IP Library Granted Patent US 12,347,473
Granted Patent B2
US 12,347,473 · App. 18/839,178 · Granted Jul 1, 2025

Dielectric reproducing device and dielectric recording and reproducing device

Inventor: Yasuo Cho (Sendai, JP)
Assignee: TOHOKU UNIVERSITY
G11B9/02G11B9/1409
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,347,473
App. No.
18/839,178
Granted
Jul 1, 2025
Kind
B2
Abstract

A dielectric reproducing device and a dielectric recording and reproducing device that can improve the reproduction speed. A detection means is provided so as to be able to detect a polarization state of each bit 1 a corresponding to the data recorded in a data recording layer by relatively scanning the data recording layer made of a dielectric material. A heating means is provided so as to be able to heat the bit to be detected to a predetermined temperature while the detection means detects the polarization state. A reproducing means is provided so as to be able to reproduce the data based on the polarization state of each bit detected by the detection means.

Claims (42)

1. A dielectric reproducing device for reproducing data recorded on a data recording layer made of a dielectric material,

the data recording layer being capable of recording data based on a polarization state of each bit formed on the dielectric material, the dielectric reproducing device comprising:

a detection means provided to be able to detect a nonlinear dielectric constant due to the polarization state of each bit corresponding to the data by relatively scanning the data recording layer;

a heating means provided to be able to heat the bit to be detected to a predetermined temperature while the detection means detects the nonlinear dielectric constant due to the polarization state; and

a reproducing means provided to be able to reproduce the data based on the nonlinear dielectric constant due to the polarization state of each bit detected by the detection means.

2. The dielectric reproducing device according to claim 1 , wherein the heating means is configured to heat the bit in synchronization with a timing at which the detection means detects the nonlinear dielectric constant due to the polarization state of the bit to be detected.

3. The dielectric reproducing device according to claim 2 , wherein the heating means has an emission means for emitting a laser beam and a lens for focusing the laser beam emitted from the emission means, and is configured to heat the bit to be detected by irradiation with the laser beam focused by the lens.

4. The dielectric reproducing device according to claim 3 , further comprising a light absorbing layer provided on a side of the data recording layer opposite to a side on which the detection means scans relatively, wherein

the data recording layer is transparent to the laser beam.

5. The dielectric reproducing device according to claim 3 , wherein the laser beam has a wavelength shorter than an absorption edge of the dielectric material.

6. The dielectric reproducing device according to claim 2 , wherein

the detection means has a probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and

the heating means is capable of generating near-field light, is provided near the probe so as to be movable together with the probe, and is configured to be able to heat the bit to be detected by the near-field light.

7. The dielectric reproducing device according to claim 6 , further comprising a light absorbing layer provided on the side of the data recording layer opposite to the side on which the detection means is relatively scanned, wherein

the data recording layer is transparent to the near-field light.

8. The dielectric reproducing device according to claim 6 , wherein the near-field light has a wavelength shorter than an absorption edge of the dielectric material.

9. The dielectric reproducing device according to claim 2 , wherein

the detection means has a metal probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the nonlinear dielectric constant due to the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and

the heating means is provided so as to be capable of generating near-field light by irradiating the tip of the probe with a laser beam, and is configured to be able to heat the bit to be detected by the near-field light.

10. The dielectric reproducing device according to claim 2 , wherein the dielectric material is a ferroelectric material.

11. A dielectric recording and reproducing device, comprising:

the dielectric reproducing device according to claim 2 ; and

a recording means configured to record data on the data recording layer, wherein

the dielectric reproducing device is capable of reproducing the data recorded by the recording means.

12. The dielectric reproducing device according to claim 1 , wherein the heating means has an emission means for emitting a laser beam and a lens for focusing the laser beam emitted from the emission means, and is configured to heat the bit to be detected by irradiation with the laser beam focused by the lens.

13. The dielectric reproducing device according to claim 12 , further comprising a light absorbing layer provided on a side of the data recording layer opposite to a side on which the detection means scans relatively, wherein

the data recording layer is transparent to the laser beam.

14. The dielectric reproducing device according to claim 12 , wherein the laser beam has a wavelength shorter than an absorption edge of the dielectric material.

15. The dielectric reproducing device according to claim 1 , wherein

the detection means has a probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and

the heating means is capable of generating near-field light, is provided near the probe so as to be movable together with the probe, and is configured to be able to heat the bit to be detected by the near-field light.

16. The dielectric reproducing device according to claim 15 , further comprising a light absorbing layer provided on the side of the data recording layer opposite to the side on which the detection means is relatively scanned, wherein

the data recording layer is transparent to the near-field light.

17. The dielectric reproducing device according to claim 15 , wherein the near-field light has a wavelength shorter than an absorption edge of the dielectric material.

18. The dielectric reproducing device according to claim 1 , wherein

the detection means has a metal probe provided so as to be capable of relatively scanning the data recording layer, and is configured to detect the nonlinear dielectric constant due to the polarization state of the bit to be detected when a tip of the probe moves relatively to a position facing the bit, and

the heating means is provided so as to be capable of generating near-field light by irradiating the tip of the probe with a laser beam, and is configured to be able to heat the bit to be detected by the near-field light.

19. The dielectric reproducing device according to claim 1 , wherein the dielectric material is a ferroelectric material.

20. A dielectric recording and reproducing device, comprising:

the dielectric reproducing device according to claim 1 ; and

a recording means configured to record data on the data recording layer, wherein

the dielectric reproducing device is capable of reproducing the data recorded by the recording means.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 16, 2024
From: CHO, YASUO
To: TOHOKU UNIVERSITY
Reel/Frame 068312/0601 →
Priority Claims (2)
JP 2022-057716 · Mar 30, 2022 · national
WO PCT/JP2022/047554 · Dec 23, 2022 · international
Continuity (1)
Related Publication 20250166660A1 · May 22, 2025
References Cited (26)
US 20100231239A1 · Tateishi · 2010 [cited by examiner]
US 20110242961A1 · Umezawa · 2011 [cited by examiner]
US 20170099055A1 · Maksymovych · 2017 [cited by examiner]
JP H05182261A · 1993 [cited by applicant]
JP 2001344836A · 2001 [cited by applicant]
JP 2002133602A · 2002 [cited by applicant]
JP 2004127489A · 2004 [cited by applicant]
JP 2006268894A · 2006 [cited by applicant]
JP 2010020879A · 2010 [cited by applicant]
Kikitsu et al., “A concept of exchange-coupled recording medium for heat-assisted magnetic recording,” Journal of Applied Physics, 2005, vol. 97, 10P701. [cited by applicant]
Matsumoto et al., Thermally Assisted Magnetic Recording, Fujitsu, Jan. 2007, vol. 58, No. 1, pp. 85-89. [cited by applicant]
Yoshizawa et al., “Simulation Technology for Thermally-Assisted Magnetic Recording Media”, Fuji Times, 2009, vol. 82, No. 3, pp. 170-173. [cited by applicant]
Matsumoto et al., “Highly efficient probe with a wedge-shaped metallic plate for high density near-field optical recording,” Journal of Applied Physics, Apr. 15, 2004, vol. 95, No. 8, pp. 3901-3906. [cited by applicant]
Matsumoto et al., “Thermally assisted magnetic recording on a bit-patterned medium by using a near-field optical head with a beaked metallic plate,” Applied Physics Letters, 2008, vol. 93, 031108. [cited by applicant]
Challener et al., “Hear-assisted magnetic recording by a near-field transducer with efficient optical energy transfer,” Nature Photonics, Apr. 2009, vol. 3, pp. 220-224. [cited by applicant]
Stipe et al., “Magnetic recording at 1.5 Pbm-2 using an integrated plasmonic antenna,” Nature Photonics, Jul. 2010, vol. 4, pp. 484-488. [cited by applicant]
Matsumoto et al., “Integrated head design using a nanobeak antenna for thermally assisted magnetic recording,” Optics Express, Aug. 13, 2012, vol. 20, No. 17, pp. 18946-18954. [cited by applicant]
Matsumoto, Takuya, “Optical Near-Field Technology for Heat Assisted Magnetic Recording,” Optics, 2013, vol. 42, No. 1, pp. 26-31. [cited by applicant]
Cho, Yasuo, “Scanning Nonlinear Dielectric Microscopy”, Applied Physics, 1998, vol. 67, No. 3, pp. 327-331. [cited by applicant]
Tanaka et al., “Scanning Nonlinear Dielectric Microscopy Nano-Science and Technology for Next Generation High Density Ferroelectric Data Storage,” Japanese Journal of Applied Physics, 2008, vol. 4 7, No. 5, pp. 3311-332… [cited by applicant]
Tanaka et al., “Actual information storage with a recording density of 4 Tbit/in.2 in a ferroelectric recording medium,” Applied Physics Letters, 2010, vol. 97, 092901. [cited by applicant]
Hiranaga et al., “Nanodomain Formation on Ferroelectrics and Development of Hard-Disk-Drive-Type Ferroelectric Data Storage Devices,” Japanese Journal of Applied Physics, 2009, vol. 48, 09KA18. [cited by applicant]
Hiranaga et al., “Material Design Strategy for Enhancement of Readback Signal Intensity in Ferroelectric Probe Data Storage,” IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control, Mar. 2021, vol. 68, … [cited by applicant]
Odagawa et al., Long-term-retention characteristics of small inverted dots formed on congruent “Single-crystal LiTaO3,” Applied Physics Letters, 2006, vol. 89, 102906. [cited by applicant]
May 16, 2023 International Search Report issued in International Patent Application No. PCT/JP2023/009496. [cited by applicant]
May 16, 2023 Written Opinion of the International Searching Authority issued in International Patent Application No. PCT/JP2023/009496. [cited by applicant]