IP Library › Granted Patent US 12,320,715
Granted Patent B2
US 12,320,715 · App. 17/765,681 · Granted Jun 3, 2025

Electroconductive film and temperature sensor film

Inventors: Katsunori Shibuya (Ibaraki, JP); Kazuhiro Nakajima (Ibaraki, JP); Kodai Miyamoto (Ibaraki, JP)
Assignee: NITTO DENKO CORPORATION
G01K7/183G01K7/186H01B5/14H01B13/0036H01C7/006H01C7/021H01C17/075G01K2007/163G01K2217/00
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Quick Facts
Patent No.
US 12,320,715
App. No.
17/765,681
Granted
Jun 3, 2025
Kind
B2
Abstract

Provided is an electroconductive film having a metal thin-film on a resin film base; and a temperature sensor film which is obtained by patterning the metal thin-film on the resin film base. An electroconductive film ( 101 ) which is used for the production of a temperature sensor film comprises a metal thin-film ( 10 ) on one principal surface of a resin film base ( 50 ), with a chromium oxide thin-film ( 21 ) serving as an underlying layer interposed therebetween. A temperature sensor film is obtained by patterning the metal thin-film so as to form a thermometric resistor part and a lead part that is connected to the thermometric resistor part.

Claims (18)

1. An electroconductive film for a temperature sensor,

the electroconductive film comprising: a resin film base; a metal thin-film disposed on one principal surface of the resin film; and an underlying layer interposed between the resin film and the metal thin-film, wherein

the underlying layer includes a chromium oxide thin-film and a silicon-based thin-film in this order from a side of the resin film base.

2. The electroconductive film according to claim 1 , wherein a thickness of the underlying layer is 3 to 100 nm.

3. The electroconductive film according to claim 1 , wherein the silicon-based thin-film is a silicon oxide thin-film.

4. The electroconductive film according to claim 1 , wherein the metal thin-film is in contact with the silicon-based thin-film.

5. The electroconductive film according to claim 1 , wherein the resin film base includes a hard coat layer formed on a surface of a resin film, and

the underlying layer is disposed on the hard coat layer.

6. The electroconductive film according to claim 5 , wherein the hard coat layer contains fine particles.

7. The electroconductive film according to claim 1 , wherein the chromium oxide thin-film is in contact with the resin film base.

8. The electroconductive film according to claim 1 , wherein the metal thin-film is formed of nickel or a nickel alloy.

9. The electroconductive film according to claim 1 , wherein a temperature coefficient of resistance of the metal thin-film is 3,000 ppm/° C. or more.

10. The electroconductive film according to claim 1 , wherein a thickness of the metal thin-film is 20 to 500 nm.

11. A method for producing the electroconductive film set forth in claim 1 , the method comprising depositing the chromium oxide thin-film and the metal thin-film by a sputtering method.

12. A temperature sensor film comprising:

a resin film base; an underlying layer formed on one principal surface of the resin film base; and a metal thin-film patterned on the underlying layer, wherein

the metal thin-film is patterned to form a thermometric resistor part patterned into a thin wire and used for measuring a temperature and a lead part connected to the thermometric resistor part and patterned to have a larger wiring width than that of the thermometric resistor part, and

the underlying layer includes a chromium oxide thin-film and a silicon-based thin-film in this order from a side of the resin film base.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2022
From: SHIBUYA, KATSUNORI; NAKAJIMA, KAZUHIRO; MIYAMOTO, KODAI
To: NITTO DENKO CORPORATION
Reel/Frame 060881/0049 →
Priority Claims (1)
JP 2019-181492 · Oct 1, 2019 · national
Continuity (1)
Related Publication 20220364937A1 · Nov 17, 2022
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