Granted Patent B2

US 12,414,217 · App. 18/100,683 · Granted Sep 9, 2025

Inventors: Guoyun Ru (Farmington, CT); David Aizer (Danbury, CT); J. Austin Fraley (Danbury, CT); Edward Nonnweiler (Brookfield, CT)

Assignee: Hologic, Inc.

H05G1/34A61B6/582H05G1/265H05G1/54A61B6/502

Abstract

Claims (44)

1. A method of adaptively controlling filament current in an x-ray tube of an imaging system, the method comprising:

calibrating the x-ray tube having a filament;

storing calibration data from the calibration of the x-ray tube at the imaging system, wherein the calibration data includes a filament current value that determines a tube current value for a tube voltage value at a plurality of exposure values;

monitoring a resistance value of the filament over a period of time, wherein monitoring the resistance value includes measuring the resistance value of the filament after a predetermined number of sequence exposures and storing each measured resistance value;

determining a change in the resistance value of the filament over the period of time, wherein the determined changed resistance value is based on a difference between the stored measured resistance values over a number of exposure counts; and

adjusting the filament current value of at least one of the plurality of exposure values based on the determined changed resistance value.

2. The method of claim 1 , wherein measuring the resistance value after the predetermined number of sequence exposures includes applying a constant filament current value to the filament after each of the predetermined number of sequence exposures.

3. The method of claim 2 , further comprising waiting a predetermined time period between an end of the predetermined number of sequence exposures and prior to applying the constant filament current value to the filament for resistance value measurement.

4. The method of claim 1 , wherein the filament current value of each of the plurality of exposure values is updated based on the changed resistance value.

5. The method of claim 1 , wherein determining the change in the resistance value includes comparing a difference between resistance values over the period of time to a predetermined benchmark.

6. The method of claim 1 , further comprising:

measuring a resulted tube current value from the x-ray tube at a sequence exposure having a stored tube current value and tube voltage value for an exposure value of the plurality of exposure values; and

comparing a difference between the measured resulted tube current value and the stored tube current value for the respective exposure value.

7. The method of claim 6 , wherein based on the difference between the measured resulted tube current value and the stored tube current value, the period of time is at least partially defined.

8. The method of claim 6 , wherein measuring resulted tube current value is performed pre-exposure or post-exposure of the sequence exposure.

9. The method of claim 1 , further comprising determining a life-cycle period of the filament based at least partially on the monitored resistance value of the filament.

10. An imaging system comprising:

an x-ray tube having a filament;

a current control circuit coupled to the x-ray tube and configured to channel current through the filament;

at least one processor communicatively coupled to the current control circuit; and

memory communicatively coupled to the at least one processor, the memory comprising computer executable instructions that, when executed by the at least one processor, performs a method comprising:

calibrating the x-ray tube;

storing calibration data from the calibration of the x-ray tube at the imaging system, wherein the calibration data includes a filament current value that determines a tube current value for a tube voltage value at a plurality of exposure values;

monitoring a resistance value of the filament over a period of time, wherein monitoring the resistance value includes measuring the resistance value of the filament after a predetermined number of sequence exposures and storing each measured resistance value;

determining a change in the resistance value of the filament over the period of time, wherein the determined changed resistance value is based on a difference between the stored measured resistance values over a number of exposure counts; and

adjusting the filament current value of at least one of the plurality of stations exposure values based on the determined changed resistance value.

11. The imaging system of claim 10 , wherein measuring the resistance value after the predetermined number of sequence exposures includes applying a constant filament current value to the filament after each of the predetermined number of sequence exposures.

12. The imaging system of claim 11 , wherein the method further comprises waiting a predetermined time period between an end of the predetermined number of sequence exposures and prior to applying the constant filament current value to the filament for resistance value measurement.

13. The imaging system of claim 11 , wherein the filament current value of each of the plurality of exposure values is updated based on the changed resistance value.

14. The imaging system of claim 10 , wherein determining the change in the resistance value includes comparing a difference between resistance values over the period of time to a predetermined benchmark.

15. The imaging system of claim 10 , wherein the method further comprises:

measuring a resulted tube current value from the x-ray tube at a sequence exposure having a stored tube current value and tube voltage value for an exposure value of the plurality of exposure values; and

comparing a difference between the measured resulted tube current value and the stored tube current value for the respective exposure value.

16. The imaging system of claim 15 , wherein based on the difference between the measured resulted tube current value and the stored tube current value, the period of time is at least partially defined.

17. The imaging system of claim 15 , wherein measuring resulted tube current value is performed pre-exposure or post-exposure of the sequence exposure.

18. The imaging system of claim 10 , wherein the method further comprises determining a life-cycle period of the filament based at least partially on the monitored resistance value of the filament.

19. A method of adaptively controlling filament current in an x-ray tube of an imaging system, the method comprising:

calibrating the x-ray tube having a filament;

storing calibration data from the calibration of the x-ray tube at the imaging system, wherein the calibration data includes a filament current value that determines a tube current value for a tube voltage value at a plurality of exposure values;

monitoring a resistance value of the filament over a period of time;

determining a change in the resistance value of the filament over the period of time;

adjusting the filament current value of at least one of the plurality of exposure values based on the changed resistance value;

measuring a resulted tube current value from the x-ray tube at a sequence exposure having a stored tube current value and tube voltage value for an exposure value of the plurality of exposure values; and

comparing a difference between the measured resulted tube current value and the stored tube current value for the respective exposure value, wherein based on the difference between the measured resulted tube current value and the stored tube current value, the period of time is at least partially defined.

Assignments (5)

Continuity (2)

References Cited (400)