Data acquisition in charged particle microscopy
Disclosed herein are charged particle microscopy (CPM) support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a CPM support apparatus may include: first logic to cause a CPM to generate a single image of a first portion of a specimen; second logic to generate a first mask based on one or more regions-of-interest provided by user annotation of the single image; and third logic to train a machine-learning model using the single image and the one or more regions-of-interest. The first logic may cause the CPM to generate multiple images of corresponding multiple additional portions of the specimen, and the second logic may, after the machine-learning model is trained using the single image and the one or more regions-of-interest, generate multiple masks based on the corresponding images of the additional portions of the specimen using the machine-learning model without retraining.
1. A charged particle microscope support apparatus, comprising:
first logic to cause a charged particle microscope to generate a single image of a first portion of a specimen;
second logic to generate a first mask based on one or more regions-of-interest provided by user annotation of the single image; and
third logic to train a machine-learning computational model using the single image and the one or more regions-of-interest;
wherein:
the first logic is to cause the charged particle microscope to generate a plurality of images of a corresponding plurality of additional portions of the specimen; and
the second logic is to, after the machine-learning computational model is trained using the single image and the one or more regions-of-interest, generate a plurality of masks based on the corresponding images of the additional portions of the specimen using the machine-learning computational model without retraining.
2. The charged particle microscope support apparatus of claim 1 , wherein the first logic is to, after generation of the first mask, cause the charged particle microscope to generate an other image of the first portion of the specimen in accordance with the first mask.
3. The charged particle microscope support apparatus of claim 2 , wherein a resolution of the single image of the first portion of the specimen is less than a resolution of the other image of the first portion of the specimen.
4. The charged particle microscope support apparatus of claim 2 , wherein an acquisition time of the single image of the first portion is less than an acquisition time of the other image of the first portion of the specimen.
5. The charged particle microscope support apparatus of claim 2 , further comprising:
fourth logic to combine the single image and the other image into a combined image representative of the first portion of the specimen, and to provide the combined image for display by a display device.
6. The charged particle microscope support apparatus of claim 1 , wherein 1) the first portion of the specimen represents a plane through the specimen, and the plurality of additional portions of the specimen represent a plurality of parallel planes through the specimen, or 2) the first portion of the specimen represents a plane through the specimen, and the plurality of additional portions of the specimen represent a plurality of planes through the specimen at different angles.
7. The charged particle microscope support apparatus of claim 1 , wherein the second logic is to:
provide the single image of the first portion of the specimen for display on a display device; and
receive, from a user, an indication of one or more regions-of-interest by user annotations of the displayed single image.
8. The charged particle microscope support apparatus of claim 1 , wherein the second logic is to compare the masks associated with adjacent portions of the specimen and, when differences between the masks meet one or more difference criteria, adjust one or more of the masks.
9. A charged particle microscope support apparatus, comprising:
first logic to cause a charged particle microscope to generate a single image of a first portion of a specimen;
second logic to generate a first mask based on one or more regions-of-interest indicated by user annotation of the single image, wherein the regions-of-interest include a feature-of-interest in the specimen; and
third logic to train a machine-learning computational model using the single image and the one or more regions-of-interest;
wherein:
the first logic is to cause the charged particle microscope to generate an image of a second portion of the specimen, wherein the second portion of the specimen is proximate to the first portion of the specimen; and
the second logic is to, after the machine-learning computational model is trained using the single image and the one or more regions-of-interest, generate a second mask based on the image of the second portion of the specimen using the machine-learning computational model, wherein the second mask indicates to image regions of the second portion of the specimen including the feature-of-interest and regions of the second portion of the specimen that do not include the feature-of-interest.
10. The charged particle microscope support apparatus of claim 9 , further comprising:
fourth logic to generate a three-dimensional image of the specimen using images captured in accordance with the masks.
11. The charged particle microscope support apparatus of claim 9 , wherein the first portion of the specimen is spaced apart from the second portion of the specimen by a distance between 1 micron and 30 microns.
12. The charged particle microscope support apparatus of claim 11 , wherein the first portion of the specimen and the second portion of the specimen are spaced apart in the (z)-direction.
13. The charged particle microscope support apparatus of claim 9 , wherein, before the machine-learning computational model is trained using the single image and the one or more regions-of-interest, the machine-learning computational model is trained using a training corpus that does not include images of the specimen.
14. The charged particle microscope support apparatus of claim 13 , wherein the training corpus does not include any examples of the feature-of-interest.
15. The charged particle microscope support apparatus of claim 9 , wherein the second logic is to compare the first and second masks and, when differences between the masks meet one or more difference criteria, adjust the second mask.