IP Library › Granted Patent US 12,415,728
Granted Patent B2
US 12,415,728 · App. 17/030,895 · Granted Sep 16, 2025

Aluminum nitride plate

Inventors: Yoshimasa Kobayashi (Nagoya, JP); Hiroharu Kobayashi (Kasugai-Shi, KR)
Assignee: NGK INSULATORS, LTD.
C01B21/0722C01B21/072C30B29/38H01L21/02389H01L21/02433C01P2002/74C01P2002/78C01P2006/80
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,415,728
App. No.
17/030,895
Granted
Sep 16, 2025
Kind
B2
Abstract

An aluminum nitride plate satisfies both of a “relation 1: c1>97.5%” and a “relation 2: c2/c1<0.995” where c1 is a c-plane degree of orientation that is defined as a ratio of a diffraction intensity of (002) plane to a sum of the diffraction intensity of (002) plane and a diffraction intensity of (100) plane when the surface layer of the aluminum nitride plate is subjected to an X-ray diffraction measurement, and c2 is a c-plane degree of (002) plane to the sum of the diffraction intensity of (002) plane and the diffraction intensity of (100) plane when a portion other than the surface layer of the aluminum nitride plate is subjected to the X-ray diffraction. Moreover, in the aluminum nitride plate, a difference in nitrogen content between the surface layer and the portion other than the surface layer is less than 0.15% in weight ratio.

Claims (11)

1. An aluminum nitride plate, wherein

the aluminum nitride plate satisfies-both all three of following relations (1), (2) and (3),

c 1>97.5%  (1):

c 2>97%  (2):

c 2 /c 1<0.995  (3):

where c1 is a c-plane degree of orientation that is defined as a ratio of a diffraction intensity of (002) plane to a sum of the diffraction intensity of (002) plane and a diffraction intensity of (100) plane when a surface layer of the aluminum nitride plate is subjected to an X-ray diffraction measurement along a thickness direction of the surface layer, and

c2 is a c-plane degree of orientation that is defined as a ratio of the diffraction intensity of (002) plane to the sum of the diffraction intensity of (002) plane and the diffraction intensity of (100) plane when a portion other than the surface layer of the aluminum nitride plate is subjected to the X-ray diffraction measurement along a thickness direction of the portion, and

a difference in nitrogen content between the surface layer and the portion other than the surface layer is less than 0.15 percent in weight ratio,

wherein the surface layer is a portion included in a layer located at one end of the aluminum nitride plate out of 10 layers obtained by splitting the aluminum nitride plate into 10 along its thickness direction, and the portion is exposed at a surface of the aluminum nitride plate on the one end.

2. The aluminum nitride plate according to claim 1 , wherein

a half-value width in an X-ray rocking curve profile of (102) plane of an aluminum nitride crystal in the surface layer is 2.5 degrees or less.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 24, 2020
From: KOBAYASHI, YOSHIMASA; KOBAYASHI, HIROHARU
To: NGK INSULATORS, LTD.
Reel/Frame 053872/0706 →
Priority Claims (1)
WO PCT/JP2018/012542 · Mar 27, 2018 · international
Continuity (2)
Continuation PCTJP2019013226 · Mar 27, 2019
Related Publication 20210009418A1 · Jan 14, 2021
References Cited (20)
US 6051303A · Katsuda et al. · 2000 [cited by applicant]
US 20060163605A1 · Miyahara · 2006 [cited by applicant]
US 20060183625A1 · Miyahara · 2006 [cited by applicant]
US 20130187170A1 · Fukuyama et al. · 2013 [cited by applicant]
US 20150194493A1 · Sakaguchi et al. · 2015 [cited by applicant]
US 20150353355A1 · Fukunaga · 2015 [cited by examiner]
CN 1755955 · 2006 [cited by examiner]
JP H08157265A1 · 1996 [cited by applicant]
JP H11054603A1 · 1999 [cited by applicant]
JP 2002015840 · 2002 [cited by examiner]
JP 2011020900A1 · 2011 [cited by applicant]
JP 2012031027A1 · 2012 [cited by applicant]
JP 2015133354A1 · 2015 [cited by applicant]
JP 2016520992A1 · 2016 [cited by applicant]
KR 101597882 · 2016 [cited by examiner]
WO 2011007762A1 · 2011 [cited by applicant]
WO 2012008545A1 · 2012 [cited by applicant]
WO 2014159954A1 · 2014 [cited by applicant]
Extended European Search Report (Application No. 19775036.7) dated Nov. 17, 2021. [cited by applicant]
International Search Report and Written Opinion (Application No. PCT/JP2019/013226) dated May 21, 2019. [cited by applicant]