IP Library › Granted Patent US 12,204,060
Granted Patent B2
US 12,204,060 · App. 18/064,414 · Granted Jan 21, 2025

Full-wavefield angle gather for high-contrast inter thin-bed models

Inventors: Jianhua Yu (Houston, TX); Yilong Qin (Katy, TX)
Assignee: CHINA PETROLEUM & CHEMICAL CORPORATION
G01V1/50G01V2210/6169
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Quick Facts
Patent No.
US 12,204,060
App. No.
18/064,414
Granted
Jan 21, 2025
Kind
B2
Abstract

Methods, apparatuses, and mediums related to a full-wavefield angle gather generation for high-contrast inter-thin bed modeling for reservoir characterizations of a survey region are provided. A method may include a well logging tool having one or more sonic generators and one or more well log data recording sensors in a wellbore. Sound waves may be generated using the one or more sonic generators in order to generate reflections in the survey region. Well log data, based on the reflections, may be received using well log data recording sensors, and the well log data may be transmitted to at least one memory. A method may perform, using a computer system, a full-wavefield angle gather generation. A method may generate, by a computer system, the high-contrast inter thin-bed models based on the full-wavefield angle gather.

Claims (50)

1. A method for generating a full-wavefield angle gather in high-contrast inter thin-bed models for reservoir characterizations of a survey region, the method comprising:

positioning a well logging tool including one or more sonic generators and one or more well log data recording sensors in a wellbore;

generating sound waves, using the one or more sonic generators, to generate reflections in the survey region;

receiving well log data based on the reflections using the one or more well log data recording sensors, transmitting the well log data to at least one memory, and storing the well log data in the at least one memory;

generating, by a computer system, a full-wavefield angle gather;

generating, by the computer system, the high-contrast inter thin-bed models based on the full-wavefield angle gather; and

displaying one or more images of the high-contrast inter thin-bed models based on the full-wavefield angle gather,

wherein generating, by the computer system, the full-wavefield angle gather further comprises:

generating a full-wavefield tau-p gather using Kennett modeling;

generating tau-p gather without one or more multiples and/or without one or more Primary-Secondary-Primary (PSP) converted waves; and

generating tau-p gather with only one or more multiples and/or one or more PSP converted waves by subtracting the tau-p gather without one or more multiples and/or without one or more PSP converted waves from the full-wavefield tau-p gather.

2. The method of claim 1 , wherein generating, by the computer system, the full-wavefield angle gather further comprises calculating a primary-only angle gather.

3. The method of claim 2 , wherein a Zoeppritz-based raytracing algorithm is used to calculate the primary-only angle gather.

4. The method of claim 1 , wherein generating, by the computer system, the full-wavefield angle gather further comprises converting the tau-p gather with only one or more multiples and/or one or more PSP converted waves into a migrated ray parameter gather by applying an elliptical moveout correction.

5. The method of claim 4 , wherein generating, by the computer system, the full-wavefield angle gather further comprises generating an angle gather with only one or more multiples and/or one or more PSP converted waves by converting the migrated ray parameter gather into the angle gather using slowness-to-angle mapping.

6. The method of claim 5 , wherein generating, by the computer system, the full-wavefield angle gather further comprises calculating primary-only angle gather using a Zoeppritz-based raytracing algorithm.

7. The method of claim 6 , wherein generating, by the computer system, the full-wavefield angle gather further comprises generating the full-wavefield angle gather by adding the Zoeppritz-based raytracing-based primary-only angle gather with the angle gather with only one or more multiples and/or one or more PSP converted waves.

8. The method of claim 1 , wherein generating, by the computer system, the full-wavefield angle gather, further comprises:

generating a full-wavefield tau-p gather using Kennett modeling;

generating the tau-p gather without one or more multiples; and

generating the tau-p gather with only one or more multiples by subtracting the tau-p gather without one or more multiples from the full-wavefield tau-p gather.

9. The method of claim 1 , wherein generating, by the computer system, the full-wavefield angle gather, further comprises:

generating a full-wavefield tau-p gather using Kennett modeling;

generating the tau-p gather without one or more PSP converted waves; and

generating the tau-p gather with only one or more multiples by subtracting the tau-p gather without one or more PSP converted waves from the full-wavefield tau-p gather.

10. An apparatus for generating a full-wavefield angle gather in high-contrast inter thin-bed models for reservoir characterizations of a survey region, the apparatus comprising:

a well logging tool comprising one or more sonic generators configured to generate sound waves to generate reflections in the survey region and one or more well log data recording sensors configured to receive well log data based on the reflections, and well logging tool being configured to transmit the well log data;

at least one memory storing the transmitted well log data, the at least one memory comprising instructions; and

at least one processor to execute the instructions stored in the at least one memory to implement:

generating a full-wavefield angle gather;

generating the high-contrast inter thin-bed models based on the full-wavefield angle gather; and

displaying one or more images of the high-contrast inter thin-bed models based on the full-wavefield angle gather;

wherein generating, by the computer system, the full-wavefield angle gather further comprises:

generating a full-wavefield tau-p gather using Kennett modeling;

generating tau-p gather without one or more multiples and/or without one or more Primary-Secondary-Primary (PSP) converted waves; and

generating tau-p gather with only one or more multiples and/or one or more PSP converted waves by subtracting the tau-p gather without one or more multiples and/or without one or more PSP converted waves from the full-wavefield tau-p gather.

11. The apparatus of claim 10 , wherein generating the full-wavefield angle gather further comprises calculating primary-only angle gather.

12. The apparatus of claim 11 , wherein a Zoeppritz-based raytracing algorithm is used to calculate the primary-only angle gather.

13. The apparatus of claim 10 , wherein generating the full-wavefield angle gather further comprise converting the tau-p gather with only one or more multiples and/or one or more PSP converted waves into a migrated ray parameter gather by applying an elliptical moveout correction.

14. The apparatus of claim 13 , wherein generating the full-wavefield angle gather further comprises generating an angle gather with only one or more multiples and/or one or more PSP converted waves by converting the migrated ray parameter gather into the angle gather using slowness-to-angle mapping.

15. The apparatus of claim 14 , wherein generating the full-wavefield angle gather further comprises calculating primary-only angle gather using a Zoeppritz-based raytracing algorithm.

16. The apparatus of claim 15 , wherein generating the full-wavefield angle gather further comprises generating the full-wavefield angle gather by adding the Zoeppritz-based raytracing-based primary-only angle gather with the angle gather with only one or more multiples and one or more PSP converted waves.

17. The apparatus of claim 10 , wherein generating the full-wavefield angle gather further comprises:

generating a full-wavefield tau-p gather using Kennett modeling;

generating the tau-p gather without one or more multiples; and

generating the tau-p gather with only one or more multiples by subtracting the tau-p gather without one or more multiples from the full-wavefield tau-p gather.

18. The apparatus of claim 10 , wherein generating the full-wavefield angle gather further comprises:

generating a full-wavefield tau-p gather using Kennett modeling;

generating the tau-p gather without one or more PSP converted waves; and

generating the tau-p gather with only one or more PSP converted waves by subtracting the tau-p gather without one or more PSP converted waves from the full-wavefield tau-p gather.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 12, 2023
From: SINOPEC TECH HOUSTON, LLC.
To: CHINA PETROLEUM & CHEMICAL CORPORATION
Reel/Frame 062361/0396 →
EMPLOYMENT, CONFIDENTIALITY, AND INVENTION ASSIGNMENT AGREEMENT Recorded Jan 12, 2023
From: QIN, YILONG
To: SINOPEC TECH HOUSTON LLC
Reel/Frame 062380/0623 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2022
From: YU, JIANHUA
To: SINOPEC TECH HOUSTON, LLC.
Reel/Frame 062158/0212 →
Continuity (2)
Provisional Application 63288303 · Dec 10, 2021
Related Publication 20230184982A1 · Jun 15, 2023
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