Granted Patent B2

US 12,352,792 · App. 18/169,732 · Granted Jul 8, 2025

Inventors: Wolfgang Wendler (Munich, DE); Gregor Feldhaus (Munich, DE); Florian Ramian (Munich, DE)

Assignee: Rohde & Schwarz GmbH & Co. KG

G01R23/16

Abstract

Claims (31)

1. A detector circuit for a measurement instrument, comprising:

a first signal input configured to receive a first complex-valued measurement signal associated with an input signal received from a device under test;

a second signal input configured to receive a second complex-valued measurement signal associated with the input signal received from the device under test; and

an averaging sub-circuit configured to determine a combined average of the first complex-valued measurement signal and of a complex conjugate of the second complex-valued measurement signal over a predetermined number of samples, thereby obtaining a complex-valued average signal;

wherein the averaging sub-circuit is configured to generate an output signal based on the complex-valued average signal, and

wherein the detector circuit is switchable between different detector modes, and wherein the detector modes comprise a cross correlation detector mode and one or several of the following detector modes: a sample detector mode, a minimum detector mode, a maximum detector mode, an auto peak detector mode, an average detector mode, and a root mean square detector mode.

2. The detector circuit of claim 1 , wherein the averaging sub-circuit is configured to determine an absolute value of the complex-valued average signal in order to generate the output signal, and/or wherein the averaging sub-circuit is configured to determine a real part of the complex-valued average signal in order to generate the output signal.

3. The detector circuit of claim 1 , wherein the first complex-valued measurement signal and the second complex-valued measurement signal are established as an IQ signal, respectively, and/or wherein the first complex-valued measurement signal and the second complex-valued measurement signal are established as a Fourier transformed signal, respectively.

4. The detector circuit according to claim 1 , wherein the predetermined number of samples is adjustable.

5. A measurement instrument comprising a detector circuit according to claim 1 .

6. The measurement instrument of claim 5 , further comprising a display configured to display the output signal of the detector circuit.

7. A signal processing circuit for a measurement instrument, comprising:

a detector circuit comprising

a first signal input configured to receive a first complex-valued measurement signal associated with an input signal received from a device under test;

a second signal input configured to receive a second complex-valued measurement signal associated with the input signal received from the device under test; and

an averaging sub-circuit configured to determine a combined average of the first complex-valued measurement signal and of a complex conjugate of the second complex-valued measurement signal over a predetermined number of samples, thereby obtaining a complex-valued average signal, wherein the averaging sub-circuit is configured to generate an output signal based on the complex-valued average signal;

a measurement input; and

two parallel measurement channels, wherein the two parallel measurement channels are each connected to the measurement input, such that an input signal received via the measurement input is forwarded to the two parallel measurement channels,

wherein a first one of the two parallel measurement channels is connected with the first signal input of the detector circuit and a second one of the two parallel measurement channels is connected with the second signal input of the detector circuit,

wherein the first one of the two parallel measurement channels is configured to process the input signal, thereby generating the first complex-valued measurement signal, and

wherein the second one of the two parallel measurement channels is configured to process the input signal, thereby generating the second complex-valued measurement signal.

8. The signal processing circuit of claim 7 , wherein the two parallel measurement channels are functionally identical.

9. The signal processing circuit of claim 7 , wherein the two parallel measurement channels each comprise an analog-to-digital converter.

10. The signal processing circuit according to claim 7 , wherein the two parallel measurement channels are synchronized.

11. The signal processing circuit according to claim 7 , wherein the two parallel measurement channels each comprise a mixer sub-circuit, wherein the mixer sub-circuits are configured to convert the input signal into an IQ signal, respectively.

12. The signal processing circuit according to claim 7 , wherein the two parallel measurement channels each comprise a resolution bandwidth filter.

13. The signal processing circuit according to claim 7 , wherein the two parallel measurement channels each comprise a Fourier transform unit, wherein the Fourier transform units each include circuitry configured to determine a Fourier transform of the respective signal processed in the respective measurement channel over a predetermined time interval.

14. The signal processing circuit of claim 13 , wherein the predetermined time interval is adjustable.

15. The signal processing circuit according to claim 7 , wherein the first signal input and the second signal input are selectively connectable to a measurement memory, and/or to the parallel measurement channels.

16. A measurement instrument comprising a signal processing circuit according to claim 5 .

17. The measurement instrument of claim 16 , further comprising a display configured to display the output signal of the detector circuit.

Assignments (1)

Priority Claims (1)

Continuity (1)

References Cited (10)