Display device with crack detection circuitry and manufacturing method thereof
A display device includes a substrate including a display area and a non-display area disposed near the display area, a plurality of pixels disposed in the display area, a plurality of signal lines disposed on the substrate and connected to the pixels, and a pad portion disposed in the non-display area and including a plurality of pads. The signal lines include a first crack detecting line connected to a first test voltage pad and a first pad at a first node, connected to a second pad at a second node, and extending around the non-display area between the first node and the second node, as well as a first data line including a first end connected to a first transistor connected to the first crack detecting line at the second node, and a second end connected to corresponding pixels from among the plurality of pixels.
1. A display device, comprising:
a substrate comprising a display area and a non-display area disposed near the display area, wherein the non-display area comprises a bendable area;
a plurality of pixels disposed in the display area;
a plurality of signal lines disposed on the substrate and connected to the pixels; and
a pad portion disposed in the non-display area and comprising a plurality of pads,
wherein the signal lines comprise:
a first crack detecting line disposed in the non-display area and directly electrically connected to a first test voltage pad and a first pad at a first node, directly electrically connected to a second pad at a second node, and extending around the bendable area between the first node and the second node; and
a first data line comprising a first end connected to a first transistor connected to the first crack detecting line at the second node, and a second end connected to corresponding pixels from among the plurality of pixels, wherein the first transistor is spaced apart from the bendable area and disposed in the non-display area on an opposite side of the bendable area from the display area.
2. The display device of claim 1 , wherein the first crack detecting line comprises a line reciprocating in a zigzag pattern in the bendable area.
3. The display device of claim 1 , wherein the signal lines further comprise:
a plurality of second data lines, each comprising:
a first end connected to the first crack detecting line through a corresponding one of a plurality of second transistors, the plurality of second transistors spaced apart from the bendable area and being on the opposite side of the bendable area from the display area;
a second end connected to corresponding pixels from among the plurality of pixels; and
a middle portion between the first end and the second end that extends through the bendable area.
4. The display device of claim 2 , wherein the signal lines further comprise:
a control line connected to gates of the first transistor and the second transistors.
5. The display device of claim 4 , wherein a crack of the first crack detecting line is detected by applying an enable-level voltage to the control line and applying a black gray voltage to the first test voltage pad.
6. The display device of claim 4 , further comprising:
a first additional pad connected to the first pad; and
a second additional pad connected to the second pad, wherein
the first and second additional pads are disposed in the non-display area, and
while a disable-level voltage is applied to the control line, a resistance of the first crack detecting line is measured using the first additional pad and the second additional pad.
7. The display device of claim 6 , further comprising:
a data driving integrated circuit (IC) connected to the pad portion, wherein
the first test voltage pad, the first additional pad, and the second additional pad are in a floating state.
8. The display device of claim 2 , wherein
the signal lines further comprise:
a first test voltage line comprising a first end connected to the first test voltage pad at the first node and a second end connected to the second transistors, and
the first test voltage line has a resistance corresponding to a line resistance of the first crack detecting line.
9. The display device of claim 8 , wherein the resistance of the first test voltage line is proportional to a magnitude of the line resistance.
10. The display device of claim 1 , wherein the first crack detecting line extends directly across from one side of the display area between the first node and the second node.
11. The display device of claim 10 , wherein
the signal lines further comprise:
a second crack detecting line disposed on the non-display area and directly electrically connected to a second test voltage pad and a third pad at a third node, directly electrically connected to a fourth pad at a fourth node, and extending around the bendable area between the third node and the fourth node; and
a second data line comprising a first end connected to a second transistor connected to the second crack detecting line at the third node, and a second end connected to corresponding pixels from among the plurality of pixels, and
the second crack detecting line extends directly across from another side of the display area between the third node and the fourth node.
12. A method for manufacturing a display device, comprising:
manufacturing a display panel;
testing for a crack in the display panel using a first set of pads before mounting a driving integrated circuit (IC) to the display panel;
mounting the driving IC to the display panel using a second set of pads spaced apart from the first set of pads in plan view; and
testing for a crack in the display panel again, after mounting the driving IC to the display panel, using the driving IC and the second set of pads, wherein
manufacturing the display panel comprises:
forming a plurality of pixels in a display area of a substrate, wherein the substrate comprises the display area and a non-display area disposed near the display area;
forming a plurality of signal lines on the substrate, wherein the signal lines are electrically connected to the pixels; and
forming a pad portion in the non-display area, wherein the pad portion comprises a plurality of pads including the first set of pads and the second set of pads, and
the signal lines comprise:
a first crack detecting line disposed on the non-display area and directly electrically connected to a first test voltage pad and a first pad at a first node, directly electrically connected to a second pad at a second node, and extending around a bendable area between the first node and the second node;
a first data line comprising a first end connected to a first transistor connected to the first crack detecting line at the second node, and a second end connected to corresponding pixels from among the plurality of pixels;
a plurality of second data lines, each comprising a first end connected to the first crack detecting line through a corresponding one of a plurality of second transistors and a second end connected to corresponding pixels from among the plurality of pixels; and
a control line connected to gates of the first transistor and the second transistors, wherein
the first transistor and the second transistors are spaced apart from the bendable area and disposed in the non-display area on an opposite side of the bendable area from the display area.
13. The method of claim 12 , further comprising:
measuring a resistance of the first crack detecting line when testing for the crack in the display panel again using the driving IC indicates that a crack has been detected.
14. The method of claim 13 , wherein
measuring the resistance of the first crack detecting line comprises:
applying a disable-level voltage to the control line; and
measuring the resistance of the first crack detecting line using a first additional pad and a second additional pad while applying the disable-level voltage to the control line,
the first additional pad is electrically connected to the first pad, and the second additional pad is electrically connected to the second pad, and
the first and second additional pads are disposed in the non-display area.
15. The method of claim 14 , wherein
mounting the driving IC to the display panel comprises:
connecting a data driving IC to the pad portion, and
testing for a crack in the display panel again using the driving IC is performed while the first test voltage pad, the first additional pad, and the second additional pad are in a floating state.
16. The method of claim 15 , wherein measuring the resistance of the first crack detecting line comprises:
measuring, by the driving IC, the resistance of the first crack detecting line using the first pad and the second pad.
17. The method of claim 12 , wherein testing for a crack in the display panel comprises:
applying an enable-level voltage to the control line; and
applying a black gray voltage to the first test voltage pad.
18. The method of claim 12 , wherein the first crack detecting line comprises a line reciprocating in a zigzag pattern in the bendable area.