Radio frequency conduction test method and related apparatus without a radio frequency switch test socket
A radio frequency conduction test method and a test system are provided. The test method includes: moving a radio frequency test probe to a first pad of a board so as to allow a test signal on the first pad to be transmitted to the radio frequency test probe and then transmitted to a radio frequency test instrument for a radio frequency conduction test, where the test signal in the radio frequency test probe is transmitted to the radio frequency test instrument via an impedance conversion apparatus and a directional coupler, a straight-through output port of the directional coupler is connected to a first measurement port of the radio frequency test instrument, and a coupling output port of the directional coupler is connected to a second measurement port of the radio frequency test instrument.
1. A radio frequency conduction test method, wherein the method comprises:
moving a radio frequency test probe to a first pad of a board so as to allow a test signal on the first pad to be transmitted to the radio frequency test probe for testing, wherein the board comprises a radio frequency front-end circuit, a radio frequency back-end circuit, the first pad, a second pad, and a to-be-welded serial device; the to-be-welded serial device is a device to be welded to the first pad and the second pad; the serial device is one or more components connected in series with another component; and the first pad is connected to the radio frequency front-end circuit, the second pad is connected to the radio frequency back-end circuit, and the radio frequency front-end circuit and the radio frequency back-end circuit are in an off state;
after moving the radio frequency test probe to the first pad of the board, transmitting the test signal in the radio frequency test probe to a radio frequency test instrument via an impedance conversion apparatus and a directional coupler, wherein
a straight-through output port of the directional coupler is connected to a first measurement port of the radio frequency test instrument, and a coupling output port of the directional coupler is connected to a second measurement port of the radio frequency test instrument; and
after completion of the test, moving away the radio frequency test probe and welding the serial device to the first pad and the second pad so as to enable the radio frequency front-end circuit and the radio frequency back-end circuit to be in an on state.
2. The method according to claim 1 , wherein the radio frequency test probe and/or the first pad is treated with nickel and gold plating.
3. The method according to claim 2 , wherein after the moving a radio frequency test probe to a first pad of a board, the method further comprises: enabling a first portion of the radio frequency test probe to be in contact with a second portion of the first pad, wherein the first portion and/or the second portion is treated with nickel and gold plating.
4. The method according to claim 1 , wherein the welding the serial device to the first pad and the second pad comprises:
welding the serial device to the first pad and the second pad through low-temperature reflow soldering or laser welding.
5. The method according to claim 4 , wherein a center-to-center distance between the first pad and the second pad is not less than 0.254 millimeter and not greater than 2.54 millimeters.
6. A radio frequency conduction test system, wherein the system comprises a board, a radio frequency test probe, and a radio frequency test instrument, wherein
the board comprises a radio frequency circuit, a first pad, and a second pad, wherein the radio frequency circuit comprises a radio frequency front-end circuit and a radio frequency back-end circuit, the first pad is connected to the radio frequency front-end circuit, the second pad is connected to the radio frequency back-end circuit, the radio frequency front-end circuit and the radio frequency back-end circuit are in an off state, and the first pad and the second pad are pads for a serial device to be welded into the radio frequency circuit;
the radio frequency test probe is configured to transmit a test signal on the first pad to the radio frequency test instrument; and
the radio frequency test instrument is configured to implement a radio frequency conduction test on the test signal; and
the system further comprises an impedance conversion apparatus and a directional coupler, wherein the impedance conversion apparatus is connected to the radio frequency test probe and the directional coupler, the directional coupler is further connected to the radio frequency test instrument, the impedance conversion apparatus is configured to transmit the test signal in the radio frequency test probe to the directional coupler, the directional coupler is configured to transmit the test signal to the radio frequency test instrument,
a straight-through output port of the directional coupler is connected to a first measurement port of the radio frequency test instrument, and a coupling output port of the directional coupler is connected to a second measurement port of the radio frequency test instrument.
7. The system according to claim 6 , wherein the radio frequency test probe and/or the first pad is treated with nickel and gold plating.
8. The system according to claim 7 , wherein a center-to-center distance between the first pad and the second pad is not less than 0.254 millimeter and not greater than 2.54 millimeters.
9. A radio frequency conduction test apparatus, wherein the apparatus is in radio frequency conduction testing, and the apparatus comprises a radio frequency circuit, a first pad, and a second pad, wherein the radio frequency circuit comprises a radio frequency front-end circuit and a radio frequency back-end circuit, the first pad is connected to the radio frequency front-end circuit, the second pad is connected to the radio frequency back-end circuit, and the radio frequency front-end circuit and the radio frequency back-end circuit are in an off state; and the first pad and the second pad are pads for a serial device to be welded into the radio frequency circuit; and
during the radio frequency conduction test, the first pad is configured to transmit a test signal to a radio frequency test probe after the radio frequency test probe is moved to the first pad, wherein the test signal in the radio frequency test probe is transmitted to a radio frequency test instrument via an impedance conversion apparatus and a directional coupler, a straight-through output port of the directional coupler is connected to a first measurement port of the radio frequency test instrument, and a coupling output port of the directional coupler is connected to a second measurement port of the radio frequency test instrument.
10. The apparatus according to claim 9 , wherein the first pad is treated with nickel and gold plating.
11. The apparatus according to claim 9 , wherein a center-to-center distance between the first pad and the second pad is not less than 0.254 millimeter and not greater than 2.54 millimeters.