IP Library › Granted Patent US 12,352,988
Granted Patent B2
US 12,352,988 · App. 17/329,955 · Granted Jul 8, 2025

Gradient encapsulation of waveguide gratings

Inventors: David Sell (Santa Clara, CA); Brian Alexander Cohen (Delmar, NY)
Assignee: APPLIED MATERIALS, INC.
G02B5/1857G02B5/1819G02B27/0172
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,352,988
App. No.
17/329,955
Granted
Jul 8, 2025
Kind
B2
Abstract

Gradient encapsulation of waveguide outcoupler gratings for control of diffraction efficiency and directionality includes a first grating formed over a substrate, the first grating having a plurality of first structures extending away from the substrate, the first grating corresponding to an outcoupler. The device includes a first encapsulant disposed in one or more gaps formed between adjacent first structures, where a fill ratio of the first encapsulant decreases along the first grating. Also described herein are methods for fabricating the device.

Claims (35)

1. A device comprising:

a first grating formed on a surface of a substrate, the first grating having a plurality of first structures slanted in a first direction at a slant angle relative to normal to the surface of the substrate, the first grating corresponding to an outcoupler; and

a first encapsulant disposed in one or more gaps formed between adjacent first structures, wherein a fill ratio of the first encapsulant decreases from 1 to 0 along the first grating in the first direction.

2. The device of claim 1 , wherein the first encapsulant has a refractive index contrast of about 0.2 or less relative to the first grating.

3. The device of claim 1 , wherein the first encapsulant has a refractive index of from about 1.8 to about 2.2.

4. The device of claim 1 , wherein the first encapsulant includes one or more of polyimides, polyimide blends, or metal-organic polyimide blends.

5. The device of claim 1 , wherein the fill ratio decreases linearly.

6. The device of claim 1 , wherein the fill ratio decreases stepwise.

7. The device of claim 1 , wherein the fill ratio decreases non-linearly.

8. The device of claim 1 , further comprising a second grating formed over the substrate, the second grating having a plurality of second structures extending away from the substrate, the second grating corresponding to an incoupler.

9. A device comprising:

a first grating formed on a first surface of a substrate, the first grating having a plurality of first structures slanted in a first direction at a first slant angle relative to normal to the first surface of the substrate, the first grating corresponding to an outcoupler;

a first encapsulant disposed in one or more first gaps formed between adjacent first structures, wherein a fill ratio of the first encapsulant decreases from 1 to 0 along the first grating in the first direction; and

a second grating formed on a second surface of the substrate, the second grating having a plurality of second structures slanted in a second direction at a second slant angle relative to normal to the second surface of the substrate, the second grating corresponding to an incoupler.

10. The device of claim 9 , wherein the first encapsulant is disposed in one or more second gaps formed between adjacent second structures.

11. The device of claim 9 , wherein the first surface and the second surface are each a frontside of the substrate.

12. The device of claim 9 , wherein the first surface is a frontside of the substrate, and the second surface is a backside of the substrate facing opposite the frontside.

13. The device of claim 12 , further comprising a second encapsulant disposed over the backside of the substrate, wherein the second encapsulant is disposed in one or more second gaps formed between adjacent second structures.

14. A method, comprising:

forming a first grating on a first surface of a substrate, the first grating having a plurality of first structures slanted in a first direction at a first slant angle relative to normal to the first surface of the substrate, the first grating corresponding to an outcoupler;

forming a second grating on a second surface of the substrate, the second grating having a plurality of second structures slanted in a second direction at a second slant angle relative to normal to the second surface of the substrate, the second grating corresponding to an incoupler;

depositing a first encapsulant over the first and second gratings;

curing the first encapsulant;

forming a patterned photoresist layer over the first and second gratings;

etching the first encapsulant via the patterned photoresist layer, wherein a fill ratio of the first encapsulant decreases from 1 to 0 along the first grating in the first direction; and

depositing a global encapsulant over the first and second gratings.

15. The method of claim 14 , further comprising:

depositing a first hardmask layer over the cured first encapsulant; and

forming a patterned second hardmask layer over the first hardmask layer.

16. The method of claim 15 , further comprising:

removing the first hardmask layer over the first grating; and

etching the first encapsulant over the first grating using one of the patterned second hardmask layer or the first hardmask layer as an etch mask.

17. The method of claim 14 , wherein forming the patterned photoresist layer comprises performing a gray-scale lithography process.

18. The method of claim 14 , wherein etching the first encapsulant via the patterned photoresist layer comprises transferring a profile of the patterned photoresist layer to the first encapsulant.

19. The method of claim 14 , wherein the first grating is formed on a frontside of the substrate, wherein the first encapsulant is deposited on the frontside, and wherein the second grating is formed on a backside of the substrate facing opposite the frontside, further comprising depositing a second encapsulant on the backside.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 3, 2021
From: SELL, DAVID; COHEN, BRIAN ALEXANDER
To: APPLIED MATERIALS, INC.
Reel/Frame 056427/0621 →
Continuity (2)
Provisional Application 63034316 · Jun 3, 2020
Related Publication 20210382212A1 · Dec 9, 2021
References Cited (37)
US 6545808B1 · Ehbets · 2003 [cited by examiner]
US 20020135876A1 · Holm et al. · 2002 [cited by applicant]
US 20060147679A1 · Edlinger et al. · 2006 [cited by applicant]
US 20160033784A1 · Levola et al. · 2016 [cited by applicant]
US 20160301188A1 · Mathai et al. · 2016 [cited by applicant]
US 20180052501A1 · Jones, Jr. · 2018 [cited by examiner]
US 20190056591A1 · Tervo et al. · 2019 [cited by applicant]
US 20190121023A1 · Tervo · 2019 [cited by applicant]
US 20190258008A1 · Hautala et al. · 2019 [cited by applicant]
US 20190324202A1 · Colburn et al. · 2019 [cited by applicant]
US 20200033530A1 · Colburn · 2020 [cited by examiner]
US 20200064553A1 · Frish · 2020 [cited by applicant]
US 20200110205A1 · Rahomäki et al. · 2020 [cited by applicant]
US 20200110206A1 · Rahomaki · 2020 [cited by examiner]
US 20210191122A1 · Yaroshchuk · 2021 [cited by examiner]
US 20210199971A1 · Lee · 2021 [cited by examiner]
CN 105549150B · 2019 [cited by applicant]
CN 109997063A · 2019 [cited by applicant]
EP 0960347A1 · 1999 [cited by applicant]
JP 2001511906A · 2001 [cited by applicant]
JP 2010072401A · 2010 [cited by applicant]
KR 102113434B1 · 2020 [cited by applicant]
KR 20200056146A · 2020 [cited by applicant]
TW 1480605B · 2015 [cited by applicant]
TW 201814337A · 2018 [cited by applicant]
TW 202017042A · 2020 [cited by applicant]
WO 2018126760A1 · 2018 [cited by applicant]
WO 2018220270A1 · 2018 [cited by applicant]
Mao et al (A Terahertz polarizer based on multilayer metal grating filled in polyimide film, IEEE Photonics journal, vol. 8, No. 1, pp. 1-7, Feb. 2016). (Year: 2016). [cited by examiner]
Taiwan Office Action dated Aug. 14, 2024 for Application No. 112146796. [cited by applicant]
European Search Report issued to patent application No. 21817821.8 on Jun. 6, 2024. [cited by applicant]
Japanese Office Action issued to Patent Application No. 2022-574187 on Dec. 19, 2023. [cited by applicant]
Taiwan Office Action issued to Application No. 110119344 on Jun. 16, 2023. [cited by applicant]
International Search Report dated Sep. 15, 2021 for Application No. PCT/US2021/034040. [cited by applicant]
Japanese Office Action dated Sep. 3, 2024 for Application No. 2022-574187. [cited by applicant]
Korean Office Action dated Dec. 2, 2024 for Application No. 10-2022-7046188. [cited by applicant]
Japanese Office Action dated Mar. 10, 2025 for Application No. 2022-574187. [cited by applicant]
Cited By (1)
US 12,710,579