IP Library › Granted Patent US 12,301,134
Granted Patent B2
US 12,301,134 · App. 18/095,399 · Granted May 13, 2025

Inverter-based comparator

Inventors: Philex Ming-Yan Fan (Tainan, TW); Yi-Fu Chen (Tainan, TW); Bo-Rui Chen (Tainan, TW)
Assignees: NCKU Research and Development Foundation; Himax Technologies Limited
H02M7/53873H02M1/0032H03K5/24H03K5/2472H02M1/0048
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Quick Facts
Patent No.
US 12,301,134
App. No.
18/095,399
Granted
May 13, 2025
Kind
B2
Abstract

An inverter-based comparator, powered between a first supply voltage and a second supply voltage being lower than the first supply voltage, includes a first inverter branch composed of at least one first P-type transistor and at least one first N-type transistor; and a second inverter branch composed of at least one second P-type transistor, at least one second N-type transistor and at least two tuning switches. The first inverter branch and the second inverter branch are configured to compare an input voltage with an internal trigger point, thereby generating a compare voltage at an interconnected node. One of the at least two tuning switches is controlled to isolate the first supply voltage and another is controlled to isolate the second supply voltage to compensate for trigger point shifting.

Claims (23)

1. An inverter-based comparator powered between a first supply voltage and a second supply voltage being lower than the first supply voltage, comprising:

a first inverter branch composed of at least one first P-type transistor and at least one first N-type transistor; and

a second inverter branch composed of at least one second P-type transistor, at least one second N-type transistor and at least two tuning switches;

wherein the first inverter branch and the second inverter branch are configured to compare an input voltage with an internal trigger point, thereby generating a compare voltage at an interconnected node; and

one of the at least two tuning switches is controlled to isolate the first supply voltage and another is controlled to isolate the second supply voltage to compensate for trigger point shifting;

wherein the at least one first P-type transistor comprises series-connected first P-type transistors, the at least one first N-type transistor comprises series-connected first N-type transistors, the at least one second P-type transistor comprises series-connected second P-type transistors, or the at least one second N-type transistor comprises series-connected second N-type transistors.

2. The inverter-based comparator of claim 1 , wherein the second inverter branch is coupled to receive at least one tuning signal for controlling the at least two tuning switches.

3. The inverter-based comparator of claim 1 , wherein the at least one first P-type transistor and the at least one first N-type transistor are electrically connected in series in an order from the first supply voltage to the second supply voltage, gates of the at least one first P-type transistor and the at least one first N-type transistor are coupled to the input voltage, and the interconnected node electrically coupled between the at least one first P-type transistor and the at least one first N-type transistor provides the compare voltage.

4. The inverter-based comparator of claim 1 , wherein the at least one second P-type transistor and the at least one second N-type transistor are electrically connected in series in the order from the first supply voltage to the second supply voltage, gates of the at least one second P-type transistor and the at least one second N-type transistor are coupled to the input voltage, and the at least one second P-type transistor and the at least one second N-type transistor are electrically coupled at the interconnected node.

5. The inverter-based comparator of claim 1 , wherein the at least two tuning switches comprise:

a top switch connected between the first supply voltage and the at least one second P-type transistor or between the interconnected node and the at least one second P-type transistor; and

a bottom switch connected between the second supply voltage and the at least one second N-type transistor or between the interconnected node and the at least one second N-type transistor.

6. The inverter-based comparator of claim 1 , further comprising:

an output stage circuit coupled to receive the compare voltage and configured to ensure a state for the compare voltage, thereby generating an output voltage at an output node.

7. The inverter-based comparator of claim 6 , wherein the output stage circuit comprises a resistor, a P-type transistor and an N-type transistor, which are connected in series in an order from the first supply voltage to the second supply voltage, with a gate of the P-type transistor coupled to the second supply voltage, a gate of the N-type transistor coupled to the compare voltage, and drains of the P-type transistor and the N-type transistor connected at the output node.

8. An inverter-based comparator powered between a first supply voltage and a second supply voltage being lower than the first supply voltage, comprising:

a first inverter branch composed of at least one first P-type transistor and at least one first N-type transistor; and

a second inverter branch composed of at least one second P-type transistor, at least one second N-type transistor and at least two tuning switches;

wherein the first inverter branch and the second inverter branch are configured to compare an input voltage with an internal trigger point, thereby generating a compare voltage at an interconnected node; and

one of the at least two tuning switches is controlled to isolate the first supply voltage and another is controlled to isolate the second supply voltage to compensate for trigger point shifting;

wherein the at least two tuning switches comprise:

two top switches respectively connected between the first supply voltage and the at least one second P-type transistor and between the interconnected node and the at least one second P-type transistor; and

two bottom switches respectively connected between the second supply voltage and the at least one second N-type transistor and between the interconnected node and the at least one second N-type transistor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 10, 2023
From: FAN, PHILEX MING-YAN; CHEN, YI-FU; CHEN, BO-RUI
To: NCKU RESEARCH AND DEVELOPMENT FOUNDATION; HIMAX TECHNOLOGIES LIMITED
Reel/Frame 062351/0612 →
Continuity (1)
Related Publication 20240235426A1 · Jul 11, 2024
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