Terahertz data collection for electronic object classification and evaluation
Various embodiments of the present disclosure provide systems and methods for classifying and evaluating an electronic object based at least in part on terahertz (THz) data. THz data may comprise time-domain THz data collected via THz time domain spectroscopy of the electronic object. THz data may further comprise frequency-domain THz data, which may be generated based at least in part on the time-domain THz data. A unique THz fingerprint may be generated for the electronic object based at least in part on the THz data. This unique THz fingerprint may be compared to an earlier generated THz fingerprint of the same electronic object to evaluate reliability and consistency. The unique THz fingerprint may also be compared to THz fingerprints or THz data of other electronic objects of the same object type, class, design, and/or the like, to validate the electronic object (e.g., determine if the electronic object is counterfeit).
1. A method for classifying an electronic object, the method comprising:
capturing, using at least one of a non-terahertz (THz) data collection or imaging system or a Fourier transform infrared spectroscopy (FTIR), a first set of observed data for the electronic object, wherein the first set of observed data comprises external physical characteristic data of the electronic object;
determining, based at least in part on the first set of observed data for the electronic object, whether the electronic object is associated with information stored in an object database;
responsive to determining that the electronic object is associated with information stored in the object database, capturing, using at least a THz data collection or imaging system, a second set of observed data for the electronic object;
generating a THz fingerprint for the electronic object based at least in part on the second set of observed data; and
generating and assigning a classification for the electronic object based at least in part on a comparison of the THz fingerprint for the electronic object with the information stored in the object database associated with the electronic object.
2. The method of claim 1 , wherein the THz fingerprint comprises frequency spectra and phase information of THz signals observed from the electronic object via the THz time domain spectroscopy.
3. The method of claim 2 , wherein the THz signals is obtained by configuring the THz time domain spectroscopy to perform at least one of a raster scan or a point scan of the electronic object.
4. The method of claim 1 , wherein the information stored in the object database associated with the electronic object comprises at least one of an earlier THz fingerprint for the electronic object generated at an earlier point in time or a THz fingerprint for an object design of the electronic object generated based at least in part on observed data for a plurality of electronic objects of the same object design.
5. The method of claim 1 further comprising performing at least one classification-based action, wherein the at least one classification-based action is selected based at least in part on the classification.
6. The method of claim 5 , wherein the at least one classification-based action comprises capturing a third set of observed data for the electronic object and storing the third set of observed data in the object database, wherein the third set of observed data comprises user input data.
7. The method of claim 1 , wherein the first set of observed data for the electronic object further comprises a FTIR spectrum for the electronic object.
8. The method of claim 7 , wherein generating and assigning the classification for the electronic object is further based at least in part on a comparison of the FTIR spectrum for the electronic object with the information stored in the object database associated with the electronic object.
9. The method of claim 7 further comprising generating a first set of synthetic measurement data associated with the electronic object and storing the first set of synthetic measurement data in the object database, wherein the first set of synthetic measurement data is generated based at least in part on the second set of observed data and the FTIR spectrum.
10. The method of claim 9 , wherein the first set of synthetic measurement data is generated using a generative adversarial network.
11. The method of claim 1 further comprising responsive to determining that the electronic object is not associated with information stored in the object database, capturing a fourth set of observed data for the electronic object and storing the fourth set of observed data in the object database.
12. The method of claim 1 , wherein the THz data collection or imaging system is configured based at least in part on the first set of observed data and/or the information stored in the object database associated with the electronic object.
13. A system for classifying an electronic object, the system comprising:
a terahertz (THz) data collection or imaging system configured to at least capture THz data based at least in part on observing THz signals from an object;
at least one of a non-THz data collection or imaging system or a Fourier transform infrared spectroscopy (FTIR); and
an apparatus comprising at least one memory and at least one processor, the at least one memory comprising computer program code, wherein the at least one memory and the computer program code are configured to cause the at least one processor to:
capture, using the at least one of a non-THz data collection or imaging system or a FTIR, a first set of observed data for the electronic object, wherein the first set of observed data comprises external physical characteristic data of the electronic object;
determine, based at least in part on the first set of observed data for the electronic object, whether the electronic object is associated with information stored in an object database;
responsive to determining that the electronic object is associated with information stored in the object database, capture, using at least the THz data collection or imaging system, a second set of observed data for the electronic object, wherein the THz data collection or imaging system is configured based at least in part on the first set of observed data and/or the information stored in the object database associated with the electronic object;
generate a THz fingerprint for the electronic object based at least in part on the second set of observed data; and
generate and assign a classification for the electronic object based at least in part on the THz fingerprint for the electronic object and the information stored in the object database associated with the electronic object.
14. The system of claim 13 , wherein the THz fingerprint comprises frequency spectra and phase information of THz signals observed from the electronic object via THz time domain spectroscopy, wherein the THz signals is obtained by configuring the THz time domain spectroscopy to perform at least one of a raster scan or a point scan of the electronic object.
15. The system of claim 13 , wherein the information stored in the object database associated with the electronic object comprises at least one of an earlier THz fingerprint for the electronic object generated at an earlier point in time or a THz fingerprint for an object design of the electronic object generated based at least in part on observed data for a plurality of electronic objects of the same object design.
16. The system of claim 13 , wherein the at least one memory and the computer program code are further configured to cause the at least one processor to perform at least one classification-based action, wherein the at least one classification-based action is selected based at least in part on the classification.
17. The system of claim 13 , wherein the first set of observed data for the electronic object further comprises a FTIR spectrum for the electronic object.
18. The system of claim 17 , wherein generating and assigning the classification for the electronic object is further based at least in part on a comparison of the FTIR spectrum for the electronic object with the information stored in the object database associated with the electronic object.
19. The system of claim 17 , wherein the at least one memory and the computer program code are further configured to cause the at least one processor to generate a first set of synthetic measurement data associated with the electronic object and store the first set of synthetic measurement data in the object database, wherein the first set of synthetic measurement data is generated based at least in part on the second set of observed data and the FTIR spectrum, wherein the first set of synthetic measurement data is generated using a generative adversarial network.
20. The system of claim 13 , wherein the at least one memory and the computer program code are further configured to cause the at least one processor to, responsive to determining that the electronic object is not associated with information stored in the object database, capture a fourth set of observed data for the electronic object and storing the fourth set of observed data in the object database.