IP Library › Granted Patent US 12,361,094
Granted Patent B2
US 12,361,094 · App. 17/281,228 · Granted Jul 15, 2025

Training data generation device and training data generation program

Inventor: Sachihiro Nakagawa (Nagaoka, JP)
Assignee: SYSTEM SQUARE INC.
G06F18/214G06N20/00G06T7/001G06T2207/10116
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Quick Facts
Patent No.
US 12,361,094
App. No.
17/281,228
Granted
Jul 15, 2025
Kind
B2
Abstract

A training data generation device generates training data usable in machine learning. A learned model using the training data generated by the training data generation device is used in an inspection device for determining whether an inspection target is a normal product by inputting an image capturing the inspection target into the learned model. The training data generation device includes: a determination-target image extraction unit that extracts, from an input image, one or more determination-target images containing a determination target that satisfies a predetermined condition; a sorting unit that associates, on the basis of sorting the inspection target captured in the determination-target image, each of the determination-target images and a result of the sorting with each other; and a training data memory unit that stores training data in which each of the determination-target images and a result of the sorting are associated with each other.

Claims (41)

1. A training data generation device generating training data to be used in machine learning, a learned model generated by the machine learning using the training data being used in an inspection device that performs inspection for determining whether or not an inspection target is a normal product by inputting an image capturing the inspection target into the learned model, the training data generation device comprising:

a feed unit configured to sequentially feed a plurality of inspection targets, including the inspection target, through an inspection area;

a detector configured to detect a spatial distribution of the electromagnetic waves that reach the detector through the inspection area, the detector including either a line sensor or a Time Delay Integration (TDI) sensor;

an image construction unit configured to construct electromagnetic-wave intensity contrast distribution as an image of the inspection target fed by the feed unit, while the feed unit sequentially feeds the plurality of inspection targets;

a determination-target image extraction unit configured to extract, from an input image capturing the inspection target, one or more determination-target images containing a determination target that satisfies a predetermined condition, using the image of the inspection target constructed by the image construction unit as the input image;

a sorting unit configured to associate, on the basis of a sorting operation of sorting the inspection target captured in the determination-target image into either a normal product or a non-normal product, each of the determination-target images and a result of the sorting with each other; and

a training data memory unit configured to store training data in which each of the determination-target images and a result of the sorting are associated with each other, wherein

the determination-target image extraction unit comprises:

an image processing unit configured to perform image processing on the input image and outputs a processed image;

a determination-target identification unit configured to identify the determination target contained in the processed image on the basis of a predetermined determination condition; and

an image cutting-out unit configured to cut out and output, from the processed image, the determination-target image containing the determination target identified by the determination-target identification unit, and

the image cutting-out unit is configured to

identify a minimum rectangle containing the determination target identified by the determination-target identification unit, and

output, as the determination-target image, an image obtained by scaling an image contained in the minimum rectangle to a predetermined size.

2. The training data generation device according to claim 1 , wherein

the determination-target image extraction unit is configured to

normalize the brightness of the determination-target image and

output the determination-target image.

3. The training data generation device according to claim 1 , wherein

the training data generation device further comprises:

a display; and

a display control unit configured to control display performed by the display, and wherein

the display control unit is configured to

cause a first area of the display to display a plurality of the determination-target images in sequence and

cause a second area of the display to display the input image with an indication of an area corresponding to the determination-target image being superimposed on the input image.

4. The training data generation device according to claim 3 , wherein,

in response to one of the plurality of determination-target images displayed in the first area of the display being selected, the display control unit is configured to cause an indication of an area corresponding to the selected determination-target image to be displayed in the input image displayed in the second area of the display.

5. A non-transitory computer-readable storage medium storing a computer program for causing a computer executing the computer program to be configured as a training data generation device for generating training data to be used in machine learning, a learned model generated by the machine learning using the training data being used in an inspection device that performs inspection for determining whether or not an inspection target is a normal product by inputting an image capturing the inspection target into the learned model, the training data generation device comprising:

a feed unit configured to sequentially feed a plurality of inspection targets, including the inspection target, through an inspection area;

a detector configured to detect a spatial distribution of the electromagnetic waves that reach the detector through the inspection area, the detector including either a line sensor or a Time Delay Integration (TDI) sensor;

an image construction unit configured to construct electromagnetic-wave intensity contrast distribution as an image of the inspection target fed by the feed unit, while the feed unit sequentially feeds the plurality of inspection targets;

a determination-target image extraction unit configured to extract, from an input image capturing the inspection target, one or more determination-target images containing a determination target that satisfies a predetermined condition, using the image of the inspection target constructed by the image construction unit as the input image;

a sorting unit configured to associate, on the basis of a sorting operation of sorting the inspection target captured in the determination-target image into either a normal product or a non-normal product, each of the determination-target images and a result of the sorting with each other; and

a training data memory unit configured to store training data in which each of the determination-target images and a result of the sorting are associated with each other, wherein

the determination-target image extraction unit comprises:

an image processing unit configured to perform image processing on the input image and outputs a processed image;

a determination-target identification unit configured to identify the determination target contained in the processed image on the basis of a predetermined determination condition; and

an image cutting-out unit configured to cut out and output, from the processed image, the determination-target image containing the determination target identified by the determination-target identification unit, and

the image cutting-out unit is configured to

identify a minimum rectangle containing the determination target identified by the determination-target identification unit, and

output, as the determination-target image, an image obtained by scaling an image contained in the minimum rectangle to a predetermined size.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2021
From: NAKAGAWA, SACHIHIRO
To: SYSTEM SQUARE INC.
Reel/Frame 055759/0957 →
Priority Claims (1)
JP 2018-186778 · Oct 1, 2018 · national
Continuity (1)
Related Publication 20220067434A1 · Mar 3, 2022
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