IP Library › Granted Patent US 12,276,037
Granted Patent B2
US 12,276,037 · App. 17/169,593 · Granted Apr 15, 2025

Anodized titanium material and method for producing the same

Inventors: Takehiko Muranaka (Yamaguchi, JP); Kouji Niimi (Yamaguchi, JP); Yuuta Ueno (Yamaguchi, JP); Hikaru Kikuchi (Miyagi, JP); Hideto Saito (Miyagi, JP); Nobuyuki Nagayama (Miyagi, JP)
Assignees: YAMAGUCHI PREFECTURAL INDUSTRIAL TECHNOLOGY INSTITUTE; SANWA INDUSTRY CO., LTD.; TOKYO ELECTRON LIMITED
C25D11/26B32B15/01H01J37/3244H01J37/32715H01L21/67069H01L21/67103H01L21/6833H01J2237/002H01J2237/2007H01J2237/334
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Quick Facts
Patent No.
US 12,276,037
App. No.
17/169,593
Granted
Apr 15, 2025
Kind
B2
Abstract

An anodized titanium material includes a titanium base material and an anodized titanium layer. The anodized titanium layer is provided on a surface of the titanium base material. The anodized titanium layer includes a porous first anodized titanium layer. The anodized titanium layer has a withstand voltage at 25° C. of 500 V or more, a Vickers hardness of 200 or more, a film thickness of 20 μm or more and less than 80 μm, an arithmetic average roughness Ra of a surface of less than 1.6 μm, and a maximum height roughness Rz of the surface is less than 6.3 μm. In both of a section perpendicular to a thickness direction of the first anodized titanium oxide layer and the surface, no pore sections having a shape capable of including a circle having a diameter of 0.5 μm or more are observed.

Claims (29)

1. An anodized titanium material comprising:

a titanium base material; and

an anodized titanium layer provided on a surface of the titanium base material, wherein

the anodized titanium layer comprises

a porous first anodized titanium layer;

the anodized titanium layer has a withstand voltage at 25° C. of 500 V or more, a Vickers hardness of 200 or more, a film thickness of 20 μm or more and less than 80 μm, an arithmetic average roughness Ra of a surface of less than 1.6 μm, and a maximum height roughness Rz of the surface is less than 6.3 μm;

in a section perpendicular to a thickness direction of the first anodized titanium layer and in the surface of the first anodized titanium layer, no pore sections having a shape capable of including a circle having a diameter of 0.5 μm or more are observed; and

the first anodized titanium layer comprises a plurality of tubular pores extending in a direction intersecting the surface of the anodized titanium layer,

wherein the anodized titanium layer further comprises

a second anodized titanium layer provided between the titanium base material and the first anodized titanium layer; and

a fluorine content (unit: atomic %) in the second anodized titanium layer is lower than a fluorine content (unit: atomic %) in the first anodized titanium layer.

2. The anodized titanium material according to claim 1 , wherein the anodized titanium layer has a withstand voltage at 150° C. higher than a withstand voltage at 25° C.

3. The anodized titanium material according to claim 1 , further comprising a metal base material made of a metal other than titanium, wherein

the titanium base material is provided on a surface of the metal base material.

4. The anodized titanium material according to claim 1 , wherein the anodized titanium material is used as a vacuum apparatus member and the anodized titanium layer is exposed to a plasma atmosphere.

5. An electrostatic chuck used in a plasma etching apparatus, the electrostatic chuck comprising:

the anodized titanium material according to claim 1 , wherein

the anodized titanium layer is provided on an outermost surface of the electrostatic chuck and exposed to a plasma atmosphere.

6. A cooling plate used in a plasma etching apparatus, the cooling plate comprising:

the anodized titanium material according to claim 1 ; and

a refrigerant channel provided in an internal part of the cooling plate and allowing a refrigerant to flow, wherein

the anodized titanium layer is provided on an outermost surface of the cooling plate.

7. A shower head used in a plasma etching apparatus, the shower head comprising:

a wall member comprising the anodized titanium material according to claim 1 and defining an internal space, wherein

the wall member comprises at least a bottom surface;

the wall member comprises

a gas introduction port for flowing a processing gas for plasma etching into the internal space, and

a plurality of gas discharge holes provided on the bottom surface and allowing the processing gas to flow out of the internal space; and

the anodized titanium layer is exposed at least at inner peripheral surfaces of the gas discharge holes.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 15, 2025
From: SHIMONOSEKI MEKKI CO., LTD.
To: SANWA INDUSTRY CO., LTD.
Reel/Frame 069882/0991 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 8, 2021
From: MURANAKA, TAKEHIKO; NIIMI, KOUJI; UENO, YUUTA; KIKUCHI, HIKARU; SAITO, HIDETO; NAGAYAMA, NOBUYUKI
To: YAMAGUCHI PREFECTURAL INDUSTRIAL TECHNOLOGY INSTITUTE; SHIMONOSEKI MEKKI CO., LTD.; TOKYO ELECTRON LIMITED
Reel/Frame 056463/0933 →
Priority Claims (1)
JP 2018-151769 · Aug 10, 2018 · national
Continuity (2)
Continuation PCTJP2019031334 · Aug 8, 2019
Related Publication 20210207283A1 · Jul 8, 2021
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