Probe pin
A probe pin for testing a target object, comprises a body portion of which a lower end is connected to a substrate and extends in a vertical direction and an upper end is to be in contact with a target object; and a housing provided to surround at least a part of the body portion and configured to support the body portion, wherein the body portion includes: a tip portion to be in contact with the target object; a spring portion extending from the tip portion and supplying an elastic force to the body portion in the vertical direction; and a connection portion extending from the spring portion and connected to the substrate.
1. A probe pin for testing a target object, comprising:
a body portion of which a lower end is connected to a substrate and extends in a vertical direction and an upper end configured to be in contact with the target object;
a housing provided to surround at least a part of the body portion and configured to support the body portion,
wherein the body portion includes:
a tip portion to be in contact with the target object;
a spring portion extending from the tip portion and supplying an elastic force to the body portion in the vertical direction,
an upper protrusion provided on a side surface of the tip portion and protruding toward the housing, and
a lower protrusion provided on a side surface of the connection portion and protruding toward the housing;
wherein the housing includes:
an upper opening that accommodates the upper protrusion, and
a lower opening that accommodates the lower protrusion;
wherein further
the upper opening is greater in length in a longitudinal direction of the probe pin than the upper protrusion,
the lower opening is greater in length in the longitudinal direction of the probe pin than the lower protrusion, and
the upper opening is greater in length than the lower opening; and
a connection portion extending from the spring portion and connected to the substrate.
2. The probe pin of claim 1 , wherein the housing further includes:
a plurality of through-slits formed in at least one surface thereof.
3. The probe pin of claim 1 , wherein
the tip portion includes a contact surface provided on its upper surface, and
the contact surface has a shape of a plurality of triangular prisms and base sides of the plurality of triangular prisms extend from a side surface of the tip portion.
4. The probe pin of claim 1 , wherein the spring portion includes:
a first spring extending from a lower surface of the tip portion;
a second spring extending from the lower surface of the tip portion and spaced apart from the first spring; and
a separation wall provided between the first spring and the second spring.
5. The probe pin of claim 4 , wherein the separation wall is smaller in length in a longitudinal direction of the probe pin than the first spring or the second spring before the first spring or the second spring is deformed.
6. The probe pin of claim 4 , wherein before the first spring or the second spring is deformed, an end of the separation wall is spaced apart from an upper surface of the connection portion.