IP Library Granted Patent US 12,260,330
Granted Patent B2
US 12,260,330 · App. 17/640,926 · Granted Mar 25, 2025

Learning apparatus, learning method, inference apparatus, inference method, and recording medium

Inventors: Azusa Sawada (Tokyo, JP); Soma Shiraishi (Tokyo, JP); Takashi Shibata (Tokyo, JP)
Assignee: NEC CORPORATION
G06N3/08G06V10/771G06V10/7715G06V10/82
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,260,330
App. No.
17/640,926
Granted
Mar 25, 2025
Kind
B2
Abstract

A learning apparatus includes a metric space learning unit and a case example storage unit. The metric space learning unit learns a metric space including feature vectors extracted from sets of attribute-attached image data for each combination of different attributes by using the sets of attribute-attached image data to which pieces of attribute information are added. The case example storage unit calculates feature vectors from sets of case example image data, and stores the feature vectors as case examples associated with the metric space.

Claims (38)

1. A system comprising a learning apparatus and an inference apparatus for using outputs from the learning apparatus,

wherein the learning apparatus comprises:

a first memory storing first instructions; and

one or more first processors configured to execute the first instructions to:

learn, for each of a plurality of combinations of different attributes, a metric space including feature vectors which are extracted from sets of attribute-attached image data to which pieces of attribute information are respectively added, by using the sets of attribute-attached image data, such that a plurality of the metric spaces are learned for the plurality of combinations of different attributes; and

calculate, for each combination of different attributes, feature vectors from sets of case example image data and store the calculated feature vectors as case examples associated with the metric space in the first memory, and

wherein the inference apparatus comprises:

a second memory storing second instructions; and

one or more second processors configured to execute the second instructions to:

store, in the second memory and for each combination of different attributes, the feature vectors of the sets of case example image data as the case examples in association with the metric space learned for each combination of different attributes;

select one metric space by evaluating the plurality of metric spaces using a feature vector of selection image data;

recognize inference image data based on feature vectors extracted from the inference image data and the case examples associated with the one metric space; and

output a recognition result.

2. The system according to claim 1 , wherein the second processor identifies selection image data of an existing class by using each of the plurality of metric spaces and determines the one metric space having a highest degree of matching with respect to a training label for the selection image data of the existing class.

3. The system according to claim 1 , wherein the second processor determines, as the recognition result, a class of the case example closest to the feature vectors of the inference image data in the one metric space among the case examples stored in the second memory.

4. The system according to claim 3 , wherein the second processor outputs, as an inference result, a training label, additional information, and image data of the closest case example, in addition to outputting the recognition result.

5. The system according to claim 1 , wherein the second processor is further configured to perturb the inference image data, and

the second processor recognizes the inference image data using feature vectors of the perturbed inference image data.

6. The system according to claim 1 , wherein the second processor is further configured to perturb the feature vectors of the inference image data, and

the second processor recognizes the inference image data using the perturbed feature vectors.

7. A method performed by a system comprising a learning apparatus and an inference apparatus for using outputs from the learning apparatus, the method comprising:

by the learning apparatus:

learning, for each of a plurality of combinations of different attributes, a metric space including feature vectors which are extracted from sets of attribute-attached image data to which pieces of attribute information are respectively added, by using the sets of attribute-attached image data, such that a plurality of the metric spaces are learned for the plurality of combinations of different attributes; and

calculating, for each combination of different attributes, feature vectors from sets of case example image data and store the calculated feature vectors as case examples associated with the metric space in a first memory of the learning apparatus, and

by the inference apparatus:

storing, in a second memory of the inference apparatus and for each combination of different attributes, the feature vectors of the sets of case example image data as the case examples in association with the metric space learned for each combination of different attributes;

selecting one metric space by evaluating the plurality of metric spaces using a feature vector of selection image data;

recognizing inference image data based on feature vectors extracted from the inference image data and the case examples associated with the one metric space; and

outputting a recognition result.

8. A non-transitory computer-readable recording medium storing a program executable by a system to perform processing, the system comprising a learning apparatus and an inference apparatus for using outputs from the learning apparatus, the processing comprising:

by the learning apparatus:

learning, for each of a plurality of combinations of different attributes, a metric space including feature vectors which are extracted from sets of attribute-attached image data to which pieces of attribute information are respectively added, by using the sets of attribute-attached image data, such that a plurality of the metric spaces are learned for the plurality of combinations of different attributes; and

calculating, for each combination of different attributes, feature vectors from sets of case example image data and store the calculated feature vectors as case examples associated with the metric space in a first memory of the learning apparatus, and

by the inference apparatus:

storing, in a second memory of the inference apparatus and for each combination of different attributes, the feature vectors of the sets of case example image data as the case examples in association with the metric space learned for each combination of different attributes;

selecting one metric space by evaluating the plurality of metric spaces using a feature vector of selection image data;

recognizing inference image data based on feature vectors extracted from the inference image data and the case examples associated with the one metric space; and

outputting a recognition result.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 17, 2022
From: SAWADA, AZUSA; SHIRAISHI, SOMA; SHIBATA, TAKASHI
To: NEC CORPORATION
Reel/Frame 061810/0594 →
Continuity (1)
Related Publication 20220335291A1 · Oct 20, 2022
References Cited (15)
US 20100142821A1 · Hosoi · 2010 [cited by applicant]
US 20170206465A1 · Jin · 2017 [cited by examiner]
US 20240112447A1 · Sawada · 2024 [cited by examiner]
CN 106803063A · 2017 [cited by examiner]
JP 2011039831A · 2011 [cited by examiner]
WO 2008126790A1 · 2008 [cited by applicant]
U.S. Appl. No. 17/768,597, filed Apr. 4, 2024, Sawada; Azusa. [cited by examiner]
International Search Report for PCT Application No. PCT/JP2019/037007, mailed on Dec. 10, 2019. [cited by applicant]
Karen Simonyan et al., “Very Deep Convolutional Networks for Large-Scale Image Recognition”, Published as a conference paper at ICLR 2015, pp. 1-14. [cited by applicant]
Matsukawa et al., “Person Re-Identification Using CNN Features Learned from Combination of Attributes”, Proceedings of the 2016 23rd International Conference on Pattern Recognition (ICPR) , Dec. 8, 2016, pp. 2428-2433. [cited by applicant]
Lampert, C. H. et al., “Learning to Detect Unseen Object Classes by Between-Class Attribute Transfer”, Proceedings of the 2009 IEEE Conference on Computer Vision and Pattern Recognition, Jun. 25, 2009, pp. 951-958. [cited by applicant]
JP Office Action for JP Application No. 2021-546155, mailed on Jul. 25, 2023 with English Translation. [cited by applicant]
Nakano et al,“Co-occurrence Attributes of Physical and Adhered Human Characteristics to Improve Person Re identification”, Jan. 1, 2017, vol. J100-D and No. 1, pp. 104-114., SSN: A 1881-0225, Japan. [cited by applicant]
Sakurai et al,“A Speed-up Method of the Contrastive Loss for Deep Metric Learning”, the 31st time of Japanese Society for Artificial Intelligence nationalconference collected papers [DVD-ROM], Session-ID: 3Q1-12inch1, M… [cited by applicant]
Ueda et al,“A Study on Nearest Neighbor Classifier Using Adaptive Distance Learning”, FIT2011 10th Information Science and Technology Forum Proceedings, vol. 2, Information Processing Society of Japan, Aug. 22, 2011, No… [cited by applicant]
Cited By (1)
US 12,561,969