IP Library › Granted Patent US 12,390,932
Granted Patent B2
US 12,390,932 · App. 17/792,043 · Granted Aug 19, 2025

Robot calibration device

Inventor: Takeshi Hasuo (Yamanashi, JP)
Assignee: FANUC CORPORATION
B25J9/1692B25J9/10
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,390,932
App. No.
17/792,043
Granted
Aug 19, 2025
Kind
B2
Abstract

A calibration device for a robot including a linear motion shaft moves a slider along one straight line with respect to a base, and an end shaft supported so as to be rotatable about a rotation axis with respect to the slider includes: a first calibration fixture fixed to the end shaft; and a second calibration fixture fixed to the base. The first calibration fixture includes a first calibration surface formed of a plane containing the rotation axis or a flat surface parallel to the plane, and a second calibration surface that does not change even when the first calibration fixture alone rotates about the rotation axis. The second calibration fixture detects a position of the first calibration surface when the first calibration fixture is rotated about the rotation axis and a position of the second calibration surface when the first calibration fixture is moved along the straight line.

Claims (29)

1. A calibration device for a robot including a linear motion shaft that moves a slider along one straight line with respect to a base, and an end shaft supported so as to be rotatable about a rotation axis with respect to the slider of the linear motion shaft, the robot calibration device comprising:

a first calibration fixture fixed to the end shaft; and

a second calibration fixture fixed to the base and configured to come into contact with the first calibration fixture by moving the slider, wherein

the first calibration fixture includes a first calibration surface formed of a plane containing the rotation axis or a flat surface parallel to the plane, and a second calibration surface that does not change even when the end shaft is rotated, and

the second calibration fixture include:

a first detector that detects, in response to coming into contact with the first calibration surface, a state of the first calibration surface with respect to a direction along the straight line when the end shaft is rotated; and

a second detector that detects, in response to coming into contact with the second calibration surface, a position of the second calibration surface in the direction along the straight line when the slider is moved.

2. The robot calibration device according to claim 1 , wherein

it is determined that the end shaft has been calibrated when the first detector detects that the first calibration surface is disposed parallel to the straight line.

3. The robot calibration device according to claim 1 , wherein

it is determined that the linear motion shaft has been calibrated when the second detector detects that the second calibration surface is disposed at a predetermined position.

4. The robot calibration device according to claim 1 , wherein

the rotation axis is disposed in a plane perpendicular to the straight line, and

the second calibration surface is formed of a cylindrical surface around the rotation axis.

5. The robot calibration device according to claim 1 , wherein

the rotation axis is disposed in a plane perpendicular to the straight line,

the second calibration surface is formed of a cylindrical surface around the rotation axis, and

the second detector detects the position of the second calibration surface in a plane containing the rotation axis and the straight line.

6. The robot calibration device according to claim 1 , wherein

the first detector is a plunger-type gauge, and

an inclined surface continuous with the first calibration surface is provided at a position adjoining the first calibration surface in the direction along the straight line in a state in which the first calibration surface is disposed in the direction along the straight line.

7. A calibration device for a robot including a first linear motion shaft that moves a first slider along a first straight line with respect to a first base, a second linear motion shaft that moves a second slider along a second straight line, which is perpendicular to the first straight line, with respect to a second base fixed to the first slider, and an end shaft supported so as to be rotatable about a rotation axis with respect to the second slider, the robot calibration device comprising:

a first calibration fixture fixed to the end shaft; and

a second calibration fixture fixed to the first base and configured to come into contact with the first calibration fixture by moving the first slider and the second slider, wherein

the first calibration fixture includes a first calibration surface formed of a plane containing the rotation axis or a flat surface parallel to the plane, and a second calibration surface and a third calibration surface that are perpendicular to each other and that do not change even when the end shaft is rotated, and

the second calibration fixture includes:

a first detector that detects, in response to coming into contact with the first calibration surface, a state of the first calibration surface with respect to a direction along the first straight line and the second straight line when the end shaft is rotated;

a second detector that detects, in response to coming into contact with the second calibration surface, a position of the second calibration surface in the direction along the second straight line when the second slider is moved; and

a third detector that detects, in response to coming into contact with the third calibration surface, a position of the third calibration surface in the direction along the first straight line when the first slider is moved.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 11, 2022
From: HASUO, TAKESHI
To: FANUC CORPORATION
Reel/Frame 060475/0590 →
Priority Claims (1)
JP 2020-010764 · Jan 27, 2020 · national
Continuity (1)
Related Publication 20230038142A1 · Feb 9, 2023
References Cited (33)
US 4702665A · Nakashima et al. · 1987 [cited by applicant]
US 6418774B1 · Brogårdh · 2002 [cited by examiner]
US 8688274B2 · Shieh · 2014 [cited by examiner]
US 9075411B2 · Aiso · 2015 [cited by examiner]
US 9114534B2 · Trompeter · 2015 [cited by examiner]
US 9156160B2 · Nagai · 2015 [cited by examiner]
US 10434654B2 · Namiki · 2019 [cited by examiner]
US 11358283B2 · Hangjie · 2022 [cited by examiner]
US 11433541B2 · Yang · 2022 [cited by examiner]
US 11642789B2 · Park · 2023 [cited by examiner]
US 20040041422A1 · Nakamura · 2004 [cited by applicant]
US 20180178378A1 · Hagino · 2018 [cited by examiner]
US 20190022866A1 · Kawase · 2019 [cited by examiner]
US 20190099887A1 · Huang · 2019 [cited by examiner]
US 20210086365A1 · Harada · 2021 [cited by examiner]
US 20230038142A1 · Hasuo · 2023 [cited by examiner]
US 20240269853A1 · Oya · 2024 [cited by examiner]
US 20240416523A1 · Bao · 2024 [cited by examiner]
CN 102922521A · 2013 [cited by applicant]
CN 103376080A · 2013 [cited by applicant]
EP 0149682A1 · 1985 [cited by applicant]
EP 1396313A1 · 2004 [cited by applicant]
JP S6020878A · 1985 [cited by applicant]
JP S61209825A · 1986 [cited by applicant]
JP S62140783A · 1987 [cited by applicant]
JP S63278787A · 1988 [cited by applicant]
JP H04046714B2 · 1992 [cited by applicant]
JP H04300181A · 1992 [cited by applicant]
JP H06008185A · 1994 [cited by applicant]
JP H07091947A · 1995 [cited by applicant]
JP 2004148486A · 2004 [cited by applicant]
JP 2012040637A · 2012 [cited by applicant]
International Search Report mailed Mar. 23, 2021, in corresponding to International Application No. PCT/JP2021/001740; 6 pages (with English Translation). [cited by applicant]