IP Library › Granted Patent US 12,381,180
Granted Patent B2
US 12,381,180 · App. 18/354,632 · Granted Aug 5, 2025

Multi-chip packages and methods of forming the same

Inventors: Shuo-Mao Chen (New Taipei, TW); Feng-Cheng Hsu (New Taipei, TW); Han-Hsiang Huang (Pingtung County, TW); Hsien-Wen Liu (Hsinchu, TW); Shin-Puu Jeng (Hsinchu, TW); Hsiao-Wen Lee (Hsinchu, TW)
Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
H01L25/0652H01L21/568H01L21/6835H01L23/5383H01L25/16H01L25/50H01L23/3128H01L2221/68345H01L2221/68359H01L2225/06517H01L2225/06548
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,381,180
App. No.
18/354,632
Granted
Aug 5, 2025
Kind
B2
Abstract

Multi-chip wafer level packages and methods of forming the same are provided. A multi-chip wafer level package includes a first tier and a second tier. The first tier includes a first redistribution layer structure and at least one chip over the first redistribution layer structure. The second tier includes a second redistribution layer structure and at least two other chips over the second redistribution layer structure. The first tier is bonded to the second tier with the at least one chip being in physical contact with the second redistribution layer structure. The total number of connectors of the at least two other chips is greater than the total number of connectors of the at least one chip.

Claims (42)

1. A package, comprising:

at least one first chip disposed over a first side of a first redistribution layer structure and comprising first connectors protruding from a first surface of the at least one first chip;

a first encapsulation layer laterally encapsulating the at least one first chip and in contact with the first connectors of the at least one first chip; and

at least one second chip disposed over and electrically connected to the at least one first chip, wherein the at least one second chip comprises second connectors protruding from a second surface of the at least one second chip, and the first surface faces the second surface,

wherein a projection dimension of the at least one first chip on the first redistribution layer is less than and falls within a projection dimension of the at least one second chip on the first redistribution layer, and

wherein the at least one first chip comprises multiple first chips, the at least one second chip comprises multiple second chips, and an interposer is disposed between the first chips and partially overlapped with the second chips in a cross-sectional view.

2. The package of claim 1 , further comprising:

a second redistribution layer structure disposed between and electrically connected to the at least one first chip and the at least one second chip.

3. The package of claim 2 , wherein the first redistribution layer structure extends laterally beyond the second redistribution layer structure.

4. The package of claim 2 , wherein an edge of the second redistribution layer structure is substantially aligned to an edge of the first redistribution layer structure.

5. The package of claim 2 , further comprising:

an underfill layer disposed to fill a space between the second redistribution layer structure and the at least one second chip, and the underfill layer is in contact with the second redistribution layer structure.

6. The package of claim 1 , further comprising a second encapsulation layer encapsulating the at least one second chip.

7. The package of claim 6 , wherein the second encapsulation layer is in contact with the first encapsulation layer.

8. The package of claim 6 , wherein the second encapsulation layer is separated from the first encapsulation layer.

9. The package of claim 1 , further comprising:

at least one third chip disposed over and connected to pads of the first redistribution layer structure and aside the at least one first chip.

10. The package of claim 9 , wherein the at least one third chip comprises an integrated passive device.

11. The package of claim 1 , wherein the at least one second chip comprises an active integrated device chip.

12. The package of claim 1 , further comprising:

bumps disposed over a second side of the first redistribution layer structure opposite to the first side.

13. A package, comprising:

first chips disposed over and electrically connected to a first conductive structure;

a second conductive structure disposed over the first chips;

second chips disposed over and electrically connected to the second conductive structure, and corresponding to the first chips; and

at least one third chip disposed over and electrically connected to the first conductive structure and outside of the first chips,

wherein a top surface of the at least one third chip is higher than a top surface of the second conductive structure, and

wherein the package further comprises an interposer disposed between the first chips and partially overlapped with the second chips in a cross-sectional view.

14. The package of claim 13 , wherein the at least one third chip is connected to pads of the first conductive structure.

15. The package of claim 13 , wherein each first chip comprises connectors protruding from a front side of the first chip, and the connectors are in contact with the second conductive structure.

16. The package of claim 15 , further comprising:

a first encapsulation layer laterally encapsulating the first chips and in contact with the connectors of the first chips.

17. A method of forming a package, comprising:

forming at least one first chip over a first side of a first redistribution layer structure, wherein the at least one first chip has first connectors protruding from a first surface of the at least one first chip;

forming a first encapsulation layer laterally encapsulating the at least one first chip and in contact with the first connectors of the at least one first chip; and

forming at least one second chip over and electrically connected to the at least one first chip, wherein the at least one second chip comprises second connectors protruding from a second surface of the at least one second chip, and the first surface faces the second surface, and

wherein a projection dimension of the at least one first chip on the first redistribution layer is less than and falls within a projection dimension of the at least one second chip on the first redistribution layer, and

wherein the at least one first chip comprises multiple first chips, the at least one second chip comprises multiple second chips, and an interposer is disposed between the first chips and partially overlapped with the second chips in a cross-sectional view.

18. The method of claim 17 , further comprising:

forming a second encapsulation layer encapsulating the at least one second chip.

19. The method of claim 18 , wherein the second encapsulation layer is in contact with the first encapsulation layer.

20. The method of claim 18 , wherein the second encapsulation layer is separated from the first encapsulation layer.

Continuity (4)
Continuation 17726545 · Apr 22, 2022
Continuation 17006863 · Aug 30, 2020
Continuation 15795276 · Oct 27, 2017
Related Publication 20230369287A1 · Nov 16, 2023
References Cited (19)
US 8802504B1 · Hou et al. · 2014 [cited by applicant]
US 8803292B2 · Chen et al. · 2014 [cited by applicant]
US 8803316B2 · Lin et al. · 2014 [cited by applicant]
US 8993380B2 · Hou et al. · 2015 [cited by applicant]
US 9281254B2 · Yu et al. · 2016 [cited by applicant]
US 9299649B2 · Chiu et al. · 2016 [cited by applicant]
US 9372206B2 · Wu et al. · 2016 [cited by applicant]
US 9425126B2 · Kuo et al. · 2016 [cited by applicant]
US 9443783B2 · Lin et al. · 2016 [cited by applicant]
US 9496189B2 · Yu et al. · 2016 [cited by applicant]
US 20110278717A1 · Pagaila et al. · 2011 [cited by applicant]
US 20120146209A1 · Hu · 2012 [cited by examiner]
US 20140185264A1 · Chen · 2014 [cited by examiner]
US 20150179570A1 · Marimuthu et al. · 2015 [cited by applicant]
US 20160300817A1 · Do · 2016 [cited by examiner]
US 20170062383A1 · Yee · 2017 [cited by examiner]
US 20180076179A1 · Hsu · 2018 [cited by examiner]
US 20180102311A1 · Shih · 2018 [cited by examiner]
“Notice of allowance of China Counterpart Application”, issued on Feb. 17, 2025, p. 1-p. 4. [cited by applicant]
Cited By (1)
US 12,740,450