Particle detection via scattered light combined with incident light
Particle detection systems and methods are disclosed. In one embodiment, a particle detection system comprises an incident beam light source that emits an incident beam, a particle interrogation zone disposed in the path of the incident beam, a photodetector disposed to detect the incident beam after passing through the particle interrogation zone, a pump beam light source for emitting a pump beam, the pump beam being targeted at the particle interrogation zone, wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of light from the incident beam, scattered light due to incident beam scattering in the particle interrogation zone, and scattered light due to pump beam scattering in the particle interrogation zone.
1. A particle detection system comprising:
a light source providing beam of light, wherein the light source comprises a laser;
a half wave plate disposed in the path of the beam;
a beam splitter that splits the beam from the laser into an incident beam and a pump beam;
a particle interrogation zone disposed in the path of the incident beam;
a photodetector disposed to detect the incident beam after exiting the particle interrogation zone;
wherein the pump beam is directed to the particle interrogation zone along a different optical path than that of the incident beam, such that unscattered light from the pump beam is not incident on the photodetector;
a first objective that focuses the incident beam to a first waist radius in the particle interrogation zone;
a second objective that focuses the pump beam in the particle interrogation zone to a second waist radius in the particle interrogation zone;
wherein the second waist radius is at least 1.5 times larger than the first waist radius in the particle interrogation zone;
wherein the pump beam has an irradiance ratio of at least 2, wherein the irradiance ratio is defined as the ratio of the irradiance of the pump beam at its waist to the irradiance of the incident beam at its waist;
a collection optic for collecting a combination of:
unscattered light from the incident beam after exiting the particle interrogation zone;
scattered light due to incident beam scattering via a particle in the particle interrogation zone; and
scattered light due to pump beam scattering via the particle;
wherein, when exiting the collection optic, the collected scattered light from the incident beam and the pump beam is coherent and parallel to the collected unscattered light from the incident beam;
wherein the incident beam, the pump beam, and photodetector are arranged such that the photodetector is configured to detect a combination of:
the unscattered light from the incident beam;
the scattered light due to incident beam scattering from the particles in the fluid flow in the particle interrogation zone; and
the scattered light due to pump beam scattering from the particles in the fluid flow in the particle interrogation zone.
2. The particle detection system of claim 1 , wherein the incident beam intersects the pump beam in the interrogation zone.
3. The particle detection system of claim 1 , wherein the scattered light due to incident beam scattering in the particle interrogation zone is forward-scattered light.
4. The particle detection system of claim 1 , wherein:
the incident beam is polarized prior to entering the interrogation zone;
the pump beam is polarized prior to entering the interrogation zone; and
the incident beam and the pump beam are configured such that, in the interrogation zone, the incident beam has a polarization axis that is within 5 degrees of a polarization axis of the pump beam.
5. The particle detection system of claim 1 , wherein, at the photodetector, the scattered light due to incident beam scattering, the scattered light due to pump beam scattering, and the light from the incident beam each have a polarization axis that is with 5 degrees of the others.
6. The particle detection system of claim 1 , wherein the photodetector produces a particle detection signal due to scattering in the particle interrogation zone, and wherein the signal corresponds to the total irradiance of:
(i) the light from the incident beam
(ii) the scattered light due to the incident beam; and
(iii) the scattered light due to the pump beam.
7. The particle detection system of claim 1 , wherein the pump beam intersects the particle interrogation zone at an oblique angle to the incident beam.
8. The particle detection system of claim 1 , wherein the pump beam intersects the particle interrogation zone at an orthogonal angle to the incident beam.
9. The particle detection system of claim 1 , wherein the pump beam intersects the particle interrogation zone in the opposite direction as the incident beam.
10. The particle detection system of claim 1 , wherein the pump beam and incident beam are directed in parallel though a positive lens which focuses the beams to a shared focal point at the particle interrogation zone.
11. The particle detection system of claim 1 , wherein the particle interrogation zone is a flow cell.
12. The particle detection system of claim 1 , wherein the particle interrogation zone is an aerosol jet.
13. The particle detection system of claim 1 , wherein the particle interrogation zone is a surface.
14. The particle detection system of claim 1 , wherein the pump beam is a dual-pass beam.
15. The system of claim 1 , wherein the particle has an effective diameter less than 100 nm.
16. A method of particle detection comprising:
producing a beam of light via a laser;
passing the beam of light through a half wave plate;
splitting the beam into an incident beam and a pump beam via a beam splitter;
directing the incident beam to a particle interrogation zone and onto a photodetector;
directing the pump beam to the particle interrogation zone along a different optical path than that of the incident beam, such that unscattered light from the pump beam is not incident on the photodetector;
passing the incident beam through a first objective that focuses the incident beam to a first waist radius in the particle interrogation zone;
passing the pump beam through a second objective that focuses the pump beam to a second waist radius in the particle interrogation zone;
wherein the second waist radius is at least 1.5 times larger than the first waist radius in the particle interrogation zone;
wherein the pump beam has an irradiance ratio of at least 2, wherein the irradiance ratio is defined as the ratio of the irradiance of the pump beam at its waist to the irradiance of the incident beam at its waist;
generating scattered light by interaction of the incident beam with a particle in the particle interrogation zone;
generating scattered light by interaction of the pump beam with the particle;
collecting, via a collection optic, a combination of:
unscattered light from the incident beam after exiting the particle interrogation zone;
scattered light due to incident beam scattering via a particle in the particle interrogation zone; and
scattered light due to pump beam scattering via the particle;
wherein, when exiting the collection optic, the collected scattered light from the incident beam and the pump beam is coherent and parallel to the collected unscattered light from the incident beam;
detecting, via the photodetector, the combination of:
the unscattered light from the incident beam;
the scattered light from the incident beam; and
the scattered light from the pump beam.
17. The method of claim 16 comprising producing a particle detection signal via the photodetector, wherein the signal corresponds to the intensity of the light from the incident beam combined with the scattered light from the incident beam and scattered light from the pump beam; and wherein a particle is detected when the signal exceeds a threshold value.
18. The method of claim 16 , wherein said incident beam and said pump beam are configured to simultaneously interact with said particles in said fluid flow.
19. The method of claim 16 , wherein said scattered light is generated by interaction of said incident beam and said pump beam with a single particle in said fluid flow.
20. The method of claim 16 , wherein the particle has an effective diameter less than 100 nm.