IP Library › Granted Patent US 12,298,495
Granted Patent B2
US 12,298,495 · App. 17/374,148 · Granted May 13, 2025

Optical scanning apparatus

Inventors: Hidemasa Suzuki (Kariya, JP); Kunihiko Hayashi (Kariya, JP)
Assignee: DENSO CORPORATION
G02B26/105G01S7/4817G02B26/0816G01S7/4811G01S17/08
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,298,495
App. No.
17/374,148
Granted
May 13, 2025
Kind
B2
Abstract

In an optical scanning apparatus, a light-emitting unit emits light waves. A light-receiving unit receives reflected light of the light waves. A transmissive member transmits the light waves and the reflected light of the light waves. A reflection mirror is arranged further toward the light-emitting unit side and light-receiving unit side than the transmissive member is, includes a reflection surface that rotates, and deflects at least either of the light waves and the reflected light using the reflection surface. The reflection mirror includes a low reflection region on the transmissive member side. The low reflection region has a reflectance of the light waves on the reflection surface that is set to be lower than a reflectance of the light waves on the other region other than the low reflection region, in a state in which the reflection surface is facing the light-emitting unit side or the light-receiving unit side.

Claims (59)

1. An optical scanning apparatus that scans light waves, comprising:

a light-emitting unit that is configured to emit light waves;

a light-receiving unit that is configured to receive reflected light of the light waves;

a transmissive member that is configured to transmit the light waves and the reflected light of the light waves; and

at least one reflection mirror that is arranged further toward a light-emitting unit side and a light-receiving unit side than the transmissive member is, the at least one reflection mirror including at least one reflection surface that rotates, and deflecting at least either of the light waves and the reflected light using the reflection surface, wherein

the at least one reflection mirror includes a low reflection region on the transmissive member side of the reflection surface, the low reflection region having a reflectance of the light waves on the reflection surface that is set to be lower than a reflectance of the light waves on an other region other than the low reflection region of the reflection surface, in a state in which the reflection surface is facing the light-emitting unit side, the low reflection region and the other region being on the same reflection surface, wherein

the low reflection region has a greater reflectance as an angle of incidence of incident light increases.

2. The optical scanning apparatus according to claim 1 , wherein:

a dielectric film is further provided in at least the low reflection region.

3. The optical scanning apparatus according to claim 2 , wherein:

the low reflection region further includes a metal film.

4. The optical scanning apparatus according to claim 3 , wherein:

the at least one reflection mirror is configured to deflect at least the light waves emitted from the light-emitting unit.

5. The optical scanning apparatus according to claim 4 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

6. The optical scanning apparatus according to claim 3 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

7. The optical scanning apparatus according to claim 2 , wherein:

the at least one reflection mirror is configured to deflect at least the light waves emitted from the light-emitting unit.

8. The optical scanning apparatus according to claim 7 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

9. The optical scanning apparatus according to claim 2 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

10. The optical scanning apparatus according to claim 1 , wherein:

the at least one reflection mirror is configured to deflect at least the light waves emitted from the light-emitting unit.

11. The optical scanning apparatus according to claim 10 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

12. The optical scanning apparatus according to claim 1 , wherein:

the at least one reflection mirror is configured to deflect at least the light waves emitted from the light-emitting unit.

13. The optical scanning apparatus according to claim 12 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

14. The optical scanning apparatus according to claim 1 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

15. The optical scanning apparatus according to claim 1 , wherein:

the at least one reflection mirror comprises a first reflection mirror and a second reflection mirror;

the first reflection mirror is configured to deflect the light waves emitted from the light-emitting unit;

the second reflection mirror is configured to deflect the reflected light received by the light-receiving unit; and

the reflectance in the low reflection region of the second reflection mirror is set to be higher than the reflectance in the low reflection region of the first reflection mirror.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 6, 2021
From: SUZUKI, HIDEMASA; HAYASHI, KUNIHIKO
To: DENSO CORPORATION
Reel/Frame 057105/0313 →
Priority Claims (1)
JP 2019-004373 · Jan 15, 2019 · national
Continuity (2)
Continuation PCTJP2020000725 · Jan 10, 2020
Related Publication 20210341730A1 · Nov 4, 2021
References Cited (10)
US 20050254101A1 · Chen · 2005 [cited by examiner]
US 20150055203A1 · Maruyama · 2015 [cited by examiner]
US 20160011311A1 · Mushimoto et al. · 2016 [cited by applicant]
US 20210396874A1 · Uchimura · 2021 [cited by examiner]
US 20240305892A1 · Bleads · 2024 [cited by examiner]
JP 61102620A · 1986 [cited by applicant]
JP H11264952A · 1999 [cited by examiner]
JP 2001012943A · 2001 [cited by examiner]
JP 2010145486A · 2010 [cited by applicant]
JP 201620831A · 2016 [cited by applicant]