Granted Patent B2

US 12,430,742 · App. 17/928,564 · Granted Sep 30, 2025

Inventor: Yasuyuki Ikeda (Kyoto, JP)

Assignee: OMRON CORPORATION

G06T7/0004G02B5/08G02B27/30G06T7/97H04N23/56H04N23/71

Abstract

Claims (40)

1. An inspection system for inspecting a surface of a target object, the inspection system comprising:

a light emitting device configured to illuminate the target object;

a collimator lens arranged between the light emitting device and the target object; and

an imaging device configured to image the target object,

wherein the light emitting device is capable of emitting light at any light emission position selected from a plurality of light emission positions,

wherein the inspection system further comprises:

a processor; and

a memory storing computer-executable instructions that, when executed by the processor, cause the processor to perform operations including:

analyzing a plurality of captured images obtained individually from a plurality of times of imaging where the plurality of light emission positions are different from each other; and

generating at least one of a first analysis image or a second analysis image,

wherein a value of each pixel of the first analysis image indicates a particular light emission position of the plurality of light emission positions, the particular light emission position indicated by a target pixel has been selected when capturing a particular image in which a pixel at the same coordinate as the target pixel has greater luminance than a pixel at the same coordinate as the target pixel in any other image of the plurality of captured images, and

wherein a value of each pixel of the second analysis image is an amplitude of a waveform indicating a relationship between a luminance of the pixel and the light emission position in the plurality of captured images.

2. The inspection system according to claim 1 , wherein

the light emitting device includes a plurality of light sources, and sequentially switches a light source to emit light among the plurality of light sources, and

the plurality of light sources are arranged on a plane perpendicular to an optical axis of the collimator lens or on a spherical surface centered on the optical axis.

3. The inspection system according to claim 1 , wherein the operations further include generating a composite image obtained by combining the plurality of captured images.

4. The inspection system according to claim 1 , wherein a distance between the light emission position and the collimator lens is greater than or equal to a focal distance of the collimator lens.

5. The inspection system according to claim 1 , further comprising a half mirror arranged between the collimator lens and the target object,

wherein light emitted from the light emitting device and transmitted through the collimator lens is reflected by the half mirror to illuminate the target object, and

light reflected by the target object is transmitted through the half mirror to be incident on the imaging device.

6. An inspection method for inspecting a surface of a target object, the inspection method comprising:

imaging the target object while irradiating the target object with light emitted from a light emitting device and transmitted through a collimator lens,

wherein the imaging includes:

selecting, from a plurality of light emission positions, a light emission position in the light emitting device; and

acquiring a plurality of captured images from a plurality of times of imaging where the plurality of light emission positions are different from each other,

wherein the inspection method further comprises:

analyzing the plurality of captured images; and

generating at least one of a first analysis image or a second analysis image,

wherein a value of each pixel of the first analysis image indicates a particular light emission position of the plurality of light emission positions, the particular light emission position indicated by a target pixel has been selected when capturing a particular image in which a pixel at the same coordinate as the target pixel has greater luminance than a pixel at the same coordinate as the target pixel in any other image of the plurality of captured images, and

wherein a value of each pixel of the second analysis image is an amplitude of a waveform indicating a relationship between a luminance of the pixel and the light emission position in the plurality of captured images.

7. The inspection method according to claim 6 , wherein

the light emitting device includes a plurality of light sources, the plurality of light sources being arranged on a plane perpendicular to an optical axis of the collimator lens or on a spherical surface centered on the optical axis, and

the switching includes sequentially switching a light source to emit light among the plurality of light sources.

8. The inspection method according to claim 6 , further comprising:

generating a composite image obtained by combining the plurality of captured images.

9. The inspection method according to claim 6 , wherein a distance between the light emission position and the collimator lens is greater than or equal to a focal distance of the collimator lens.

10. The inspection method according to claim 6 , further comprising:

arranging a half mirror between the collimator lens and the target object, wherein the imaging includes:

illuminating the target object with the light by reflecting the light by the half mirror; and

allowing light reflected by the target object to be transmitted through the half mirror to be incident on an imaging device.

Assignments (1)

Priority Claims (1)

Continuity (1)

References Cited (57)