Granted Patent B2

US 12,245,846 · App. 17/048,433 · Granted Mar 11, 2025

Inventor: Yoshihiro Wakita (Tokyo, JP)

Assignee: SONY CORPORATION

A61B5/0261G01N21/47G01P3/366G01P5/26

Abstract

Claims (54)

1. A scattered light signal measurement apparatus, comprising:

a coherent light source configured to emit coherent light to a measurement target containing scatterers;

an irradiation light control unit including a plurality of lenses configured to magnify and collimate the coherent light emitted from the coherent light source;

a light receiving element including at least one photodiode configured to receive scattered light obtained when the coherent light emitted to the measurement target is scattered by the scatterers contained in the measurement target; and

an incident angle limiting unit including at least one lens and a plurality of light shields,

wherein the incident angle limiting unit is configured to

limit an incident angle of the scattered light that is incident on a single point of the light receiving element to be equal to or smaller than a predetermined angle, and

control the light receiving element to increase an aperture ratio,

wherein each light shield of the plurality of light shields includes a plate-like member made of a material configured to prevent transmission of light having a wavelength of the scattered light, each plate-like member having a surface that extends in parallel to other light shields in a corresponding layer of the plurality of light shields,

wherein a first layer of the plurality of light shields includes a plurality of plate-like members extending in a first direction,

wherein a second layer of the plurality of light shields includes a plurality of plate-like members extending in a second direction different from the first direction, and

wherein the coherent light source includes a laser configured to emit the coherent light.

2. The scattered light signal measurement apparatus according to claim 1 ,

wherein the incident angle limiting unit is further configured to limit a light beam diameter of the scattered light that is incident on the single point of the light receiving element to be smaller than an entire light beam diameter that is incident on the light receiving element.

3. The scattered light signal measurement apparatus according to claim 2 ,

wherein the incident angle limiting unit is further configured to concentrate the scattered light at a different point of the light receiving element in accordance with the incident angle.

4. The scattered light signal measurement apparatus according to claim 3 ,

wherein the incident angle limiting unit includes a lens array in which a plurality of lenses is arranged.

5. The scattered light signal measurement apparatus according to claim 4 ,

wherein the plurality of lenses concentrates scattered light at the incident angle limited by each of the plurality of lenses to the light receiving element.

6. The scattered light signal measurement apparatus according to claim 3 ,

wherein the plurality of light shields are configured to prevent mixing of light incident on the at least one lens and light incident on each portion of the incident angle limiting unit other than the at least one lens, and

wherein the plurality of light shields are disposed between the at least one lens of the incident angle limiting unit and the at least one photodiode of the light receiving element.

7. The scattered light signal measurement apparatus according to claim 2 ,

wherein the incident angle limiting unit is further configured to

set a plurality of pin holes with respect to the light receiving element,

limit the incident angle of the scattered light that is incident from each pin hole on the single point of the light receiving element to be equal to or smaller than the predetermined angle, and

concentrate scattered light having an amount larger than an amount of scattered light, which is concentrated by a single pin hole, to the light receiving element.

8. The scattered light signal measurement apparatus according to claim 1 ,

wherein the irradiation light control unit includes an optical member including glass configured to control an irradiation diameter of the coherent light emitted from the coherent light source.

9. The scattered light signal measurement apparatus according to claim 8 ,

wherein the irradiation diameter is 0.5 mm or more and 2 mm or less.

10. The scattered light signal measurement apparatus according to claim 1 , further comprising:

a first coherent light source including at least one first laser configured to emit first coherent light having a first wavelength range to the measurement target; and

a second coherent light source including at least one second laser configured to emit second coherent light having a second wavelength range different from the first wavelength range to the measurement target.

11. The scattered light signal measurement apparatus according to claim 1 , further comprising:

a light receiving element array in which a plurality of photodiodes is arranged.

12. The scattered light signal measurement apparatus according to claim 1 ,

wherein the incident angle limiting unit includes a single louver layer, and

wherein the single louver layer includes a plurality of louvers extending in parallel to each other.

13. The scattered light signal measurement apparatus according to claim 1 , further comprising:

at least one polarization filter disposed in at least one optical path between the measurement target and the light receiving element.

14. The scattered light signal measurement apparatus according to claim 8 ,

wherein the coherent light source and the irradiation light control unit are further configured to make the coherent light incident on the measurement target in a direction inclined with respect to an optical path of scattered light travelling toward a surface of the light receiving element from the measurement target.

15. The scattered light signal measurement apparatus according to claim 14 ,

wherein the irradiation light control unit is further configured to

shape the coherent light into an elliptical shape, and

emit the shaped coherent light such that an irradiation spot of the coherent light at the measurement target has a circular shape.

16. The scattered light signal measurement apparatus according to claim 1 ,

wherein the incident angle limiting unit includes a plurality of louver layers,

wherein each louver layer includes a plurality of louvers extending in parallel to each other, and

wherein the incident angle limiting unit is an optical path limiting filter in which directions in which respective louvers of each louver layer of the plurality of louver layers extend across each other.

17. The scattered light signal measurement apparatus according to claim 1 ,

wherein the laser is a vertical cavity surface emitting laser.

Assignments (1)

Priority Claims (2)

Continuity (1)

References Cited (25)