IP Library › Granted Patent US 12,388,006
Granted Patent B2
US 12,388,006 · App. 17/836,251 · Granted Aug 12, 2025

Capacitor and airgap structure

Inventors: Chun-I Hsieh (Singapore, SG); Ee Jan Khor (Singapore, SG); Wei-Hui Hsu (Singapore, SG); Wanbing Yi (Singapore, SG); Juan Boon Tan (Singapore, SG)
Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
H01L23/5223H01L21/76802H01L21/7682H01L23/528
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Quick Facts
Patent No.
US 12,388,006
App. No.
17/836,251
Granted
Aug 12, 2025
Kind
B2
Abstract

The present disclosure relates to semiconductor structures and, more particularly, to capacitor structures and methods of manufacture. The structure includes: an airgap provided within a dielectric material; an insulator material across a top of the airgap and on a surface of the dielectric material; and a capacitor provided within the dielectric material and lined with the insulator material.

Claims (29)

1. A structure comprising:

an airgap provided within a dielectric material;

an insulator material across a top of the airgap and on a surface of the dielectric material;

a capacitor provided within the dielectric material and lined with the insulator material; and

a U-shaped insulator material over a top plate of the capacitor, and a contact extending within the U-shaped insulator material to contact the top plate of the capacitor.

2. The structure of claim 1 , wherein the insulator material lines sidewalls of the airgap.

3. The structure of claim 1 , wherein the insulator material is over a liner material which is on the dielectric material.

4. The structure of claim 3 , wherein the capacitor extends through the liner material.

5. The structure of claim 3 , wherein a top surface of the capacitor is devoid of the liner material.

6. The structure of claim 3 , wherein the capacitor includes a bottom plate, a top plate and an insulator material between the top plate and the bottom plate, the bottom plate having a height extending above a surface of the liner material.

7. A structure comprising:

an airgap provided within a dielectric material;

an insulator material across a top of the airgap and on a surface of the dielectric material; and

a capacitor provided within the dielectric material and lined with the insulator material, wherein the capacitor comprises a bottom plate, a top plate and an insulator material between the top plate and the bottom plate, each of which are aligned with a trench in the dielectric material and which do not extend laterally over an upper surface of the insulator material.

8. The structure of claim 7 , further comprising a wiring structure within the dielectric material and a liner material over the wiring structure and under the insulator material.

9. The structure of claim 8 , wherein the bottom plate of the capacitor does not extend below the wiring structure.

10. The structure of claim 8 , wherein the bottom plate of the capacitor has a height that exceeds a combination of the wiring structure and the liner material.

11. The structure of claim 8 , wherein the bottom plate and the top plate of the capacitor do not extend laterally over the liner material.

12. A structure comprising:

an airgap structure within a dielectric material;

a wiring structure within the dielectric material;

a liner over the dielectric material and wiring structure; and

a capacitor within the dielectric material, the capacitor having a height greater than a combined height of the wiring structure and the liner; and

insulator material that lines and extends over the airgap structure.

13. The structure of claim 12 , wherein the insulator material is under the capacitor and extends onto a surface of the liner.

14. The structure of claim 12 , wherein the capacitor comprises a bottom plate, an insulator layer and a top plate, each of which has a surface planar with the insulator material.

15. The structure of claim 14 , wherein the capacitor has a height greater than a combined height of the wiring structure and the liner.

16. The structure of claim 12 , wherein a top surface of the capacitor is devoid of the liner.

17. The structure of claim 12 , wherein a bottom plate of the capacitor is at or above a bottom surface of the wiring structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 9, 2022
From: HSIEH, CHUN-I; KHOR, EE JAN; HSU, WEI-HUI; YI, WANBING; TAN, JUAN BOON
To: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
Reel/Frame 060150/0406 →
Continuity (1)
Related Publication 20230402365A1 · Dec 14, 2023
References Cited (5)
US 9252204B2 · Adkisson et al. · 2016 [cited by applicant]
US 10032711B2 · Basker et al. · 2018 [cited by applicant]
US 10373905B2 · Basker et al. · 2019 [cited by applicant]
US 20180233446A1 · Basker · 2018 [cited by examiner]
Klootwijk et al., “Ultrahigh Capacitance Density for Multiple ALD-Grown MIM Capacitor Stacks in 3-D Silicon”, IEEE Electron Device Letters, vol. 29, No. 7, Jul. 2008, Abstract, 3 pages. [cited by applicant]