Circuits and techniques for predicting end of life based on in situ monitors and limit values defined for the in situ monitors
In some examples, a circuit comprises a function unit configured to perform a circuit function, and one or more in situ monitors configured to measure internal data associated with the circuit. The circuit may further comprise a memory configured to store one or more limit values associated with the one or more in situ monitors, and a lifetime model unit configured to determine whether the circuit has reached an end-of-life threshold based on the measured internal data from the one or more in situ monitors and the limit values.
1. A circuit configured to be used within a system, the circuit comprising:
a functional circuit that is configured to perform a circuit function;
one or more in situ monitors configured to measure internal data associated with the functional circuit, wherein the internal data measured by the one or more in situ monitors includes one or more of leakage current, a time of data arrival compared to a clock, failure counts, counts of error correction codes, delay drift, or frequency drift;
a memory configured to store one or more limit values associated with the one or more in situ monitors; and
a lifetime model unit implemented in circuitry and configured to determine whether the functional circuit has reached an end-of-life threshold based on the measured internal data from the one or more in situ monitors and the limit values, wherein the lifetime model unit includes a compare unit implemented in the circuitry and configured to compare the measured internal data to the one or more limit values, wherein the lifetime model unit is configured to determine whether the functional circuit has reached the end-of-life threshold based on the compare unit comparing the measured internal data to the one or more limit values stored in the memory, and wherein the lifetime model unit includes a message provider implemented in the circuitry and configured to output a system-level alert to another circuit of the system to cause replacement of the circuit within the system, in response to the lifetime model unit determining that the functional circuit has reached the end-of-life threshold, wherein the lifetime model unit is further configured to disable at least a portion of the circuit in response to identifying that the circuit has reached the end-of-life threshold.
2. The circuit of claim 1 , wherein the one or more in situ monitors are configured to measure the internal data under pre-defined operating conditions of the circuit.
3. The circuit of claim 2 , wherein the one or more in situ monitors are configured to measure the internal data during a start-up process associated with the circuit.
4. The circuit of claim 2 , wherein the one or more in situ monitors are configured to measure the internal data during a power-down process associated with the circuit.
5. The circuit of claim 2 , wherein the one or more in situ monitors are configured to measure the internal data during a periodic end-of-life check process for the circuit.
6. The circuit of claim 1 , wherein the limit values are defined based on an accelerated stress test that is performed on a subset of circuits during a manufacturing process of a set of circuits, wherein the subset is a representative portion of the set.
7. The circuit of claim 6 , wherein the accelerated stress test comprises an extended high temperature operating life (eHTOL) test.
8. The circuit of claim 1 , further comprising a data transfer unit configured to receive updates to the limit values, wherein the updates are based on other data associated with one or more other circuits that have failed during operation.
9. The circuit of claim 8 , further comprising an age tracker configured to track an age associated with the circuit,
wherein the data transfer unit is configured to communicate an age associated with the circuit and a status indication to an external computer in response to the circuit experiencing a fault.
10. The circuit of claim 1 , further comprising a data transfer unit configured to communicate the measured internal data from the one or more in situ monitors to an external computer in response to the lifetime model unit determining that the circuit has reached the end-of-life threshold.
11. The circuit of claim 1 , wherein functional circuit comprises one or more circuit units selected from a group consisting of:
a driver circuit;
a logic circuit;
a motor driver;
a driver circuit for driving a load;
an oscillator circuit;
a level shifter circuit;
a phase shift circuit;
a phase locked loop circuit;
an analog-to-digital converter circuit;
a digital-to-analog converter circuit;
an arithmetic logic unit (ALU);
a processor;
a microcontroller;
a digital signal processor (DSP);
a communication interface circuit;
a digital logic circuit;
a state machine;
a signal processing circuit;
a control circuit;
an analog circuit;
a memory circuit; or
a sensor.
12. A method of operating a circuit within a system, the method comprising:
storing one or more limit values in a memory associated with the circuit;
performing a circuit function via the circuit;
measuring internal data of the circuit via one or more in situ monitors, wherein the one or more limit values are defined for the one or more in situ monitors, and wherein the internal data measured by the one or more in situ monitors includes one or more of leakage current, a time of data arrival compared to a clock, failure counts, counts of error correction codes, delay drift, or frequency drift;
determining whether the circuit has reached an end-of-life threshold based on the measured internal data from the one or more in situ monitors and the limit values stored in the memory, wherein determining whether the circuit has reached an end-of-life threshold includes comparing the measured internal data to the one or more limit values;
outputting a system-level alert to another circuit of the system to cause replacement of the circuit within the system, in response to determining that the circuit has reached the end-of-life threshold; and
disabling at least a portion of the circuit in response to identifying that the circuit has reached the end-of-life threshold.
13. The method of claim 12 , wherein the limit values are defined based on an accelerated stress test that is performed on a subset of circuits during a manufacturing process of a set of circuits, wherein the subset is a representative portion of the set.
14. The method of claim 12 , further comprising:
receiving updates to the limit values from an external computer, wherein the updates are based on other data associated with one or more other circuits that have failed during operation.
15. The method of claim 12 , further comprising:
communicating an age associated with the circuit and a status indication to the external computer in response to the circuit experiencing a fault.
16. The method of claim 12 , further comprising:
communicating the measured internal data from the one or more in situ monitors to an external computer in response to determining that the circuit has reached the end-of-life threshold.
17. The method of claim 12 , wherein measuring the internal data via the one or more in situ monitors comprises:
measuring the internal data under pre-defined operating conditions;
measuring the internal data during a start-up process;
measuring the internal data during a power-down process; or
measuring the internal data during a periodic end-of-life check process.
18. A circuit comprising:
a function unit configured to perform a circuit function;
one or more in situ monitors configured to measure internal data associated with the circuit, wherein the internal data measured by the one or more in situ monitors includes one or more of leakage current, a time of data arrival compared to a clock, failure counts, counts of error correction codes, delay drift, or frequency drift;
a memory configured to store one or more limit values associated with the one or more in situ monitors; and
a lifetime model unit configured to determine whether the circuit has reached an end-of-life threshold based on the measured internal data from the one or more in situ monitors and the limit values, wherein the lifetime model unit is configured to disable at least a portion of the circuit in response to identifying that the circuit has reached the end-of-life threshold.