation calculated from the distance data obtained in the step S1. A higher fine ratio in lumps of material means greater microscopic distance variation caused by microscopic irregularities in the surface of the lumps of material in the height direction within a three-dimensional shape. Therefore, by using the distance variation as the feature quantity, the fine ratio in the lumps of material can be measured in real time with high accuracy.

Claims (15)

1. A fine ratio measuring method comprising:

a step (S1) of measuring a distance between a laser rangefinder and lumps of material conveyed on a conveyer, wherein in step (S1), the laser rangefinder is installed above the lumps of material such that an entire width of the conveyer is contained within a measurement field of the laser rangefinder that measures the distance to the lumps of material;

a step (S2) of calculating a feature quantity from the measured distance obtained in step (S1); and

a step (S3) of converting the feature quantity calculated in step (S2) to a fine ratio, wherein the fine ratio is defined as a ratio of mass of fine particles with a predetermined size or less to a total mass of the lumps of material, wherein

the feature quantity calculated in step (S2) represents distance variation calculated from the measured distance obtained in step (S1),

the feature quantity calculated in step (S2) is based on standard deviations in a standard deviation matrix obtained by applying a standard deviation filter to the measured distance obtained in step (S1), and

the feature quantity calculated in step (S2) is a modal standard deviation in the standard deviation matrix obtained by applying the standard deviation filter to the measured distance obtained in step (S1).

2. The fine ratio measuring method according to claim 1 , wherein a filtering range of the standard deviation filter is 10×10 pixels or less.

3. A fine ratio measuring apparatus comprising:

a laser rangefinder configured to measure a distance to lumps of material conveyed on a conveyer, wherein the laser rangefinder is installed above the lumps of material such that an entire width of the conveyer is contained within a measurement field of the laser rangefinder that measures the distance to the lumps of material; and

a computing device configured to calculate a feature quantity from the measured distance obtained by the laser rangefinder, and convert the calculated feature quantity to a fine ratio, wherein the fine ratio is defined as a ratio of mass of fine particles with a predetermined size or less to a total mass of the lumps of material, wherein

the computing device calculates the feature quantity representing distance variation from the measured distance obtained by the laser rangefinder,

the computing device applies a standard deviation filter to the measured distance obtained by the laser rangefinder, and calculates the feature quantity on the basis of standard deviations in a resulting standard deviation matrix, and

the computing device applies the standard deviation filter to the measured distance obtained by the laser rangefinder, and calculates a modal standard deviation in the resulting standard deviation matrix as the feature quantity.

4. The fine ratio measuring apparatus according to claim 3 , wherein a filtering range of the standard deviation filter is 10×10 pixels or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2021
From: TSUBOI, TOSHIKI; YAMAHIRA, NAOSHI
To: JFE STEEL CORPORATION
Reel/Frame 057705/0399 →
Priority Claims (1)
JP 2019-073085 · Apr 5, 2019 · national
Continuity (1)
Related Publication 20220205893A1 · Jun 30, 2022
References Cited (31)
US 6577756B1 · Furui · 2003 [cited by applicant]
US 20030185429A1 · Furui · 2003 [cited by applicant]
US 20040131245A1 · Furui · 2004 [cited by applicant]
US 20050126342A1 · Sterneland et al. · 2005 [cited by applicant]
CN 106459768A · 2017 [cited by applicant]
EP 3147341A1 · 2017 [cited by applicant]
JP S58217613A · 1983 [cited by applicant]
JP H05164677A · 1993 [cited by applicant]
JP H06127663A · 1994 [cited by applicant]
JP 2000304648A · 2000 [cited by applicant]
JP 2000329683A · 2000 [cited by applicant]
JP 2004340822A · 2004 [cited by applicant]
JP 2005134301A · 2005 [cited by applicant]
JP 2014092494A · 2014 [cited by applicant]
JP 2015124436A · 2015 [cited by applicant]
JP 2015196888A · 2015 [cited by applicant]
JP 6207421B2 · 2017 [cited by applicant]
RU 2299242C2 · 2007 [cited by applicant]
RU 2353660C2 · 2009 [cited by applicant]
WO 2005071119A1 · 2005 [cited by applicant]
WO 2011023853A2 · 2011 [cited by applicant]
WO 2018101287A1 · 2018 [cited by applicant]
WO 2018181942A1 · 2018 [cited by applicant]
Xu et al. (A Real-Time 3D Measurement System for the Blast Furnace Burden Surface Using High-Temperature Industrial Endoscope. Sensors (Basel). Feb. 6, 2020;20(3):869. doi: 10.3390/s20030869. PMID: 32041296; PMCID: PMC7… [cited by examiner]
Jun. 30, 2020 International Search Report issued in International Application No. PCT/JP2020/015327. [cited by applicant]
Jan. 6, 2021 Office Action issued in Taiwanese Patent Application No. 109111462. [cited by applicant]
Feb. 9, 2021 Office Action issued in Japanese Patent Application No. 2020-544967. [cited by applicant]
Mar. 3, 2022 Extended European Search Report issued in European Patent Application No. 20784334.3. [cited by applicant]
Mar. 15, 2022 Office Action issued in Russian Patent Application No. 2021129024. [cited by applicant]
May 7, 2022 Office Action issued in Chinese Patent Application No. 202080026229.6. [cited by applicant]
Mar. 11, 2023 Office Action issued in Korean Patent Application No. 10-2021-7031388. [cited by applicant]