Employing patterned light to determine relative poses
A system includes devices, each including an illuminator, sensor and processor, where the processor of a given device is configured to: project a pattern of light onto surroundings, while detecting reflections of the pattern of light onto the surroundings, determine shapes of surfaces present in the surroundings and distances of the surfaces from a pose of the given device; obtain pattern information indicative of pattern(s) of light projected by other active illuminator(s) of other device(s), detect reflections of pattern(s) from the pose of the given device; determine a relative pose of other device(s) with respect to the pose of the given device; and send, to a server, surface information indicative of the shapes and the distances of the surfaces from the pose of the given device, along with pose information indicative of the relative pose of the other device(s) with respect to the pose of the given device.
1. A system comprising a plurality of devices, each device comprising an active illuminator, an active sensor and a processor, wherein a processor of a given device is configured to:
control an active illuminator of the given device to project a pattern of light onto surroundings of the given device, whilst controlling an active sensor of the given device to detect reflections of the pattern of light off the surroundings, wherein the reflections are detected from a given pose of the given device;
determine shapes of surfaces present in the surroundings and distances of the surfaces from the given pose of the given device, based on the pattern and its detected reflections;
obtain pattern information indicative of at least one other pattern of light projected onto the surroundings by at least one other active illuminator of at least one other device;
employ the active sensor of the given device to detect reflections of the at least one other pattern of light off the surroundings, wherein the reflections of the at least one other pattern are detected from the given pose of the given device;
determine a relative pose of the at least one other device with respect to the given pose of the given device, based on the shapes of the surfaces present in the surroundings and the distances of the surfaces from the given pose of the given device, the at least one other pattern and its detected reflections; and
send, to a server, surface information indicative of the shapes of the surfaces present in the surroundings and the distances of the surfaces from the given pose of the given device, along with pose information indicative of the relative pose of the at least one other device with respect to the given pose of the given device.
2. The system of claim 1 , wherein the server is configured to:
collect, from each device, respective surface information indicative of the shapes of the surfaces present in the surroundings and the distances of the surfaces from a pose of each device, along with respective pose information indicative of relative poses of other devices with respect to the given pose of the given device; and
process the respective surface information, based on the respective pose information, to generate a three-dimensional model of the surroundings.
3. The system of claim 1 , wherein at least one of the plurality of devices comprises pose-tracking means, wherein a processor of the at least one of the plurality of devices is configured to:
process pose-tracking data, collected by the pose-tracking means, to determine a pose of the at least one of the plurality of devices in a local coordinate space of the at least one of the plurality of devices; and
send, to the server, information indicative of the pose of the at least one of the plurality of devices.
4. The system of claim 1 , wherein the pose information is further indicative of a unique identifier of the at least one other device.
5. The system of claim 1 , wherein the processor of the given device is configured to:
detect when the pattern projected by the active illuminator of the given device is the same as the at least one other pattern projected by the at least one other active illuminator of the at least one other device; and
change the pattern to be projected by the active illuminator of the given device.
6. The system of claim 1 , wherein the active illuminator of the given device and the at least one other active illuminator of the at least one other device employ different frequencies of light.
7. The system of claim 1 , wherein the processor of the given device is configured to switch off the active illuminator of the given device when the reflections of the at least one other pattern are detected.
8. The system of claim 7 , wherein the active illuminator of the given device is switched off for a predefined time period when the reflections of the at least one other pattern are detected.
9. The system of claim 1 , wherein a given pattern of light is formed by at least two light beams forming at least one angle therebetween.
10. The system of claim 1 , wherein a given pattern of light projected by a given active illuminator is a marker whose field area changes with a distance of a surface onto which the marker is projected from the given active illuminator.
11. A device comprising an active illuminator, an active sensor and a processor, wherein the processor is configured to:
control the active illuminator to project a pattern of light onto surroundings of the device, whilst controlling the active sensor to detect reflections of the pattern of light off the surroundings, wherein the reflections are detected from a given pose of the device;
determine shapes of surfaces present in the surroundings and distances of the surfaces from the given pose of the device, based on the pattern and its detected reflections;
obtain pattern information indicative of at least one other pattern of light projected onto the surroundings by at least one other active illuminator of at least one other device;
employ the active sensor to detect reflections of the at least one other pattern of light off the surroundings, wherein the reflections of the at least one other pattern are detected from the given pose of the device;
determine a relative pose of the at least one other device with respect to the given pose of the device, based on the shapes of the surfaces present in the surroundings and the distances of the surfaces from the given pose of the device, the at least one other pattern and its detected reflections; and
send, to a server, surface information indicative of the shapes of the surfaces present in the surroundings and the distances of the surfaces from the given pose of the device, along with pose information indicative of the relative pose of the at least one other device with respect to the given pose of the device.
12. The device of claim 11 , wherein the server is configured to:
collect, from the device and the at least one other device, respective surface information indicative of the shapes of the surfaces present in the surroundings and the distances of the surfaces from a pose of a respective device, along with respective pose information indicative of relative poses of other devices with respect to the pose of the respective device; and
process the respective surface information, based on the respective pose information, to generate a three-dimensional model of the surroundings.
13. The device of claim 11 , wherein the device comprises pose-tracking means, and wherein the processor is configured to:
process pose-tracking data, collected by the pose-tracking means, to determine a pose of the device in a local coordinate space of the device; and
send, to the server, information indicative of the pose of the device.
14. The device of claim 11 , wherein the pose information is further indicative of a unique identifier of the at least one other device.
15. The device of claim 11 , wherein the processor is configured to:
detect when the pattern projected by the active illuminator of the device is the same as the at least one other pattern projected by the at least one other active illuminator of the at least one other device; and
change the pattern to be projected by the active illuminator of the device.
16. The device of claim 11 , wherein the active illuminator of the device and the at least one other active illuminator of the at least one other device employ different frequencies of light.
17. The device of claim 11 , wherein the processor is configured to switch off the active illuminator when the reflections of the at least one other pattern are detected.
18. The device of claim 17 , wherein the active illuminator is switched off for a predefined time period when the reflections of the at least one other pattern are detected.
19. The device of claim 11 , wherein a given pattern of light is formed by at least two light beams forming at least one angle therebetween.
20. The device of claim 11 , wherein a given pattern of light projected by a given active illuminator is a marker whose field area changes with a distance of a surface onto which the marker is projected from the given active illuminator.
21. A method comprising:
controlling an active illuminator of a device to project a pattern of light onto surroundings of the device, whilst controlling an active sensor of the device to detect reflections of the pattern of light off the surroundings, wherein the reflections are detected from a given pose of the device;
determining shapes of surfaces present in the surroundings and distances of the surfaces from the given pose of the device, based on the pattern and its detected reflections;
obtaining pattern information indicative of at least one other pattern of light projected onto the surroundings by at least one other active illuminator of at least one other device;
employing the active sensor to detect reflections of the at least one other pattern of light off the surroundings, wherein the reflections of the at least one other pattern are detected from the given pose of the device;
determining a relative pose of the at least one other device with respect to the given pose of the device, based on the shapes of the surfaces present in the surroundings and the distances of the surfaces from the given pose of the device, the at least one other pattern and its detected reflections; and
sending, to a server, surface information indicative of the shapes of the surfaces present in the surroundings and the distances of the surfaces from the given pose of the device, along with pose information indicative of the relative pose of the at least one other device with respect to the given pose of the device.
22. The method of claim 21 , further comprising:
collecting, at the server from the device and the at least one other device, respective surface information indicative of the shapes of the surfaces present in the surroundings and the distances of the surfaces from a pose of a respective device, along with respective pose information indicative of relative poses of other devices with respect to the pose of the respective device; and
processing, at the server, the respective surface information, based on the respective pose information, to generate a three-dimensional model of the surroundings.
23. The method of claim 21 , further comprising:
processing pose-tracking data, collected by pose-tracking means of the device, to determine a pose of the device in a local coordinate space of the device; and
sending, to the server, information indicative of the pose of the device.
24. The method of claim 21 , wherein the pose information is further indicative of a unique identifier of the at least one other device.
25. The method of claim 21 , further comprising:
detecting when the pattern projected by the active illuminator of the device is the same as the at least one other pattern projected by the at least one other active illuminator of the at least one other device; and
changing the pattern to be projected by the active illuminator of the device.
26. The method of claim 21 , wherein the active illuminator of the device and the at least one other active illuminator of the at least one other device employ different frequencies of light.
27. The method of claim 21 , further comprising switching off the active illuminator when the reflections of the at least one other pattern are detected.
28. The method of claim 27 , wherein the active illuminator is switched off for a predefined time period when the reflections of the at least one other pattern are detected.
29. The method of claim 21 , wherein a given pattern of light is formed by at least two light beams forming at least one angle therebetween.
30. The method of claim 21 , wherein a given pattern of light projected by a given active illuminator is a marker whose field area changes with a distance of a surface onto which the marker is projected from the given active illuminator.