IP Library › Granted Patent US 12,394,650
Granted Patent B2
US 12,394,650 · App. 17/894,371 · Granted Aug 19, 2025

Semiconductor fabrication facility

Inventors: Youngon Oh (Hwaseong-si, KR); Youngcheol Jang (Hwaseong-si, KR); Jihun Kim (Uiwang-si, KR); Sanghyuk Park (Yongin-si, KR); Sangho Yoon (Yongin-si, KR); Seungyeob Lee (Yongin-si, KR); Chul Min Lee (Changwon-si, KR); Hochan Lee (Seoul, KR); Jaegyun Jeon (Suwon-si, KR); Jeongkwan Jung (Anyang-si, KR); Hyeong Seok Choo (Suwon-si, KR); Dongyeol Han (Pyeongtaek-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L21/67733H01L21/67706H01L21/67724
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Quick Facts
Patent No.
US 12,394,650
App. No.
17/894,371
Granted
Aug 19, 2025
Kind
B2
Abstract

A semiconductor fabrication facility including raceways on a ceiling of a structural construction and extending in one direction, a vehicle rail assembly coupled to the raceways, outer jig rails on outer sidewalls of the raceways and adjacent to the vehicle rail assembly, and an outer jig on the outer jig rails and configured to allow the vehicle rail assembly to move along the outer jig rails may be provided.

Claims (68)

1. A semiconductor fabrication facility, comprising:

raceways on a ceiling of a structural construction, the raceways extending in one direction;

a vehicle rail assembly coupled to the raceways;

outer jig rails on outer sidewalls of the raceways and adjacent to the vehicle rail assembly; and

an outer jig on the outer jig rails, the outer jig including first rollers configured to rotate along the outer jig rails,

stoppers on the outer jig rails, the stoppers configured to fix the first rollers.

2. The semiconductor fabrication facility of claim 1 , wherein each of the outer jig rails has an L-type cross-section.

3. The semiconductor fabrication facility of claim 1 , wherein the outer jig further includes:

a first outer support;

a second outer support separated from the first outer support, the first outer support and the second outer support having a same shape; and

connection bars connecting the second outer support to the first outer support.

4. The semiconductor fabrication facility of claim 3 , wherein the first rollers are connected to ends of the first and second outer supports.

5. The semiconductor fabrication facility of claim 3 , wherein each of the first and second outer supports has a U shape.

6. The semiconductor fabrication facility of claim 1 , further comprising:

inner jig rails on facing inner sidewalls of the raceways.

7. The semiconductor fabrication facility of claim 6 , further comprising:

an inner jig on the inner jig rails, the inner jig configured to allow the vehicle rail assembly to move along the inner jig rails.

8. The semiconductor fabrication facility of claim 7 , wherein the vehicle rail assembly includes:

vehicle rails parallel to the raceways;

a rail connector connecting the vehicle rails to each other; and

hangers connecting the rail connector and the vehicle rails to the raceways.

9. The semiconductor fabrication facility of claim 8 , wherein the inner jig includes:

second rails on the inner jig rails;

a horizontal bar connecting the second rails to each other; and

a vertical bar connecting the horizontal bar to the rail connector.

10. A semiconductor fabrication facility, comprising:

raceways on a ceiling of a structural construction, the raceways extending in one direction;

a vehicle rail assembly coupled to the raceways;

outer jig rails on outer sidewalls of the raceways and adjacent to the vehicle rail assembly;

an outer jig on the outer jig rails, the outer jig including first rollers configured to rotate along the outer jig rails;

inner jig rails on inner sidewalls of the raceways;

an inner jig on the inner jig rails, the inner jig configured to allow the vehicle rail assembly to move along the inner jig rails; and

stoppers on the outer jig rails, the stoppers configured to fix the first rollers.

11. The semiconductor fabrication facility of claim 10 , wherein the outer jig further includes:

a first outer support;

a second outer support separated from the first outer support, the first outer support and the second outer support having a same shape; and

connection bars connecting the second outer support to the first outer support.

12. The semiconductor fabrication facility of claim 11 , wherein the inner jig includes:

second rails on the inner jig rails;

a horizontal bar connecting the second rails to each other; and

a vertical bar connecting the horizontal bar to the vehicle rail assembly.

13. The semiconductor fabrication facility of claim 12 , further comprising:

a lever connected to the vertical bar and supported by the connection bars.

14. The semiconductor fabrication facility of claim 13 , wherein the inner jig includes:

a middle clamp configured to clamp the vehicle rail assembly to the vertical bar; and

a lower clamp below the middle clamp, the lower clamp configured to clamp the lever to the vertical bar.

15. A semiconductor fabrication facility, comprising:

raceways on a ceiling of a structural construction, the raceways extending in one direction;

a vehicle rail assembly coupled to the raceways;

outer jig rails on outer sidewalls of the raceways and adjacent to the vehicle rail assembly;

an outer jig on the outer jig rails, the outer jig configured to allow the vehicle rail assembly to move along the outer jig rails;

inner jig rails on inner sidewalls of the raceways;

an inner jig on the inner jig rails, the inner jig configured to allow the vehicle rail assembly to move along the inner jig rails;

a table lifting unit configured to support the vehicle rail assembly; and

a lever on the table lifting unit, the lever configured to lift the inner jig and the vehicle rail assembly.

16. The semiconductor fabrication facility of claim 15 , wherein each of the outer jig rails and the inner jig rails has an L-type cross-section.

17. The semiconductor fabrication facility of claim 15 , wherein the outer jig includes:

a first outer support;

a second outer support separated from the first outer support, the first outer support and the second outer support having a same shape; and

connection bars connecting the second outer support to the first outer support.

18. The semiconductor fabrication facility of claim 17 , wherein the inner jig includes:

second rails on the inner jig rails;

a horizontal bar connecting the second rails to each other;

a vertical bar on a center of the horizontal bar;

an upper clamp on a top end of the vertical bar, the upper clamp configured to connect the vertical bar to the horizontal bar;

a middle clamp on the vertical bar and below the upper clamp, the middle clamp configured to support the vehicle rail assembly; and

a lower clamp on a bottom end of the vertical bar, the lower clamp configured to receive the lever.

19. The semiconductor fabrication facility of claim 17 , wherein the lever is on the connection bars.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2022
From: OH, YOUNGON; JANG, YOUNGCHEOL; KIM, JIHUN; PARK, SANGHYUK; YOON, SANGHO; LEE, SEUNGYEOB; LEE, CHUL MIN; LEE, HOCHAN; JEON, JAEGYUN; JUNG, JEONGKWAN; CHOO, HYEONG SEOK; HAN, DONGYEOL
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 060898/0298 →
Continuity (1)
Related Publication 20230230864A1 · Jul 20, 2023
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