IP Library › Granted Patent US 12,415,619
Granted Patent B2
US 12,415,619 · App. 18/074,247 · Granted Sep 16, 2025

Metrological inspection system for aircraft

Inventor: Eric James Stone (Fort Worth, TX)
Assignee: Twin Coast Metrology, Inc.
B64F5/60G06T7/0004G06V10/141G06V10/145G06V10/60G06T2207/10152G06T2207/30252
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Quick Facts
Patent No.
US 12,415,619
App. No.
18/074,247
Granted
Sep 16, 2025
Kind
B2
Abstract

A method and system for inspecting an aircraft for defects. The system comprises a plurality of cameras and projectors mounted on a structural inspection frame for imaging substantially the entire exterior surface of the aircraft. The projectors can project structured light patterns onto an exterior surface of the aircraft so that the camera system can capture a three-dimensional map of the exterior surface of the aircraft. Image processing systems can compare the captured three-dimensional map with an approved reference model of the aircraft to determine if there are defects or damage to the surface of the aircraft. The system may be configured for use with a particular aircraft model or a plurality of aircraft models. If exterior defects or damage is found, the system can project reference patterns or data onto the surface of the aircraft to aid in visual inspection of the potentially damaged portions of the aircraft.

Claims (42)

1. A system for examination of aircraft, wherein the system comprises:

an inspection frame, the inspection frame capable of enveloping an aircraft,

the inspection frame having lighting systems mounted on to the inspection frame;

the inspection frame having one or more camera systems mounted on to the inspection frame;

a computing device having an image processing system for controlling the lighting systems and camera systems mounted on to the inspection frame;

the computing device controlling and adjusting the lighting systems and wherein the lighting system projects structured lighting patterns on the physical device and wherein the camera systems collect one or more images of the structured lighting patterns projected on the physical device;

the computing device storing the images collected by the camera systems;

the image processing system for analyzing, assembling, and processing the stored images captured by the computing device;

the image processing system represents the images in a single coordinate system using respective coordinate transformations for each of the camera systems and assembling the stored images to create a complete picture of the aircraft for metrological analysis; and wherein the metrological analysis detects defects on the aircraft;

the lighting system in communication with the computing device and image processing system, projects data and patterns on to the surface of the physical device aircraft to pinpoint the identified defects,

wherein analyzing, assembling, and processing the stored images comprises, for each of the stored images, identifying a corresponding region of the surface of the aircraft that is associated with that stored image.

2. A method of aggregating images to detect defects, wherein the method comprises:

positioning projectors to illuminate an entire aircraft surface of the aircraft;

positioning cameras to capture images of the entire aircraft surface;

capturing images of the structured light reflected from the aircraft surface

analyzing the captured images of structured light to generate output representing at least one defect in the surface of the aircraft, comprising:

combining the captured images of structured light to generate a combined image; and

analyzing the combined image to detect defects.

3. The method of claim 2 , wherein analyzing the combined image to detect defects comprises applying different analyses to images associated with different parts of the aircraft.

4. The method of claim 3 , wherein applying the different analyses to images associated with different parts of the aircraft comprises:

applying a first analysis method to a first image associated with a first part of the aircraft; and

applying a second analysis method to a second image associated with a second part of the aircraft;

wherein the first analysis method differs from the second analysis method.

5. The method of claim 3 , wherein applying the different analyses comprises applying different fault tolerances to different parts of the aircraft.

6. A method for inspecting aircraft, wherein the method comprises:

enveloping the aircraft within an inspection frame,

mounting one or more lighting systems on to the inspection frame;

mounting camera systems on to the inspection frame;

controlling the lighting systems, camera systems, and projection systems mounted on to the inspection frame with a computing device;

adjusting the lighting systems and projecting structured lighting patterns on to the surface of the aircraft and wherein the camera systems capture images of the structured lighting patterns projected on the surface of the aircraft;

storing the images captured by the camera systems within the computing device;

analyzing, assembling, and processing the stored images within an image processing system that is executing on the computing device, wherein; the image processing system represents the images in a single coordinate system using respective coordinate transformations for each of the camera systems and assembling the stored images in order to create a complete picture of the aircraft for metrological analysis; and

wherein the metrological analysis applies an inspection analysis to identify defects on the surface of the aircraft;

projecting data and patterns on the surface of the aircraft to visually highlight the identified defects on the surface of the aircraft,

wherein analyzing, assembling, and processing the stored images comprises, for each of the stored images, identifying a corresponding region of the surface of the aircraft that is associated with that stored image.

7. The method according to claim 6 , wherein the inspection analysis applies different criteria to different parts of the aircraft.

8. The method according to claim 6 , wherein the inspection analysis applies different fault tolerances to different parts of the aircraft.

9. The method according to claim 6 , wherein projecting data and patterns on the surface of the aircraft comprises projecting data and patterns on corresponding regions of the aircraft having those defects.

10. The method according to claim 6 , wherein analyzing, assembling, and processing the stored images comprises, for each of the stored images, identifying an analysis technique and/or fault tolerance associated with a corresponding region of the stored image.

11. The method according claim 10 , wherein analyzing, assembling, and processing the stored images further comprises applying the identified analysis technique and/or fault tolerance to the stored image associated with the corresponding region of the aircraft.

12. The method according claim 6 , further comprising flagging detected defects on the surface of the aircraft for further inspection.

13. The method according to claim 6 , wherein controlling the lighting systems, camera systems, and projection systems mounted on to the inspection frame with the computing device comprises using the computing device to adjust the lighting, camera, and projectors for improved image capture.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2022
From: STONE, ERIC JAMES
To: TWIN COAST METROLOGY, INC.
Reel/Frame 061990/0052 →
Continuity (2)
Provisional Application 63285331 · Dec 2, 2021
Related Publication 20230174250A1 · Jun 8, 2023
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