Test circuit, method, and apparatus for to-be-tested module
Disclosed are a test circuit, method, and apparatus for a to-be-tested module. The circuit includes a test data generation module including a plurality of test data generation units, each of which is configured to generate test data consistent with a data type supported by itself based on raw data consistent with the data type; and a functional safety module electrically connected to the to-be-tested module and each test data generation unit; the functional safety module being configured to perform check operation processing on the test data to obtain a first processing result, and to perform check operation processing and fault injection processing on the test data to obtain a second processing result; and the to-be-tested module being configured to generate a test result based on test data, first processing result, and second processing result. Embodiments of this disclosure can achieve multi-channel testing, thereby satisfying application requirement for processing multi-channel inputs.
1. A test circuit for a module to be tested, comprising a test data generation module and a functional safety module, wherein
the test data generation module comprises a plurality of test data generation units, and each test data generation unit is respectively electrically connected to the functional safety module;
each test data generation unit is configured to generate test data consistent with a data type supported by the test data generation unit based on raw data consistent with the data type;
the functional safety module is electrically connected to the module to be tested, and is configured to perform check operation processing on the test data to obtain a first processing result, and to perform check operation processing and fault injection processing on the test data to obtain a second processing result; and
the module to be tested is configured to perform check operation processing on the test data to obtain a check operation result; generate a test result based on the check operation result, the first processing result, and the second processing result, wherein in a case where the check operation result and the first processing result are the same and the check operation result and the second processing result are different, the test result indicates the module to be tested passes a test.
2. The circuit according to claim 1 , wherein the circuit further comprises:
a metadata generation module, wherein the metadata generation module is electrically connected to the module to be tested, and corresponds to one test data generation unit in the test data generation module;
the metadata generation module is configured to generate metadata corresponding to the test data generated by the test data generation unit that corresponds to the metadata generation module; and
the module to be tested is configured to generate the test result based on the test data, the first processing result, the second processing result, and the metadata.
3. The circuit according to claim 1 , wherein the circuit further comprises an additional data generation module which is electrically connected to the functional safety module;
the additional data generation module is configured to generate additional data corresponding to the test data;
the functional safety module is further configured to perform check operation processing on the additional data to obtain a third processing result, and to perform check operation processing and fault injection processing on the additional data to obtain a fourth processing result; and
the module to be tested is configured to generate the test result based on the test data, the first processing result, the second processing result, the additional data, the third processing result, and the fourth processing result.
4. The circuit according to claim 1 , wherein the circuit further comprises a configuration module and a sequence signal generation module, wherein
the configuration module stores respective configuration information of each test data generation unit, the functional safety module, a metadata generation module, an additional data generation module, and the sequence signal generation module; and
the sequence signal generation module is configured to generate respective sequence signals of each test data generation unit, the metadata generation module, and the additional data generation module based on the respective configuration information of each test data generation unit, the metadata generation module, and the additional data generation module, wherein each test data generation unit, the metadata generation module, and the additional data generation module are respectively configured to generate respective data based on the respective sequence signals.
5. The circuit according to claim 4 , wherein
the functional safety module is further configured to perform fault injection processing on the sequence signal; and
the module to be tested is configured to generate the test result based on the test data, the first processing result, the second processing result, and the sequence signal which is performed with fault injection processing.
6. The circuit according to claim 4 , wherein the configuration module further comprises a storage unit and a plurality of registers;
each of the registers stores the configuration information, and each test data generation unit, the functional safety module, the metadata generation module, the additional data generation module, and the sequence signal generation module respectively correspond to different registers of the configuration module;
each test data generation unit, the functional safety module, the metadata generation module, the additional data generation module, and the sequence signal generation module are respectively configured to configure themselves based on the configuration information in the corresponding registers of the configuration module; and
the functional safety module is further configured to store the first processing result to the storage unit.
7. The circuit according to claim 6 , wherein the functional safety module is further configured to store the third processing result to the storage unit.
8. The circuit according to claim 7 , wherein the data output module is provided with a metadata enabling interface, configured to output the information representing whether the metadata is currently output;
an additional data enabling interface, configured to output the information representing whether the additional data is currently output;
sequence signal output interfaces, configured to output the sequence signal corresponding to the test data that is currently output;
a test data enabling interface, configured to output the information representing whether the test data is currently output;
a channel indication interface, configured to output the information indicating the test data generation unit corresponding to the test data that is currently output;
a metadata output interface, configured to output the metadata;
a test data and additional data output interface, configured to output the test data and the additional data; and
data type indication interfaces, configured to output the information indicating the data type of the test data that is currently output.
9. The circuit according to claim 4 , wherein the circuit further comprises a data output module;
the data output module is respectively electrically connected to the functional safety module, the metadata generation module, and the module to be tested; and
the data output module is configured to output at least one of the following items to the module to be tested:
information representing whether metadata is currently output;
information representing whether additional data is currently output;
information representing whether the test data is currently output;
the sequence signal corresponding to the test data that is currently output;
information indicating the test data generation unit, metadata, test data, and additional data which all correspond to the test data that is currently output; and
information indicating the data type of the test data that is currently output.
10. The circuit according to claim 4 , wherein the respective sequence signals of each test data generation unit, the metadata generation module, and the additional data generation module is independent; and/or
the sequence signals of different test data generation units are separate with each other, and the sequence signals between different test data generation units are able to span frames.
11. The circuit according to claim 1 , wherein
the functional safety module is configured to perform fault injection processing on the test data, and perform, according to a preset check algorithm, check operation processing on the test data which is performed with fault injection processing, to obtain the second processing result;
or
the functional safety module is configured to perform check operation processing on the test data according to a preset check algorithm, and perform fault injection processing on an obtained check operation processing result, to obtain the second processing result;
or
the functional safety module is configured to perform fault injection processing on an algorithm parameter of a preset check algorithm, and perform check operation processing on the test data according to the preset check algorithm whose algorithm parameter is performed with fault injection processing, to obtain the second processing result.
12. The circuit according to claim 1 , wherein different test data generation units correspond to different gain values; and
each test data generation unit is configured to apply a corresponding gain value to the raw data consistent with the data type supported by the test data generation unit, to generate the test data consistent with the data type.
13. The circuit according to claim 12 , wherein different test data generation units correspond to different gain-value sets; and
the gain value corresponding to each test data generation unit is selected from the corresponding gain-value set, and the gain value corresponding to each test data generation unit is switched cyclically in a preset manner.
14. The circuit according to claim 13 , wherein a correspondence between the test data generation unit and the gain-value set is preset.
15. The circuit according to claim 13 , wherein the preset manner for cyclical switching is cyclically switched by a preset time period or a preset quantity of times of generating the test data.
16. The circuit according to claim 1 , wherein data types supported by different test data generation units are the same or different.
17. The circuit according to claim 1 , wherein raw data corresponding to different test data generation units are the same or different.
18. The circuit according to claim 1 , wherein after obtaining the first processing result and the second processing result, the functional safety module provides the obtained test data, the first processing result, and the second processing result to the module to be tested based on the electrical connection between the functional safety module and the module to be tested.
19. A non-transitory computer readable storage medium, wherein the storage medium stores a computer program, and the computer program is used to implement a test method for a module to be tested, wherein the method comprises:
invoking each test data generation unit in a test circuit to generate test data consistent with a data type supported by the test data generation unit based on raw data consistent with the data type;
performing check operation processing on the test data, to obtain a first processing result;
performing check operation processing and fault injection processing on the test data, to obtain a second processing result;
performing check operation processing on the test data to obtain a check operation result; and
generating a test result of the module to be tested based on the check operation result, the first processing result, and the second processing result, wherein in a case where the check operation result and the first processing result are the same and the check operation result and the second processing result are different, the test result indicates the module to be tested passes a test.
20. An electronic device, comprising:
a processor; and
a memory, configured to store processor-executable computer program instructions,
wherein the processor is configured to read the computer program instructions from the memory, and execute the instructions to implement a test method for a module to be tested, wherein the method comprises:
invoking each test data generation unit in a test circuit to generate test data consistent with a data type supported by the test data generation unit based on raw data consistent with the data type;
performing check operation processing on the test data, to obtain a first processing result;
performing check operation processing and fault injection processing on the test data, to obtain a second processing result;
performing check operation processing on the test data to obtain a check operation result; and
generating a test result of the module to be tested based on the check operation result, the first processing result, and the second processing result, wherein in a case where the check operation result and the first processing result are the same and the check operation result and the second processing result are different, the test result indicates the module to be tested passes a test.