IP Library › Granted Patent US 12,224,760
Granted Patent B2
US 12,224,760 · App. 18/422,192 · Granted Feb 11, 2025

Current steering digital-to-analog converter and integrated circuit including the same

Inventors: Youngsea Cho (Seongnam-si, KR); Wan Kim (Hwaseong-si, KR); Jiseon Paek (Suwon-si, KR); Seunghyun Oh (Seoul, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H03M1/0617H03M1/38H03M1/66
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,224,760
App. No.
18/422,192
Granted
Feb 11, 2025
Kind
B2
Abstract

A current steering digital-to-analog converter includes a plurality of current cells each including a current source circuit and a current switch circuit to selectively output a current in response to a first input signal corresponding to a digital signal; a dummy current cell including a dummy current source circuit and a dummy current switch circuit to output a current in response to a second input signal; and a current switch bias circuit coupled to the dummy current cell to track a first voltage of an internal node of the dummy current source circuit and configured to generate a first bias voltage applied to the current switch circuit.

Claims (47)

1. A current steering digital-to-analog converter comprising:

a first current cell configured to selectively output a first current based on a first input signal and adjust an output amplitude of the first current based on a first bias voltage;

a first dummy current cell configured to output a second current based on a second input signal and adjust the output amplitude of the second current based on the first bias voltage; and

a first bias circuit configured to detect a change in a first voltage of a first internal node of the first dummy current cell and adjust the first bias voltage to correspond to the detected change in the first voltage.

2. The current steering digital-to-analog converter of claim 1 , wherein the first dummy current cell corresponds to a replica circuit from the first current cell.

3. The current steering digital-to-analog converter of claim 1 , wherein the first dummy current cell comprises at least one transistor configured to output the second current based on the first bias voltage received through a gate, and

a voltage of a second internal node of the first dummy current cell is related to an operation mode of the at least one transistor, and controlled by a change in an amplitude of the second current output from the at least one transistor by the adjusted first bias voltage.

4. The current steering digital-to-analog converter of claim 1 , wherein the change in the first voltage of the first internal node is made when there are changes in process, voltage, and temperature (PVT).

5. The current steering digital-to-analog converter of claim 1 , wherein the first bias circuit is configured to adjust the first bias voltage to track the first voltage of the first internal node.

6. The current steering digital-to-analog converter of claim 1 , wherein the first bias circuit is configured to be activated or deactivated according to process, voltage, and temperature (PVT) conditions.

7. The current steering digital-to-analog converter of claim 6 , further comprising a second bias circuit configured to generate a fixed second bias voltage that is applied to the first current cell and the first dummy current cell, instead of the first bias voltage, when the first bias circuit is deactivated.

8. The current steering digital-to-analog converter of claim 1 , wherein the first bias circuit comprises:

a transistor connected to the first internal node through one end thereof; and

a proportional to absolute temperature (PTAT) current source connected to the transistor through another end of the transistor to generate the first bias voltage.

9. The current steering digital-to-analog converter of claim 1 , wherein the first dummy current cell comprises first and second transistors coupled to each other in a cascade structure, and

the first and second transistors are connected to each other through the first internal node.

10. The current steering digital-to-analog converter of claim 1 , wherein the first dummy current cell comprises:

a dummy current source circuit configured to generate the second current; and

a dummy current switch circuit configured to receive the second input signal and the first bias signal, and

the dummy current source circuit and the dummy current switch circuit are connected to each other through the first internal node.

11. The current steering digital-to-analog converter of claim 1 , further comprising a second current cell configured to selectively output a third current based on a third input signal corresponding to a digital signal, and adjust an output amplitude of the third current based on the first bias voltage.

12. The current steering digital-to-analog converter of claim 11 , wherein the first input signal corresponds to a most significant bit (MSB) of the digital signal, and

the third input signal corresponds to a least significant bit (LSB) of the digital signal.

13. The current steering digital-to-analog converter of claim 1 , further comprising:

a second current cell configured to selectively output the first current based on a third input signal corresponding to a digital signal, and adjust the output amplitude of the first current based on a second bias voltage;

a second dummy current cell configured to output the second current based on a fourth input signal, and adjust the output amplitude of the second current based on the second bias voltage; and

a second bias circuit configured to detect a change in a second voltage of a second internal node of the second dummy current cell, and adjust the second bias voltage to correspond to the detected change in the second voltage.

14. The current steering digital-to-analog converter of claim 13 , wherein the first input signal corresponds to a most significant bit (MSB) of the digital signal, and

the third input signal corresponds to a least significant bit (LSB) of the digital signal.

15. The current steering digital-to-analog converter of claim 1 , further comprising a second bias circuit configured to generate a second bias voltage that is applied to the first current cell and the first dummy current cell to generate the first current.

16. The current steering digital-to-analog converter of claim 1 , further comprising a plurality of current cells including the first current cell,

wherein the plurality of current cells comprise: a plurality of most significant bit (MSB) current cells configured to be controlled by a thermometer code, and a plurality of least significant bit (LSB) current cells configured to be controlled by a binary code, and

the first dummy current cell is copied from any one of the plurality of MSB current cells.

17. An integrated circuit comprising:

a processor configured to output a digital signal; and

a digital-analog converter configured to convert the digital signal into an analog signal,

wherein the digital-analog converter comprises:

a plurality of current cells configured to selectively output a first current based on the digital signal, and adjust an output amplitude of the first current based on a bias voltage;

a dummy current cell copied from any one of the plurality of current cells; and

a bias circuit configured to detect a change in a voltage of an internal node of the dummy current cell, and adjust the bias voltage to correspond to the detected change of the voltage.

18. The integrated circuit of claim 17 , wherein the digital-analog converter further comprises a current source bias circuit configured to generate second bias voltages that are applied to a current source of each of the plurality of current cells and the dummy current cell.

19. The integrated circuit of claim 17 , wherein the plurality of current cells comprise a plurality of most significant bit (MSB) current cells configured to be controlled by a thermometer code, and a plurality of least significant bit (LSB) current cells configured to be controlled by a binary code, and

the dummy current cell is copied from any one of the plurality of MSB current cells.

20. The integrated circuit of claim 17 , wherein the dummy current cell comprises:

a dummy current source circuit configured to generate the first current; and

a dummy current switch circuit configured to output the first current, and

the internal node is one of an internal node of the dummy current source circuit and a node that couples the dummy current source circuit to the dummy current switch circuit.

Priority Claims (1)
KR 10-2021-0062159 · May 13, 2021 · national
Continuity (2)
Continuation 17673127 · Feb 16, 2022
Related Publication 20240171186A1 · May 23, 2024
References Cited (24)
US 5793671A · Selcuk · 1998 [cited by applicant]
US 6275179B1 · Mori · 2001 [cited by applicant]
US 7292172B2 · Matsumoto et al. · 2007 [cited by applicant]
US 7629910B2 · Ramadoss et al. · 2009 [cited by applicant]
US 7639081B2 · Arakali et al. · 2009 [cited by applicant]
US 7834791B2 · Huang et al. · 2010 [cited by applicant]
US 8441382B2 · Mahajan et al. · 2013 [cited by applicant]
US 9300318B1 · Medina · 2016 [cited by applicant]
US 9319061B1 · Azarmnia et al. · 2016 [cited by applicant]
US 9350372B2 · Chang et al. · 2016 [cited by applicant]
US 9660647B2 · Chern et al. · 2017 [cited by applicant]
US 10469097B1 · Bothra · 2019 [cited by applicant]
US 10790636B1 · Abdelhalim · 2020 [cited by examiner]
US 10965308B1 · Gruber et al. · 2021 [cited by applicant]
US 20020044076A1 · Yao et al. · 2002 [cited by applicant]
US 20080024340A1 · Matsumoto et al. · 2008 [cited by applicant]
US 20080117088A1 · Huang et al. · 2008 [cited by applicant]
US 20100176978A1 · Joseph · 2010 [cited by applicant]
US 20180151219A1 · Hsu et al. · 2018 [cited by applicant]
US 20200067520A1 · Han et al. · 2020 [cited by applicant]
US 20220368337A1 · Cho et al. · 2022 [cited by applicant]
US 20230148381A1 · Chao · 2023 [cited by examiner]
Debajit Basak, et al., “An On-Chip Static and Dynamic DAC Error Correction Technique for High Speed Multibit Delta-Sigma Modulators”, 2018 IEEE. [cited by applicant]
Office Action dated Jun. 22, 2023 in corresponding U.S. Appl. No. 17/673,127. [cited by applicant]