IP Library › Granted Patent US 12,230,472
Granted Patent B1
US 12,230,472 · App. 18/772,999 · Granted Feb 18, 2025

Effective temperature calculation method for multi-charged particle beam writing region, multi-charged particle beam writing apparatus, multi-charged particle beam writing method, and recording medium recording program

Inventor: Shingo Mori (Yokohama, JP)
Assignee: NuFlare Technology, Inc.
H01J37/3177H01J37/304H01J2237/24507H01J2237/24585H01J2237/31769
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Quick Facts
Patent No.
US 12,230,472
App. No.
18/772,999
Granted
Feb 18, 2025
Kind
B1
Abstract

In an effective temperature calculation method for multi-charged particle beam writing region, at a plurality of observation times which are irradiation end times of a tracking cycle in a time domain in which a beam array region passes through a mesh region of interest, for each of the plurality of unit heat source regions around the mesh region of interest, a temperature rise amount given to the mesh region of interest is determined based on a total irradiation time of the unit heat source region, times since start of irradiation to the unit heat source region to the observation times, and a distance from the unit heat source region to the mesh region of interest, the temperature rise amount is accumulated, and accumulated values corresponding to the plurality of observation times are averaged to calculate an effective temperature of the mesh region of the interest.

Claims (18)

1. An effective temperature calculation method for multi-charged particle beam writing region, the effective temperature calculation method comprising:

a step of calculating, based on writing data, a dose amount of each of a plurality of pixels into which a writing region of a sample is divided, the sample being placed on a stage which moves during pattern writing;

a step of calculating an effective temperature of a mesh region of interest as a temperature calculation target by accumulating a temperature rise amount given to the mesh region of interest by a plurality of unit heat source regions around the mesh region of interest in a time domain in which a beam array region of a multi-charged particle beam passes through the mesh region of interest;

in the step of calculating the effective temperature,

at a plurality of observation times which are irradiation end times of a tracking cycle in the time domain in which the beam array region passes through the mesh region of interest, for each of the plurality of unit heat source regions around the mesh region of interest, a temperature rise amount given to the mesh region of interest is determined based on a total irradiation time of the unit heat source region, times since start of irradiation to the unit heat source region to the observation times, and a distance from the unit heat source region to the mesh region of interest, the temperature rise amount is accumulated, and accumulated values corresponding to the plurality of observation times are averaged to calculate an effective temperature of the mesh region of the interest, and

time integration of temperature is performed using a time structure in which irradiation of the multi-charged particle beam is pulse-like beam irradiation with a period of the tracking cycle.

2. The effective temperature calculation method for multi-charged particle beam writing region according to claim 1 ,

wherein the unit heat source region has a greater size for a longer distance from the mesh region of the interest.

3. An effective temperature calculation method for multi-charged particle beam writing region, comprising:

a step of calculating, based on writing data, a dose amount of each of a plurality of pixels into which a writing region of a sample is divided, the sample being placed on a stage which moves during pattern writing; and

a step of calculating an effective temperature of a mesh region of interest as a temperature calculation target by accumulating a temperature rise amount given to the mesh region of interest by a plurality of unit heat source regions around the mesh region of interest in a time domain in which a beam array region of a multi-charged particle beam passes through the mesh region of interest,

wherein in the step of calculating the effective temperature,

a table stored in a storage is referenced, the table defining a temperature rise amount given by each unit heat source region in the writing region to a plurality of mesh regions into which the writing region is divided, for a plurality of combinations of a total irradiation time of the unit heat source region, a time elapsed since start of irradiation to the unit heat source region, and a distance from the unit heat source region, and

at an observation time in a time domain in which the beam array region passes through the mesh region of interest, for each of the plurality of unit heat source regions around the mesh region of interest, a temperature rise amount is obtained from the table and accumulated, the temperature rise amount corresponding to the total irradiation time of the unit heat source region, the time since start of irradiation to the unit heat source region to the observation time, and the distance from the unit heat source region to the mesh region of interest.

4. The effective temperature calculation method for multi-charged particle beam writing region according to claim 3 ,

wherein at a plurality of observation times in a time domain in which the beam array region passes through the mesh region of interest, a temperature rise amount is obtained from the table and accumulated, accumulated values corresponding the plurality of observation times are averaged to calculate an effective temperature of the mesh region of interest.

5. The effective temperature calculation method for multi-charged particle beam writing region according to claim 3 ,

wherein the unit heat source region has a greater size for a longer distance from the mesh region of the interest.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 16, 2024
From: MORI, SHINGO
To: NUFLARE TECHNOLOGY, INC.
Reel/Frame 067993/0256 →
Continuity (1)
Continuation PCTJP2023037658 · Oct 18, 2023
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