IP Library › Granted Patent US 12,301,245
Granted Patent B2
US 12,301,245 · App. 18/114,900 · Granted May 13, 2025

Iterative ADC and DAC calibration

Inventors: Paul T. Hartin (McKinney, TX); Kyle A. Steiner (McKinney, TX); Robert John Casey (Celeste, TX); Andres Lugo (Prosper, TX)
Assignee: Raytheon Company
H03M1/1009
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Quick Facts
Patent No.
US 12,301,245
App. No.
18/114,900
Granted
May 13, 2025
Kind
B2
Abstract

A circuit and method for calibrating ADCs and DACs generates a calibration signal by a DAC; filters spurs from the calibration signal from the DAC to generate a filtered calibration signal; calculates ADC interleave calibration factors to improve performance metrics of the ADC, responsive to the filtered calibration signal; receives the calibration signal from the DAC and calculates DAC interleave calibration factors; generates a calibration signal with improved performance metrics, responsive to the DAC interleave calibration factors received from the ADC; and repeats the process until the performance of the ADC and DAC are within a predetermined range.

Claims (44)

1. A circuit for calibrating analog-to-digital converters (ADCs) and digital-to-analog converters (DACs) comprising:

a DAC configured to generate a calibration signal;

a filter coupled to the DAC and configured to filter spurs from the calibration signal to generate a filtered calibration signal; and

an ADC coupled to the filter and configured to calculate one or more ADC interleave calibration factors responsive to the filtered calibration signal;

wherein the ADC is configured to receive the calibration signal from the DAC and calculate one or more DAC interleave calibration factors;

wherein the DAC is configured to receive the one or more DAC interleave calibration factors from the ADC and to generate a calibration signal with improved performance responsive to the one or more DAC interleave calibration factors; and

wherein the filter, the ADC, and the DAC are configured to iteratively operate until one or more performance metrics are within one or more predetermined ranges.

2. The circuit of claim 1 , wherein the filter is an analog tunable filter.

3. The circuit of claim 1 , wherein the calibration signal is a fixed continuous wave (CW) tone.

4. The circuit of claim 1 , wherein the calibration signal is a non-continuous wave (CW) tone with a frequency range within a bandwidth of the filter.

5. The circuit of claim 1 , wherein the one or more performance metrics include a spur-free dynamic range (SFDR) of the ADC.

6. The circuit of claim 1 , wherein the one or more performance metrics include a spur-free dynamic range (SFDR) of the DAC.

7. The circuit of claim 1 , wherein the one or more ADC interleave calibration factors include DC voltage offset, gain, timing, and bandwidth of the ADC.

8. The circuit of claim 1 , wherein the one or more DAC interleave calibration factors include DC voltage offset, gain, timing, and bandwidth of the DAC.

9. A method for calibrating analog-to-digital converters (ADCs) and digital-to-analog converters (DACs), the method comprising:

generating a calibration signal by a DAC;

filtering spurs from the calibration signal to generate a filtered calibration signal using a filter coupled to the DAC;

calculating one or more ADC interleave calibration factors responsive to the filtered calibration signal using an ADC coupled to the DAC;

receiving the calibration signal from the DAC by the ADC and calculating one or more DAC interleave calibration factors;

receiving the one or more DAC interleave calibration factors at the DAC from the ADC and generating a calibration signal with improved performance using the DAC responsive to the one or more DAC interleave calibration factors; and

repeating the filtering, calculating, receiving, and generating until one or more performance metrics are within one or more predetermined ranges.

10. The method of claim 9 , wherein the filter is an analog tunable filter.

11. The method of claim 9 , wherein the calibration signal is a fixed continuous wave (CW) tone.

12. The method of claim 9 , wherein the calibration signal is a non-continuous wave (CW) tone with a frequency range within a bandwidth of the filter.

13. The method of claim 9 , wherein the one or more performance metrics include a spur-free dynamic range (SFDR) of the ADC.

14. The method of claim 9 , wherein the one or more performance metrics include a spur-free dynamic range (SFDR) of the DAC.

15. The method of claim 9 , wherein the one or more ADC interleave calibration factors include DC voltage offset, gain, timing, and bandwidth of the ADC.

16. The method of claim 9 , wherein the one or more DAC interleave calibration factors include DC voltage offset, gain, timing, and bandwidth of the DAC.

17. A circuit comprising:

a digital-to-analog converter (DAC) configured to generate a calibration signal;

a filter coupled to the DAC and configured to filter spurs from the calibration signal to generate a filtered calibration signal, wherein the filter comprises an analog tunable radio frequency (RF) filter having a passband centered around a calibration tone frequency of the calibration signal; and

an analog-to-digital converter (ADC) coupled to the filter and configured to calculate multiple ADC interleave calibration factors responsive to the filtered calibration signal;

wherein the ADC is coupled to the DAC and is configured to receive the calibration signal and calculate multiple DAC interleave calibration factors;

wherein the DAC is configured to receive the one or more DAC interleave calibration factors and to generate a calibration signal with improved performance responsive to the DAC interleave calibration factors; and

wherein the filter, the ADC, and the DAC are configured to iteratively operate until multiple performance metrics are within specified ranges.

18. The circuit of claim 17 , wherein:

the ADC interleave calibration factors include DC voltage offset, gain, timing, and bandwidth of the ADC; and

the DAC interleave calibration factors include DC voltage offset, gain, timing, and bandwidth of the DAC.

19. The circuit of claim 17 , wherein the multiple performance metrics comprise:

a spur-free dynamic range (SFDR) of the ADC; and

an SFDR of the DAC.

20. The circuit of claim 17 , wherein:

the filter is coupled directly to the DAC; and

the ADC is coupled directly to the filter.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 27, 2023
From: HARTIN, PAUL T.; STEINER, KYLE A.; CASEY, ROBERT JOHN; LUGO, ANDRES
To: RAYTHEON COMPANY
Reel/Frame 062818/0094 →
Continuity (1)
Related Publication 20240291498A1 · Aug 29, 2024
References Cited (15)
US 5594612A · Henrion · 1997 [cited by applicant]
US 7038602B1 · Moore · 2006 [cited by applicant]
US 9281834B1 · Waltari · 2016 [cited by applicant]
US 9356615B1 · Ranjbar · 2016 [cited by examiner]
US 9503116B2 · Speir · 2016 [cited by examiner]
US 9602116B1 · Le · 2017 [cited by examiner]
US 10461764B1 · Paro Filho et al. · 2019 [cited by applicant]
US 11196440B1 · Wang · 2021 [cited by examiner]
US 20110063149A1 · Kidambi · 2011 [cited by applicant]
US 20160365884A1 · Welsh · 2016 [cited by examiner]
EP 3716486A1 · 2020 [cited by applicant]
WO 2022199114A1 · 2022 [cited by applicant]
International Search Report and Written Opinion of the International Searching Authority dated Mar. 14, 2024 in connection with International Patent Application No. PCT/US2023/035823, 15 pages. [cited by applicant]
Zhuang et al., “High-Purity Sine Wave Generation using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing,” IEEE Transactions on Instrumentation and Measurement, vol. 67, Issue 2, Feb. 2018, … [cited by applicant]
Magstadt et al., “Accurate Spectral Testing With Impure Source and Noncoherent Sampling,” IEEE Transactions on Instrumentation and Measurement, vol. 65, Issue 11, Nov. 2016, 10 pages. [cited by applicant]