Display panel and test method thereof
A method of testing a display panel includes applying a test voltage to each of data lines; applying a gate signal to each of the gate lines; measuring a sensing voltage applied to end of the light emitting unit of each of the pixels by the pixel circuit in response to the gate signal and the test voltage; and determining whether the light emitting elements are validly connected in series within the light emitting unit of each of the pixels based on the sensing voltage.
1. A method of testing a display panel which includes pixels electrically connected to gate lines and data lines, each of the pixels including a pixel circuit electrically connected to a corresponding one of the gate lines and a corresponding one of the data lines, and a light emitting unit including an end electrically connected to the pixel circuit, comprising:
applying a test voltage to each of the data lines;
applying a gate signal to each of the gate lines;
measuring a sensing voltage applied to the end of the light emitting unit of each of the pixels by the pixel circuit in response to the gate signal and the test voltage; and
determining whether light emitting elements are validly connected in series in the light emitting unit of each of the pixels based on the sensing voltage.
2. The method of claim 1 , wherein
the test voltage is greater than a reference voltage, and
the reference voltage is equal to a voltage difference between a total operating voltage of the light emitting elements electrically connected in series and an operating voltage of one of the light emitting elements.
3. The method of claim 2 , wherein the test voltage is less than or equal to the total operating voltage of the light emitting elements.
4. The method of claim 2 , wherein the determining of whether the light emitting elements are validly connected in series includes determining that all of the light emitting elements are validly aligned in case that the sensing voltage is greater than the reference voltage.
5. The method of claim 2 , wherein the determining of whether the light emitting elements are validly connected in series includes determining that at least one of the light emitting elements is invalidly aligned in case that the sensing voltage is less than or equal to the reference voltage.
6. The method of claim 5 , further comprising:
in case that the sensing voltage is less than or equal to the reference voltage, determining that the at least one of the light emitting elements is short-circuited; and
physically opening the at least one of the light emitting elements by a repair process.
7. The method of claim 1 , wherein the applying of the test voltage to each of the data lines includes:
applying the test voltage to a first pad; and
sequentially applying the test voltage to at least a part of the data lines through a first demultiplexer electrically connected between the first pad and the data lines.
8. The method of claim 7 , wherein
the first demultiplexer includes sub-demultiplexers, and
the sequentially applying of the test voltage to the at least a part of the data lines includes applying simultaneously the test voltage to a part of the data lines through the sub-demultiplexers.
9. The method of claim 7 , wherein the applying of the gate signal to each of the gate lines includes:
applying the gate signal to a second pad; and
sequentially applying the gate signal to the gate lines through a second demultiplexer electrically connected between the second pad and the gate lines.
10. The method of claim 9 , wherein the sequentially applying of the gate signal to the gate lines includes sequentially applying the gate signal to the gate lines while the test voltage is applied to one of the data lines.
11. The method of claim 9 , wherein
the display panel further comprises sensing scan lines and sensing lines,
the pixel circuit includes a sensing transistor electrically connected between the end of the light emitting unit and a corresponding one of the sensing lines, the sensing transistor including a gate electrode electrically connected to a corresponding one of the sensing scan lines, and
the gate signal is simultaneously applied to one of the gate lines and one of the sensing lines through the second demultiplexer.
12. The method of claim 11 , wherein the first demultiplexer sequentially connects at least a part of the sensing lines to third pads.
13. The method of claim 1 , wherein the measuring of the sensing voltage includes:
applying the test voltage to a gate electrode of a driving transistor in the pixel circuit in response to the gate signal;
supplying an initialization voltage to an electrode of the driving transistor electrically connected to the end of the light emitting unit through a sensing line;
stopping supply of the initialization voltage while the test voltage is applied; and
measuring the sensing voltage changed based on a current flowing through the sensing line.