IP Library › Granted Patent US 12,261,577
Granted Patent B2
US 12,261,577 · App. 17/356,424 · Granted Mar 25, 2025

Amplifier peak detection

Inventors: Jeremy Goldblatt (Encinitas, CA); Arul Balasubramaniyan (Plano, TX); Chinmaya Mishra (San Diego, CA); Damin Cao (San Diego, CA); Bhushan Shanti Asuri (San Diego, CA)
Assignee: QUALCOMM Incorporated
H03F3/245G01R19/04H03F1/0238H03F3/195H03G3/3042H04B1/0475H03F2200/435H03F2200/451H03F2200/474H04B2001/0416
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Quick Facts
Patent No.
US 12,261,577
App. No.
17/356,424
Granted
Mar 25, 2025
Kind
B2
Abstract

A peak detector for a power amplifier is provided that includes a threshold voltage detector configured to pulse a detection current in response to an amplified output signal from the amplifier exceeding a peak threshold. A plurality of such peak detectors may be integrated with a corresponding plurality of power amplifiers in a transmitter. Should any peak detector assert an alarm signal or more than a threshold number of alarm signals during a given period, a controller reduces a gain for the plurality of power amplifiers.

Claims (72)

1. A peak detector, comprising:

a voltage divider configured to divide an amplifier output signal into a divided signal;

a threshold voltage detector configured to conduct a detection current in response to the divided signal being greater than a threshold voltage;

a current mirror configured to mirror the detection current into a mirrored current and configured to drive the mirrored current into a node; and

at least one inverter configured to invert a voltage of the node to produce a binary output signal,

wherein the threshold voltage detector comprises

a first transistor having a gate configured to be driven by the divided signal,

a source bias circuit configured to bias a source of the first transistor,

a gate bias circuit configured to bias a gate of the first transistor, and

a drain bias circuit configured to bias a drain of the first transistor,

wherein the source bias circuit comprises:

a first current source configured to drive a resistor with a first current to develop a source bias voltage at a terminal of the resistor,

a second transistor;

a second current source configured to drive a second current into a drain of the second transistor; and

a differential amplifier having a first input coupled to the terminal of the resistor, a second input coupled to the source of the first transistor; and an output coupled to a gate of the second transistor, wherein the differential amplifier and the second transistor are configured to form a feedback loop to bias the source of the first transistor with the source bias voltage.

2. The peak detector of claim 1 , further comprising:

a counter configured to count binary transitions in the binary output signal to form a count and configured to assert a peak detector alarm signal in response to the count exceeding a peak detection threshold count.

3. The peak detector of claim 2 , wherein the counter is a ripple counter.

4. The peak detector of claim 2 , further comprising:

a controller configured to command the amplifier to reduce a gain in response to an assertion of the peak detector alarm signal.

5. The peak detector of claim 1 , wherein the first transistor is an n-type-metal-oxide-semiconductor (NMOS) transistor, and the second transistor is a p-type-metal-oxide-semiconductor (PMOS) transistor.

6. The peak detector of claim 1 , wherein the first current source is a variable current source.

7. The peak detector of claim 1 , wherein the first transistor comprises an NMOS transistor configured to conduct the detection current, and wherein the current mirror comprises a diode-connected first PMOS transistor having a gate connected to a gate of a second PMOS transistor.

8. The peak detector of claim 7 , wherein a drain of the second PMOS transistor is coupled to the node.

9. The peak detector of claim 1 , wherein the at least one inverter comprises a pair of inverters.

10. A peak detector, comprising:

a voltage divider configured to divide an amplifier output signal into a divided signal;

a threshold voltage detector configured to conduct a detection current in response to the divided signal being greater than a threshold voltage;

a current mirror configured to mirror the detection current into a mirrored current and configured to drive the mirrored current into a node; and

at least one inverter configured to invert a voltage of the node to produce a binary output signal,

wherein the threshold voltage detector comprises

a first transistor having a gate configured to be driven by the divided signal,

a source bias circuit configured to bias a source of the first transistor,

a gate bias circuit configured to bias a gate of the first transistor, and

a drain bias circuit configured to bias a drain of the first transistor,

wherein the gate bias circuit comprises:

a first current source configured to drive a first resistor with a first current to develop a bias voltage at a terminal of the first resistor;

a second transistor;

a second current source configured to drive a second current into a drain of the second transistor; and

a differential amplifier having a first input coupled to the terminal of the first resistor, a second input coupled to the drain of the second transistor; and an output coupled to a gate of the second transistor, wherein the differential amplifier and the second transistor are configured to form a feedback loop to bias the gate of the first transistor with a gate bias voltage equal to the bias voltage at the terminal of the first resistor.

11. The peak detector of claim 10 , further comprising:

a counter configured to count binary transitions in the binary output signal to form a count and configured to assert a peak detector alarm signal in response to the count exceeding a peak detection threshold count.

12. The peak detector of claim 11 , wherein the counter is a ripple counter.

13. The peak detector of claim 11 , further comprising:

a controller configured to command the amplifier to reduce a gain in response to an assertion of the peak detector alarm signal.

14. The peak detector of claim 10 , wherein the gate bias circuit further comprises a second resistor coupled between the gate of the first transistor and the gate of the second transistor.

15. The peak detector of claim 10 , wherein the first transistor comprises an NMOS transistor configured to conduct the detection current, and wherein the current mirror comprises a diode-connected first PMOS transistor having a gate connected to a gate of a second PMOS transistor.

16. The peak detector of claim 15 , wherein a drain of the second PMOS transistor is coupled to the node.

17. The peak detector of claim 10 , wherein the at least one inverter comprises a pair of inverters.

18. A peak detector, comprising:

a voltage divider configured to divide an amplifier output signal into a divided signal;

a threshold voltage detector configured to conduct a detection current in response to the divided signal being greater than a threshold voltage;

a current mirror configured to mirror the detection current into a mirrored current and configured to drive the mirrored current into a node; and

at least one inverter configured to invert a voltage of the node to produce a binary output signal,

wherein the threshold voltage detector comprises

a first transistor having a gate configured to be driven by the divided signal,

a source bias circuit configured to bias a source of the first transistor,

a gate bias circuit configured to bias a gate of the first transistor, and

a drain bias circuit configured to bias a drain of the first transistor,

wherein the drain bias circuit comprises:

a first current source configured to drive a resistor with a first current to develop a drain bias voltage at a terminal of the resistor,

a second transistor having a source coupled to a drain of the first transistor;

a second current source configured to drive a second current into ground from the source of the second transistor; and

a differential amplifier having a first input coupled to the terminal of the resistor, a second input coupled to the drain of the first transistor; and an output coupled to a gate of the second transistor, wherein the differential amplifier and the second transistor are configured to form a feedback loop to bias the drain of the first transistor with the drain bias voltage.

19. The peak detector of claim 18 , further comprising:

a counter configured to count binary transitions in the binary output signal to form a count and configured to assert a peak detector alarm signal in response to the count exceeding a peak detection threshold count.

20. The peak detector of claim 19 , wherein the counter is a ripple counter.

21. The peak detector of claim 19 , further comprising:

a controller configured to command the amplifier to reduce a gain in response to an assertion of the peak detector alarm signal.

22. The peak detector of claim 18 , wherein the first transistor comprises an NMOS transistor configured to conduct the detection current, and wherein the current mirror comprises a diode-connected first PMOS transistor having a gate connected to a gate of a second PMOS transistor.

23. The peak detector of claim 22 , wherein a drain of the second PMOS transistor is coupled to the node.

24. The peak detector of claim 18 , wherein the at least one inverter comprises a pair of inverters.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 27, 2021
From: GOLDBLATT, JEREMY; BALASUBRAMANIYAN, ARUL; MISHRA, CHINMAYA; CAO, DAMIN; ASURI, BHUSHAN SHANTI
To: QUALCOMM INCORPORATED
Reel/Frame 056995/0062 →
Continuity (1)
Related Publication 20220416737A1 · Dec 29, 2022
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