Ranging apparatus and measuring apparatus
A ranging apparatus includes a photodetector including a light detecting device, a time measuring section for measuring a period of time from an emission timing at which a light source emits light to a detection timing at which the light detecting device detects the light, thereby acquiring measured values, a generating section for generating a histogram of the measured values, and a calculating section for calculating the distance up to a measurand on the basis of the histogram. The generating section generates the histogram on the basis of plural measuring conditions.
1. A ranging apparatus, comprising:
a photodetector including a light detecting device;
a time measuring section configured to measure a period of time from an emission timing to a detection timing, wherein
the period of time is measured to acquire measured values,
the emission timing is a timing at which a light source emits light to the detection timing, and
the detection timing is a timing at which the light detecting device detects the light;
a generating section configured to generate a histogram of the measured values, wherein
the histogram is generated based on a plurality of measuring conditions regarding the period of time,
the generation is in each of periods that are designated respectively as the measuring conditions and during which the time measuring section has measured and acquired the measured values, and
the histogram is generated for each of periods into which an exposure period in the photodetector is divided, and in periods including overlapped portions with respect to the divided exposure period; and
a calculating section configured to calculate a distance up to a measurand based on the histogram.
2. The ranging apparatus according to claim 1 , wherein
the generating section is further configured to generate the histogram based on a count of the measured values, wherein the count is based on a unit times having lengths that depends on periods of times from the emission timing to the periods that are designated respectively as the measuring conditions.
3. The ranging apparatus according to claim 1 , wherein
the generating section is further configured to generate the histogram of the measured values that are measured and acquired based on measuring conditions designated from the plurality of measuring conditions based on the measured values that are measured and acquired throughout the exposure period in the photodetector.
4. The ranging apparatus according to claim 1 , wherein
the generating section is further configured to generate the histogram for each of the plurality of measuring conditions by using the plurality of measuring conditions in a specific sequence.
5. The ranging apparatus according to claim 1 , wherein
the generating section is further configured to generate the histogram for each of the plurality of measuring conditions, wherein the plurality of measuring conditions are included in a pattern selected from a plurality of patterns including a combination of the plurality of measuring conditions that are different from each other.
6. The ranging apparatus according to claim 5 , wherein
the generating section is further configured to generate the histogram for each of the plurality of measuring conditions, wherein the plurality of measuring conditions are included in a pattern selected from a plurality of patterns based on the histogram.
7. The ranging apparatus according to claim 1 , further comprising:
a storing section configured to store information to set the plurality of measuring conditions, wherein at least the generating section, the calculating section, and the storing section among the photodetector, the time measuring section, the generating section, the calculating section, and the storing section are fabricated on one semiconductor chip.
8. A measuring apparatus, comprising:
a photodetector including a light detecting device;
a time measuring section configured to measure a period of time from an emission timing to a detection timing, wherein
the period of time is measured to acquire measured values,
the emission timing is a timing at which a light source emits light to the detection timing, and
the detection timing is a timing at which the light detecting device detects the light; and
a generating section configured to generate a histogram of the measured values, wherein
the histogram is generated based on a plurality of measuring conditions regarding the period of time,
the generation is in each of periods that are designated respectively as the measuring conditions and during which the time measuring section has measured and acquired the measured values, and
the histogram is generated for each of periods into which an exposure period in the photodetector is divided, and in periods including overlapped portions with respect to the divided exposure period.
9. The measuring apparatus according to claim 8 , wherein
the generating section is further configured to generate the histogram based on a count of the measured values, wherein the count is based on unit times having lengths that depends periods of times from the emission timing to the periods that are designated respectively as the measuring conditions.
10. The measuring apparatus according to claim 8 , wherein
the generating section is further configured to generate the histogram of the measured values that are measured and acquired based on measuring conditions designated from the plurality of measuring conditions on based on the measured values that are measured and acquired throughout the exposure period in the photodetector.
11. The measuring apparatus according to claim 8 , wherein
the generating section is further configured to generate the histogram for each of the plurality of measuring conditions, wherein the plurality of measuring conditions by using the plurality of measuring conditions in a specific sequence.
12. The measuring apparatus according to claim 8 , wherein
the generating section is further configured to generate the histogram for each of the plurality of measuring conditions, wherein the plurality of measuring conditions are included in a pattern selected from a plurality of patterns including a combination of the plurality of measuring conditions that are different from each other.
13. The measuring apparatus according to claim 12 , wherein
the generating section is further configured to generate the histogram for each of the plurality of measuring conditions, wherein the plurality of measuring conditions are included in a pattern selected from the plurality of patterns based on the histogram.
14. The measuring apparatus according to claim 8 , further comprising:
a storing section configured to store information to set the plurality of measuring conditions, wherein at least the generating section and the storing section among the photodetector, the time measuring section, the generating section, and the storing section are fabricated on one semiconductor chip.