Imaging device
View Patent ↗An imaging device includes: an area light source including an emission surface from which a sub-terahertz wave is emitted to a measurement target; and a detector including an image sensor that receives a reflected wave generated by the measurement target reflecting the sub-terahertz wave emitted from the emission surface. The area light source includes: at least one point light source that emits a sub-terahertz wave; and a reflector that reflects the sub-terahertz wave emitted from the at least one point light source, to generate a sub-terahertz wave to be emitted from the emission surface. The reflector has a reflection surface that is a bumpy surface which includes two or more frequency components in a spatial frequency range and whose roughness curve element mean length RSm is at least 0.3 mm.
1. An imaging device comprising:
an area light source including an emission surface from which a sub-terahertz wave is emitted to a measurement target; and
a detector including an image sensor that receives a reflected wave generated by the measurement target reflecting the sub-terahertz wave emitted from the emission surface,
wherein the area light source includes:
at least one point light source that emits a sub-terahertz wave; and
a reflector that diffusely reflects the sub-terahertz wave emitted from the at least one point light source, to generate a sub-terahertz wave to be emitted from the emission surface, the reflector including a reflection surface that is a bumpy surface which is of a shape in which a plurality of protruding portions having mutually different shapes and a plurality of recessed portions having mutually different shapes are randomly arranged, includes two or more frequency components in a spatial frequency range and whose roughness curve element mean length RSm is at least 0.3 mm.
2. The imaging device according to claim 1 , wherein
the detector includes an optical system that forms an image on the image sensor by an optical focus of the reflected wave, and
when Φ denotes an entrance pupil diameter of the optical system, b denotes a distance between the emission surface and the measurement target, c denotes a distance between the measurement target and the optical system, and λ denotes a wavelength of the sub-terahertz wave emitted from the at least one point light source:
the reflection surface includes one or more unit areas each of which has a bumpy surface including at least two frequency components in a frequency range of at most (Φ×b/c)/Ξ in a spatial frequency range;
a width of each of the one or more unit areas is at least Φ×b/c; and
the roughness curve element mean length RSm is less than 2×Φ×b/c.
3. The imaging device according to claim 2 , wherein:
the one or more unit areas include a first unit area and a second unit area;
the first unit area and the second unit area are in contact with each other at a side shared between the first unit area and the second unit area; and
a geometry of a bumpy surface of the first unit area and a geometry of a bumpy surface of the second unit area are line symmetric about the side serving as an axis of symmetry.
4. The imaging device according to claim 1 , wherein
an angle θ 1 that is a half width at half maximum of a strength of the sub-terahertz wave in the diffuse reflection by the reflector is at least a value obtained using the following formula:
[
Math
.
1
]
tan
-
1
(
a
2
b
)
where a denotes a width of an imaging range of the measurement target and b denotes a distance between the emission surface and the measurement target.
5. The imaging device according to claim 1 , wherein
an angle θ 2 that is a half width at half maximum in a distribution of inclination angles of bumps on the reflection surface is at least a value obtained using the following formula:
[
Math
.
2
]
1
2
×
tan
-
1
(
a
2
b
)
where a denotes a width of an imaging range of the measurement target and b denotes a distance between the emission surface and the measurement target.
6. An imaging device comprising:
an area light source including an emission surface from which a sub-terahertz wave is emitted to a measurement target; and
a detector including an image sensor that receives a reflected wave generated by the measurement target reflecting the sub-terahertz wave emitted from the emission surface, and an optical system that forms an image on the image sensor by an optical focus of the reflected wave,
wherein the area light source includes:
at least one point light source that emits a sub-terahertz wave; and
a reflector that diffusely reflects the sub-terahertz wave emitted from the at least one point light source, to generate a sub-terahertz wave to be emitted from the emission surface, the reflector including a reflection surface that is a bumpy surface whose roughness curve element mean length RSm is at least 0.3 mm, wherein
when Φ denotes an entrance pupil diameter of the optical system, b denotes a distance between the emission surface and the measurement target, c denotes a distance between the measurement target and the optical system, and λ denotes a wavelength of the sub-terahertz wave emitted from the at least one point light source:
the reflection surface includes one or more unit areas each of which has a bumpy surface including at least two frequency components in a frequency range of at most (Φ×b/c)/Ξ in a spatial frequency range.
7. The imaging device according to claim 6 , wherein
a width of each of the one or more unit areas is at least Φ×b/c; and
the roughness curve element mean length RSm is less than 2×Φ×b/c.
8. The imaging device according to claim 6 , wherein:
the one or more unit areas include a first unit area and a second unit area;
the first unit area and the second unit area are in contact with each other at a side shared between the first unit area and the second unit area; and
a geometry of a bumpy surface of the first unit area and a geometry of a bumpy surface of the second unit area are line symmetric about the side serving as an axis of symmetry.
9. The imaging device according to claim 6 , wherein
an angle θ 1 that is a half width at half maximum of a strength of the sub-terahertz wave in the diffuse reflection by the reflector is at least a value obtained using the following formula:
tan
-
1
(
a
2
b
)
[
Math
.
3
]
where a denotes a width of an imaging range of the measurement target.
10. The imaging device according to claim 6 , wherein
an angle θ 2 that is a half width at half maximum in a distribution of inclination angles of bumps on the reflection surface is at least a value obtained using the following formula:
1
2
×
tan
-
1
(
a
2
b
)
[
Math
.
4
]
where a denotes a width of an imaging range of the measurement target.