IP Library › Granted Patent US 12,404,423
Granted Patent B2
US 12,404,423 · App. 17/783,262 · Granted Sep 2, 2025

Chemical-mechanical polishing liquid

Inventors: Shoutian Li (Shanghai, CN); Xiaoming Ren (Shanghai, CN); Changzheng Jia (Shanghai, CN)
Assignee: Anji Microelectronics (Shanghai) Co. Ltd
C09G1/02H01L21/31053
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Quick Facts
Patent No.
US 12,404,423
App. No.
17/783,262
Granted
Sep 2, 2025
Kind
B2
Abstract

Disclosed is a chemical mechanical polishing solution, which contains water, cerium oxide, polyquatemium, carboxylic acid containing a benzene ring and polyvinylamine. The function of auto stop in its true sense can only be achieved by using polyquatemium, carboxylic acid containing a benzene ring and polyvinylamine together. On the blanks, the polishing rates are low, while at the high step heights of patterned silicon chips, high polishing rates are kept. The lower is the step height, the better is the polishing rate inhibited, and thus the function of auto stop is achieved.

Claims (15)

1. A chemical mechanical polishing solution, comprising cerium oxide, a polyquaternium, a carboxylic acid containing a benzene ring, polyvinylamine, and water;

wherein the polyquaternium is one or more selected from the group consisting of polyquaternium-1, polyquaternium-2, polyquaternium-4, polyquaternium-6, polyquaternium-10, polyquaternium-11, polyquaternium-16, polyquaternium-37, polyquaternium-39, and polyquaternium-51;

wherein the carboxylic acid containing the benzene ring is one or more selected from the group consisting of salicylic hydroxamic acid, salicylic acid and 4-hydroxybenzoic acid;

wherein a concentration of the polyvinylamine is 0.5-6 ppm.

2. The chemical mechanical polishing solution according to claim 1 , wherein the polyquaternium is polyquaternium-6.

3. The chemical mechanical polishing solution according to claim 1 , wherein the carboxylic acid containing the benzene ring is 4-hydroxybenzoic acid.

4. The chemical mechanical polishing solution according to claim 1 , wherein a concentration of the cerium oxide is 0.5 wt %-2 wt %.

5. The chemical mechanical polishing solution according to claim 4 , wherein the concentration of the cerium oxide is 0.8-1.5 wt %.

6. The chemical mechanical polishing solution according to claim 1 , wherein a concentration of the polyquaternium is 1-100 ppm.

7. The chemical mechanical polishing solution according to claim 6 , wherein the concentration of the polyquaternium is 13.5 ppm-15 ppm.

8. The chemical mechanical polishing solution according to claim 1 , wherein a concentration of the carboxylic acid containing the benzene ring is 900-2,500 ppm.

9. The chemical mechanical polishing solution according to claim 8 , wherein the concentration of the carboxylic acid containing the benzene ring is 1,000-2,000 ppm.

10. The chemical mechanical polishing solution according to claim 1 , wherein the concentration of the polyvinylamine is 1-4 ppm.

11. The chemical mechanical polishing solution according to claim 1 , wherein a molecular weight of the polyvinylamine is from 400 to 750,000.

12. The chemical mechanical polishing solution according to claim 11 , wherein the molecular weight of the polyvinylamine is from 600-25,000.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2022
From: LI, SHOUTIAN; REN, XIAOMING; JIA, CHANGZHENG
To: ANJI MICROELECTRONICS (SHANGHAI) CO., LTD
Reel/Frame 060174/0686 →
Priority Claims (1)
CN 201911320533.7 · Dec 19, 2019 · national
Continuity (1)
Related Publication 20230104112A1 · Apr 6, 2023
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