IP Library › Granted Patent US 12,345,559
Granted Patent B2
US 12,345,559 · App. 18/252,122 · Granted Jul 1, 2025

Fill-level measurement device

Inventors: Markus Vogel (Schopfheim, DE); Harald Faber (Lörrach, DE); Anton Kochetkov (Lörrach, DE)
Assignee: Endress+Hauser SE+Co. KG
G01F23/284
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Quick Facts
Patent No.
US 12,345,559
App. No.
18/252,122
Granted
Jul 1, 2025
Kind
B2
Abstract

In an FMCW-based fill-level measurement device, the fill-level value can be compensated with regard to component tolerances. A diagnosis unit of the fill-level measurement device compares the clock rate of the signal-generating PLL with the sampling rate of the analog/digital converter and determines a first compensation factor. With the aid of the first compensation factor, the determined fill-level value can be compensated with regard to these sampling or clock rates without any external high-precision reference source having to be used for this purpose.

Claims (159)

1. A frequency modulated continuous wave (FMCW)-based, fill-level measurement device for measuring a compensated fill level value of a filling material in a container, comprising:

a transmission unit via which a high-frequency signal can be transmitted in a direction of the filling material and, after reflection at the filling material surface, can be received as a received signal;

a signal generation unit designed to generate the high-frequency signal according to an FMCW principle and with reference to a defined clock rate;

a receiving unit designed to:

downmix the received signal into a low-frequency base signal in accordance with the FMCW principle; and

sample the base signal at a defined sampling rate;

an evaluation unit designed to:

determine a distance value from the filling material by using the sampled base signal;

compensate the distance value using a first compensation factor and/or a second compensation factor;, and

determine the compensated fill-level value with the aid of the compensated distance value; and

a diagnosis unit designed to:

determine the first compensation factor by comparing the clock rate with the sampling rate;

determine the second compensation factor by comparing the clock rate and/or the sampling rate with a reference frequency and/or the first compensation factor; and

transmit the first compensation factor or the second compensation factor to the evaluation unit.

2. The fill-level measurement device according to claim 1 , further comprising:

a production interface,

wherein for transmitting the first compensation factor, the second compensation factor, the clock rate, the sampling rate, and/or an external reference frequency, the fill-level measurement device can be connected via the production interface.

3. The fill-level measurement device according to claim 1 , wherein the signal generation unit is realized as a phase-locked loop.

4. The fill-level measurement device according to claim 1 , wherein the evaluation unit is designed to determine the distance value via a Fourier transform of the sampled base signal.

5. A method for compensating a fill-level measurement device, the method comprising:

providing the fill-level measurement device, including:

a transmission unit via which a high-frequency signal can be transmitted in a direction of a filling material and, after reflection at the filling material surface, can be received as a received signal;

a signal generation unit designed to generate the high-frequency signal according to an FMCW principle and with reference to a defined clock rate;

a receiving unit designed to:

downmix the received signal into a low-frequency base signal in accordance with the FMCW principle; and

sample the base signal at a defined sampling rate;

an evaluation unit designed to:

determine a distance value from the filling material by using the sampled base signal;

compensate the distance value using a first compensation factor and/or a second compensation factor; and

determine the compensated fill-level value with the aid of the compensated distance value; and

a diagnosis unit designed to:

determine the first compensation factor by comparing the clock rate with the sampling rate;

determine the second compensation factor by comparing the clock rate and/or the sampling rate with a reference frequency and/or the first compensation factor; and

transmit the first compensation factor or the second compensation factor to the evaluation unit;

determining the first compensation factor by comparing the clock rate with the sampling rate, and/or

determining the second compensation factor by comparing the clock rate and/or the sampling rate with the reference frequency.

6. The method according to claim 5 , wherein the clock rate (clk 1 ) and the sampling rate (clk 2 ) are compared with one another according to:

R

2

,

1

=

c

⁢

l

⁢

k

2

c

⁢

l

⁢

k

1

wherein the first compensation factor (k 1 ) is calculated according to:

k

1

=

R

2

,

1

*

c

⁢

l

⁢

k

1

,

soll

c

⁢

l

⁢

k

2

,

soll

and wherein clk 1,soll is the target value of the clock rate (clk 1 ) and clk 2, soll is the target value of the sampling rate (clk 2 ).

7. The method according to claim 6 , wherein the clock rate (clk 1 ) and the sampling rate (clk 2 ) are each compared with the reference frequency (clk ref ) according to:

R

1

,

ref

=

c

⁢

l

⁢

k

1

c

⁢

l

⁢

k

ref

;

R

2

,

ref

=

c

⁢

l

⁢

k

2

c

⁢

l

⁢

k

ref

and wherein the second compensation factor (k 2 ) is calculated according to:

k

2

=

(

clk

1

,

soll

R

1

,

ref

*

clk

r

⁢

e

⁢

f

)

2

·

R

2

,

ref

*

clk

r

⁢

e

⁢

f

clk

2

,

soll

.

8. The method according to claim 6 , wherein the first compensation factor is repeatedly determined during continuous fill-level measurements, and wherein the fill-level measurement device is classified as functional as long as the first compensation factor over the continuous fill-level measurements does not exceed a minimum change.

9. The method according to claim 7 , wherein the second compensation factor is determined during the manufacture of the fill-level measurement device by comparing the clock rate and/or the sampling rate with the reference frequency of an external reference source.

10. The method according to claim 9 , wherein the second compensation factor is calculated by an external unit, and wherein the second compensation factor is transmitted via the production interface to the evaluation unit.

11. The method according to claim 9 , wherein the reference frequency is transmitted via the production interface to the analysis unit, and wherein the second compensation factor is calculated by the analysis unit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 8, 2023
From: VOGEL, MARKUS; KOCHETKOV, ANTON
To: ENDRESS+HAUSER SE+CO. KG
Reel/Frame 063567/0267 →
Priority Claims (1)
DE 10 2020 129 764.5 · Nov 11, 2020 · national
Continuity (1)
Related Publication 20230400342A1 · Dec 14, 2023
References Cited (36)
US 4539565A · Norsworthy · 1985 [cited by examiner]
US 5726607A · Brede · 1998 [cited by examiner]
US 6014100A · Fehrenbach · 2000 [cited by examiner]
US 6754613B2 · Tabatabaei · 2004 [cited by examiner]
US 7898344B2 · Hongo · 2011 [cited by examiner]
US 7982661B2 · Beasley · 2011 [cited by examiner]
US 10623006B2 · Nelson · 2020 [cited by examiner]
US 10656002B2 · Fehrenbach · 2020 [cited by examiner]
US 10749535B2 · Nelson · 2020 [cited by examiner]
US 10848161B2 · Nelson · 2020 [cited by examiner]
US 11015969B2 · Welle · 2021 [cited by examiner]
US 11038511B2 · Weeks · 2021 [cited by examiner]
US 20030076181A1 · Tabatabaei · 2003 [cited by examiner]
US 20030098731A1 · Tabatabaei · 2003 [cited by examiner]
US 20060201246A1 · Rolfes · 2006 [cited by examiner]
US 20110182386A1 · Duello · 2011 [cited by examiner]
US 20130213132A1 · Wegemann · 2013 [cited by examiner]
US 20170254692A1 · Faber · 2017 [cited by examiner]
US 20180102895A1 · Schell · 2018 [cited by examiner]
US 20180106602A1 · Welle · 2018 [cited by examiner]
US 20180328772A1 · Schultheiss · 2018 [cited by examiner]
US 20180372530A1 · Welle · 2018 [cited by examiner]
US 20180372531A1 · Waelde · 2018 [cited by examiner]
US 20190004563A1 · Nelson · 2019 [cited by examiner]
US 20190004565A1 · Nelson · 2019 [cited by examiner]
US 20190007052A1 · Nelson · 2019 [cited by examiner]
US 20190007055A1 · Nelson · 2019 [cited by examiner]
US 20190107427A1 · Waelde · 2019 [cited by examiner]
US 20190107429A1 · Waelde · 2019 [cited by examiner]
US 20200076439A1 · Weeks · 2020 [cited by examiner]
US 20210036706A1 · Weeks · 2021 [cited by examiner]
DE 102006058852A2 · 2008 [cited by applicant]
EP 2690455B1 · 2017 [cited by examiner]
EP 3343243A1 · 2018 [cited by examiner]
KR 20140059084A · 2014 [cited by applicant]
WO 9838525A1 · 1998 [cited by applicant]