IP Library › Granted Patent US 12,324,256
Granted Patent B2
US 12,324,256 · App. 18/104,877 · Granted Jun 3, 2025

Image sensor

Inventors: Jung Wook Lim (Suwon-si, KR); Joong Seok Park (Suwon-si, KR); Dong Suk Yoo (Suwon-si, KR)
Assignee: SAMSUNG ELECTRONICS CO., LTD.
H10F39/18H04N25/59H04N25/7795H10F39/8037
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,324,256
App. No.
18/104,877
Granted
Jun 3, 2025
Kind
B2
Abstract

An image sensor is provided. The image sensor comprises a photodiode, a transmission transistor having a first end connected to the photodiode and a second end connected to a first node, a first switching transistor having a first end connected to the first node, a first capacitor having a first electrode connected to a second end of the first switching transistor, a second capacitor having a first electrode connected to the first node. A second electrode of the first capacitor is configured to receive a power voltage, and a second electrode of the second capacitor is configured to receive a boosting signal.

Claims (54)

1. An image sensor comprising:

a photodiode;

a transmission transistor having a first end connected to the photodiode and a second end connected to a first node;

a first switching transistor having a first end connected to the first node;

a first capacitor having a first electrode connected to a second end of the first switching transistor; and

a second capacitor having a first electrode connected to the first node,

wherein a second electrode of the first capacitor is configured to receive a power voltage, and

a second electrode of the second capacitor is configured to receive a boosting signal.

2. The image sensor as claimed in claim 1 , wherein the boosting signal has a signal waveform that swings between a high boosting voltage level and a low boosting voltage level that is lower than the high boosting voltage level.

3. The image sensor as claimed in claim 2 , wherein a potential of the first node increases when the boosting signal of the high boosting voltage level is applied to the second electrode of the second capacitor.

4. The image sensor as claimed in claim 3 , wherein a potential difference between the photodiode and the first node when the boosting signal of the high boosting voltage level is applied is greater than a potential difference between the photodiode and the first node when the boosting signal of the low boosting voltage level is applied.

5. The image sensor as claimed in claim 2 , wherein a gate of the transmission transistor is configured to receive a transmission signal, the transmission signal having a high transmission voltage level at least partially at a time period at which the boosting signal has the high boosting voltage level.

6. The image sensor as claimed in claim 1 , further comprising a second switching transistor connected between the first node and the second capacitor,

wherein the first switching transistor and the second switching transistor are configured to receive respective control signals that are different from each other.

7. The image sensor as claimed in claim 6 , wherein the boosting signal is a reference voltage that does not swing.

8. The image sensor as claimed in claim 2 , further comprising

a source follower transistor having a gate connected to the first node,

wherein the source follower transistor is configured to output charges provided from the photodiode in a state in which the transmission transistor is turned on and the first switching transistor is turned off while the boosting signal of the high boosting voltage level is being applied, and

the source follower transistor is configured to output charges accumulated in the first capacitor in a state in which the first switching transistor is turned on and the transmission transistor is turned off while the boosting signal of the low boosting voltage level is being applied.

9. An image sensor comprising:

a photodiode;

a transmission transistor having a first end connected to the photodiode and a second end connected to a first node;

a first capacitor having a first electrode connected to the first node and a second electrode connected to a capacitor voltage line applying a capacitor voltage signal, and

a switching transistor connected between the first node and the first electrode of the first capacitor,

wherein the capacitor voltage signal has a signal waveform that swings between a high voltage level and a low voltage level that is lower than the high voltage level.

10. The image sensor as claimed in claim 9 , wherein a potential of the first node increases when the capacitor voltage signal of the high voltage level is applied to the second electrode of the first capacitor.

11. The image sensor as claimed in claim 9 , further comprising

a source follower transistor having a gate connected to the first node and a first end connected to a power line supplying a power voltage,

wherein the source follower transistor is configured to turn on based on output charges provided from the photodiode in a state in which the transmission transistor is turned on while the capacitor voltage signal of the high voltage level is being applied to the second electrode of the first capacitor, and

the source follower transistor is configured to turn on based on charges accumulated in the first capacitor in a state in which the transmission transistor is turned off while the capacitor voltage signal of the low voltage level is being applied to the second electrode of the first capacitor.

12. The image sensor as claimed in claim 11 , wherein the high voltage level of the capacitor voltage signal is greater than the power voltage.

13. An image sensor comprising:

a first photodiode;

a second photodiode separated from the first photodiode;

a first transmission transistor having a first end connected to the first photodiode and a second end connected to a first node;

a first connection transistor having a first end connected to the first node and a second end connected to a second node;

a second connection transistor having a first end connected to the second node and a second end connected to a third node;

a second transmission transistor connected between the second photodiode and the third node;

a first switching transistor having a first end connected to the third node;

a first capacitor having a first electrode connected to a second end of the first switching transistor; and

a second capacitor having a first electrode connected to the first-third node,

wherein a second electrode of the first capacitor is configured to receive a power voltage, and

a second electrode of the second capacitor is configured to receive a boosting signal.

14. The image sensor as claimed in claim 13 , wherein the boosting signal has a signal waveform that swings between a high boosting voltage level and a low boosting voltage level that is lower than the high boosting voltage level.

15. The image sensor as claimed in claim 14 , wherein a potential of the third node increases when the boosting signal of the high boosting voltage level is applied to the second electrode of the second capacitor.

16. The image sensor as claimed in claim 15 , wherein a potential difference between the second photodiode and the third node when the boosting signal of the high boosting voltage level is applied is greater than a potential difference between the second photodiode and the third node when the boosting signal of the low boosting voltage level is applied.

17. The image sensor as claimed in claim 14 , wherein a gate of the first transmission transistor is configured to receive a first transmission signal, and a gate of the second transmission transistor is configured to receive a second transmission signal different from the first transmission signal, and

the second transmission signal has a high transmission voltage level at least partially at a time period at which the boosting signal has a high boosting voltage level.

18. The image sensor as claimed in claim 14 , further comprising a source follower transistor having a gate connected to the first node,

wherein the source follower transistor is configured to output charges provided from the first photodiode in a state in which the first transmission transistor is turned on and the first switching transistor is turned off while the boosting signal of the high boosting voltage level is being applied, and

the source follower transistor is configured to output charges accumulated in the first capacitor in a state in which the first switching transistor is turned on and the first transmission transistor is turned off while the boosting signal of the low boosting voltage level is being applied.

19. The image sensor as claimed in claim 13 , further comprising a second switching transistor connected between the third node and the second capacitor,

wherein the first switching transistor and the second switching transistor are configured to receive respective control signals that are different from each other, and

the boosting signal is a reference voltage that does not swing.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2023
From: LIM, JUNG WOOK; PARK, JOONG SEOK; YOO, DONG SUK
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 062570/0647 →
Priority Claims (1)
KR 10-2022-0059500 · May 16, 2022 · national
Continuity (1)
Related Publication 20230369375A1 · Nov 16, 2023
References Cited (7)
US 8279328B2 · Lahav et al. · 2012 [cited by applicant]
US 8710419B2 · Bogaerts · 2014 [cited by applicant]
US 8754357B2 · Meynants et al. · 2014 [cited by applicant]
US 9305949B2 · Chen et al. · 2016 [cited by applicant]
US 10630928B2 · Velichko · 2020 [cited by applicant]
US 11044417B2 · Bitan et al. · 2021 [cited by applicant]
US 20210313363A1 · Kwag · 2021 [cited by examiner]