Granted Patent B2

US 12,342,108 · App. 17/704,459 · Granted Jun 24, 2025

Inventors: Jiman Kim (Suwon-si, KR); Jaesung Park (Suwon-si, KR); Seongwoon Jung (Suwon-si, KR)

Assignee: SAMSUNG ELECTRONICS CO., LTD.

H04N9/3185H04N9/3194

Abstract

Claims (74)

1. An electronic apparatus comprising:

an image projector;

memory storing instructions; and

at least one processor, comprising processing circuitry, wherein the instructions, when executed, configure the at least one processor to perform operations comprising:

controlling the image projector to project a test image including a plurality of markers onto a projection plane,

based on first information indicating a location of the plurality of markers in the test image and second information indicating a location of the plurality of markers in a photographed image of the projection plane photographed by an external device, acquiring third information indicating a location of a vertex of the test image in the photographed image,

performing correction of the third information based on posture information of the external device acquired by a sensor of the external device, and

performing keystone correction based on the corrected third information.

2. The apparatus of claim 1 ,

wherein the instructions, when executed, configure the at least one processor to perform operations comprising:

performing rotation correction of the third information based on the acquired posture information, and

based on distance information between the external device and the projection plane, performing projection correction of the rotation corrected third information, to be projected, and acquiring, as the corrected third information, the projection and rotation corrected third information.

3. The apparatus of claim 2 ,

wherein the posture information of the external device includes at least one of roll information, pitch information, or yaw information,

wherein the roll information and the pitch information are obtained through an acceleration sensor of the external device, and

wherein the yaw information is acquired based on view angle information of a camera of the external device used to photograph the projection plane.

4. The apparatus of claim 3 , wherein the instructions, when executed, configure the at least one processor to perform operations comprising:

based on the projection plane being identified as a specified area based on the acquired posture information, acquiring at least one of the roll information, the pitch information, or the yaw information by changing a reference value of a gravity direction among output values of the acceleration sensor, and

rotation correct the third information based on the acquired information.

5. The apparatus of claim 1 , wherein each of the plurality of markers is in a pattern form including a black area and a white area with a specified ratio in each of a plurality of directions.

6. The apparatus of claim 1 ,

wherein each of the plurality of markers is located in an inner area by a specified ratio based on four vertices of the test image,

wherein the instructions, when executed, configure the at least one processor to perform operations comprising:

acquiring fourth information indicating a vertex location of the test image based on the first information and the specified ratio, and

acquiring the third information from the photographed image based on the fourth information and a first transformation matrix,

wherein the first transformation matrix is acquired based on a mapping relationship between the first information and the second information.

7. The apparatus of claim 1 , wherein the instructions, when executed, configure the at least one processor to perform operations comprising:

acquiring a second transformation matrix based on the corrected third information and vertex coordinate information of the test image, and

performing keystone correction by identifying a rectangular area having a maximum size corresponding to an aspect ratio of an input image within the identified rectangular area based on the corrected third information.

8. The apparatus of claim 7 , wherein the instructions, when executed, configured the at least one processor to perform operations comprising:

acquiring fifth information corresponding to the identified rectangular area, and

performing keystone correction by applying an inverse matrix of the second transformation matrix to the acquired fifth information.

9. The apparatus of claim 7 , wherein the instructions, when executed, configure the at least one processor to perform operations comprising:

expanding the rectangular area at a center point diagonally meeting a vertex of a first area acquired based on the corrected third information, and identifying whether a vertex of the expanded rectangular area meets an edge of the first area,

based on a vertex of the rectangular area meeting the edge of the first area, expanding a small side of the rectangular area in a specified pixel unit, and expanding a large side of the rectangular area to correspond to the aspect ratio, and

identifying the rectangular area having a maximum size at a location where the vertex corresponding to a diagonal of the rectangular area meets the edge of the first area.

10. The apparatus of claim 1 , further comprising:

a communication interface comprising communication circuitry;

wherein the instructions, when executed, configure the at least one processor to perform operations comprising:

receiving the second information indicating the location of the plurality of markers from the external device through the communication interface, and

acquiring the second information indicating the location of the plurality of markers based on the photographed image received from the external device through the communication interface.

11. The apparatus of claim 1 , wherein the plurality of markers is located in a plurality of different areas in the test image, and the plurality of markers have different shapes.

12. A method for controlling an electronic apparatus comprising:

projecting a test image including a plurality of markers onto a projection plane;

based on first information indicating a location of the plurality of markers in the test image and second information indicating a location of the plurality of markers in a photographed image of the projection plane photographed by an external device, acquiring third information indicating a location of a vertex of the test image in the photographed image;

correcting the third information based on posture information of the external device acquired by a sensor of the external device; and

performing keystone correction based on the corrected third information.

13. The method of claim 12 :

wherein the correcting of the third information includes rotation correcting the third information based on the acquired posture information; and

based on distance information between the external device and the projection plane, projection correcting the rotation corrected third information, and acquiring, as the corrected third information, the projection and rotation corrected third information.

14. The method of claim 13 ,

wherein the posture information of the external device includes at least one of roll information, pitch information, or yaw information,

wherein the roll information and the pitch information are obtained through an acceleration sensor of the external device, and

wherein the yaw information is acquired based on view angle information of a camera of the external device used for photographing the projection plane.

15. The method of claim 14 , further comprising:

based on the projection plane being identified as a specified area based on the acquired posture information, acquiring at least one of the roll information, the pitch information, or the yaw information by changing a reference value of a gravity direction among output values of the acceleration sensor, and

rotation correcting the third information based on the acquired information.

16. The method of claim 12 , wherein each of the plurality of markers is in a pattern form including a black area and a white area with a specified ratio in each of a plurality of directions.

17. The method of claim 12 ,

wherein each of the plurality of markers is located in an inner area by a specified ratio based on four vertices of the test image,

and the method further comprises:

acquiring fourth information indicating a vertex location of the test image based on the first information and the specified ratio, and

acquiring the third information from the photographed image based on the fourth information and a first transformation matrix,

wherein the first transformation matrix is acquired based on a mapping relationship between the first information and the second information.

18. The method of claim 12 , further comprising:

acquiring a second transformation matrix based on the corrected third information and vertex coordinate information of the test image, and

performing keystone correction by identifying a rectangular area having a maximum size corresponding to an aspect ratio of an input image within the identified rectangular area based on the corrected third information.

19. The method of claim 18 , further comprising:

acquiring fifth information corresponding to the identified rectangular area, and

performing keystone correction by applying an inverse matrix of the second transformation matrix to the acquired fifth information.

20. The method of claim 18 , further comprising:

expanding the rectangular area at a center point diagonally meeting a vertex of a first area acquired based on the corrected third information, and identifying whether a vertex of the expanded rectangular area meets an edge of the first area,

based on a vertex of the rectangular area meeting the edge of the first area, expanding a small side of the rectangular area in a specified pixel unit, and expanding a large side of the rectangular area to correspond to the aspect ratio, and

identifying the rectangular area having a maximum size at a location where the vertex corresponding to a diagonal of the rectangular area meets the edge of the first area.

Assignments (1)

Priority Claims (2)

Continuity (2)

References Cited (37)